Total Reflection X-ray Fluorescence
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Product
Conveyor X-ray Scanners
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Innovative baggage X-ray screening units for quick and easy identification of the material composition of scanned objects.
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Product
Totalizer (pulse input)
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Two independent scalable pulse-input channels. Count up or down to a preset at rated up to 1 MHz. Scaled rate and total from the same electronic counter. Scaling for direct readout in engineering units, such as gallons or cubic feet based on counts from a turbine flow meter. One channel can display total while other displays rate.
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Real Time X-Ray Imaging
GO-SCAN C-VIEW
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Go-Scan C-view is a light weight ruggedized real time X-ray imaging system specifically designed for hand-held inspection such, among other, Corrosion Under Insulation (CUI) inspection. It includes a high speed and high resolution CMOS imager and a battery-operated 70kV x-ray tube designed for portable field operation. The video imaging system captures images and displays them on a hand held display in real-time.
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X-Ray Power Supplies
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Enable better sample data and accurate X-ray production with Advanced Energy’s X-ray high voltage power supplies. Our X-ray power supplies support proper specification and integration of the source and detector, which enables high power, quality, and reliability.
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X-ray Optics
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Do you want to shape your X-rays to a tiny point? Then our X-ray optics can help you. Benefit from 30 years of know-how in the development and manufacture of customized optical components for demanding applications. Our high-precision optics offer unsurpassed performance and enable the best results in a wide range of applications.
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Bulkflow X-Ray Inspection System
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Designed to be integrated into line with optional reject stations, the Bulkflow X-ray System is perfect for loose and free flowing products. Offering a good detection levels on a wide range of contaminants including all metal, bone, glass and dense plastics.
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Fluorescence Lifetime Spectrometer
S-FL
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The technique of Time Correlated Single Photon Counting (TCSPC) has been developed and introduced more then 25 years ago. The technique is now widely accepted to be the most sensitive fluorescence detection technique with the inherent temporal resolution required for fluorescence decays.
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Product
Total Sulfur Analyzer
Model T108
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Teledyne Advanced Pollution Instrumentation
The Model T108 Total Sulfur analyzer is designed to measure mixed sulfur impurities, collectively referred to as Total Sulfides, in air or carbon dioxide gas. Since there is no scrubber in the system, the instrument reading is the sum of the oxidized sulfur compounds and SO2.The Model T108 consists of a modified Model T100 SO2 analyzer with special software and a Model 501TS high temperature thermal oxidizer. Sulfur compounds are heated as they pass through the converter and oxidized into SO2. When analyzing CO2, which generally contains no oxygen, approximately 6% O2 is added to the sample before entering the converter. This dilution is corrected in the calibration procedure.
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
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Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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UV Fluorescence SO2 Analyzer
Model N100
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Teledyne Advanced Pollution Instrumentation
The Model N100 instrument uses the proven UV-fluorescence principle, combined with a state-of-the-art modular architecture, and intuitive operating software to provide accurate and dependable measurements of low-level Sulfur Dioxide (SO2) gas.
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Fluorescence Spectrometers
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PicoQuant offers several fluorescence spectrometers that range from compact table-top spectrometers for teaching or daily routine work to modular high-end spectrometers with exact timing down to a few picoseconds. Samples can be liquids in standard cuvettes, solid samples or even semiconductor wafers for in-line quality control.
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Your High-performance Slide Scanner For Fluorescence, Brightfield And Polarization
ZEISS Axioscan 7
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Digitize your specimens with Axioscan 7 – the reliable, reproducible way to create high-quality virtual microscope slides. Axioscan 7 combines qualities that you would not expect to get in a slide scanner: high speed digitization and outstanding image quality plus an unrivaled variety of imaging modes are all available in a fully automated and easy to operate system.
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X-ray and CT Inspection Systems
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YXLON X-ray and CT systems come in many different configurations. We've developed a Product Finder to help narrow your search for the system that best meets your needs. Can't find what you're looking for? Our specialists will customize a system to your exact specifications. Contact us today for more information.
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Multi-Channel X-Ray Fluorescence Spectrometer
FACTORY LAB MXF-2400
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Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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Fluorescence Lifetime Imaging Microscopy (FLIM) Camera
Toggel
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Lambert Instruments today announced the introduction of its next-generation fluorescence lifetime imaging camera: Toggel. This new camera makes fluorescence lifetime imaging microscopy (FLIM) and fluorescence resonance energy transfer (FRET) faster and easier with its excellent light sensitivity, sharp images and fast image acquisition. With Toggel, Lambert Instruments aims to minimize measurement duration, automate image acquisition and simplify data analysis. These factors are of great importance to many of its customers in cell biology, cancer research and high-throughput screening.
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X-ray Inspection System
RTX-113HV
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Precision X-ray Inspection for BGAs, QFNs, LEDs, sensors, medical devices, and other packaged devices.
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Product
Waterproof Low Range Total Dissolved Solids Pen (TDS)
T75
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The Milwaukee T75 Waterproof Total Dissolved Solids (TDS) Pen is designed for, aquariums, aquaculture, education, water conditioning and many other applications. The T75 helps you make sure that your fish have the right TDS balance to help them stay healthy. TDS also help keep filters up-to-date and clean for water filtration. Keep TDS in your target range to help your achieve better results.
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Product
Laser Induced Fluorescence (Mixing LIF)
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Planar laser-induced fluorescence (PLIF) is an optical diagnostic technique widely used in fluid and gas applications. PLIF has proven to be a valuable tool for flow visualization as well as for quantitative whole-field measurements of scalars such as concentration and temperature in liquid and concentration in gaseous flows. Applications can be found in process engineering, biomedical engineering, and fluid dynamics research.
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
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High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-20
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The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Detachable X-Ray Detector
RadEye HR
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The Remote RadEye HR x-ray detector is a slim, lightweight, rugged solution for high-resolution radiation imaging. The detector is suitable for industrial inspection applications where images are taken in tight or difficult-to-reach spaces.
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X-ray Inspection System
TruView Prime
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The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
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TEL-X-Ometer X-ray System
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X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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Transmission / Reflection Measurement
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Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Fluorescence Spectrometers
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Our experience and expertise as manufacturers of fluorescence spectrometers is second to none. Spanning more than 50 years, we have over 1000 high-end spectrometers installed in universities and leading research laboratories worldwide. Our sales team would be delighted to assist you with your fluorescence spectroscopy analysis and instrumentation requirements.
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Reflection Meter
RC-088
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This instrument is a special equipment for measuring the reflectivity of rearview mirror (or similar product) of motor vehicle. The product composes intelligent measuring instruments, optical integrating sphere, parallel lamp, standard light source, constant current source etc. It is easy to operate，it can measure the reflectivity quickly and accurately. On instrument structure, it adopts standardized modulation design. It takes latest single chip as its digital central processing element. After the measuring signal is converted by modulus, CPU will do some computation and compensation. The instrument can display the reflectivity of device which is measured in rear time. It operates simply and quickly, the indication is direct and accurate. It’s good for quality examination &control in the production scene as well as laboratories. This product has the convenience &quick demarcation way, can meet requirement of different occasion. It is applicable for measuring light reflection on mirror and not mirror parts.
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X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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Reflective Memory Analyzer
PEAZ-5565
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Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
