Total Reflection X-ray Fluorescence
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(X-ray and XUV) Streak Cameras
AXIS-PX
We build streak camera systems that can achieve time resolution on the femtosecond time scale while conserving and ultra-fine spatial resolution on a very long slit length.
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Bulkflow X-Ray Inspection System
Designed to be integrated into line with optional reject stations, the Bulkflow X-ray System is perfect for loose and free flowing products. Offering a good detection levels on a wide range of contaminants including all metal, bone, glass and dense plastics.
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Fluorescence Spectroscopy
HORIBA’s Fluorescence division incorporates technology from SPEX, IBH, Jobin-Yvon, PTI and SLM - the dominant names in Fluorescence Spectroscopy. We offer the widest range of Steady State Fluorescence spectrometers, Fluorescence Lifetime spectrometers, Steady State and Lifetime Multi instruments and Microscope-based Microscopy solutions.
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Constant Potential Generator Metal Ceramic X-Ray Tube 30 to 300 kV
CP300C
The CP300C is the first panoramic x-ray generator of the CPSeries product range. Equipped with a metal-ceramic tube, the CP300C is a light (less than 30kg) and powerful generator (300 kV), able to penetrate up to 52mm of steel in 10 minutes, making it the best power-to-weight ratio in the world.The efficiency of the CP300C is also maximum thanks to its real 100% duty cycle that allows longer exposure time (> one hour).A full range of accessories is available (holding bars, tripod…) and even a 60°x40° lead diaphragm to convert the CP300C into a directional unit.
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Reflective Memory PCIE card
PCIE-5565PIORC
The PCIE-5565PIORC low profile PCI Express (PCIe) Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data. Writes are stored in local SDRAM and broadcast over a high speed fiber-optic data path to other Reflective Memory nodes.
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Fluorescence Lifetime Spectrometer
S-FL
The technique of Time Correlated Single Photon Counting (TCSPC) has been developed and introduced more then 25 years ago. The technique is now widely accepted to be the most sensitive fluorescence detection technique with the inherent temporal resolution required for fluorescence decays.
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PRO Low Range Total Dissolved Solids Meter
MW401
MW401 is a Portable Low Range Total Dissolved Solids (TDS) Meter with Automatic Temperature Compensation. This instrument has been designed for aquariums, aquaculture, labs, and water conditioning applications to meet the needs for equipment suited from hobbist to professional. It is also a great meter for food labs, and water treatment applications.
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Totalizer (pulse input)
Two independent scalable pulse-input channels. Count up or down to a preset at rated up to 1 MHz. Scaled rate and total from the same electronic counter. Scaling for direct readout in engineering units, such as gallons or cubic feet based on counts from a turbine flow meter. One channel can display total while other displays rate.
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Small-Angle X-Ray Scattering (SAXS) Products
Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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Total Nitrogen Unit For TOC-L Series
TNM-L
Perform simultaneous TOC and TN measurements. *720 °C catalytic thermal decomposition/chemiluminescence methods are adopted for TN measurement. There is no interference from metallic ions or bromine in sea water.*Measurements over a wide range with a detection limit of 5 μg/L for TOC-LCH to an upper limit of 10,000 mg/L.
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CVAF – Cold Vapor Atomic Fluorescence
Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.
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X-Ray Detectors
With the need to always reduce the inspection time to the strict minimum, the NDT world is slowly reducing its dependency on films and jumping straight into the Digital Radiography (DR) revolution. While saving tremendous amount of time and money not developing films, digital radiography also enables you to edit, record and send your inspections to whomever, whenever and wherever you want.
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Benchtop X-ray Diffractometer
Aeris
Meet Aeris – our brand-new benchtop X-ray diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software. Being a Malvern Panalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.
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Total Reduced Sulfur System
ML670
The ML®670 Total Reduced Sulfur (TRS) system provides an accurate and convenient method of measuring Total Reduced Sulfur required for Emission Monitoring. The TRS system uses our specially designed TRS Dilution Sampling System combined with the T-Series® TRS analyzer to provide reliable TRS measurement. This system can be configured as an Open Architecture Design for ease of maintenance.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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Fluorescence Microscopes
PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Industrial CT X-Ray Inspection System
X3000
The X3000 is North Star Imaging’s newest standard system. Whether you are inspecting small or large components, the X3000 is the best option for customers needing a compact system with unique capabilities generally available on a larger X-ray or CT system.
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X-ray and CT inspection System
UX20
Due to the transformation to electric mobility, foundries are increasingly producing larger and more complex components. With its exceptional inspection envelope and the smart Geminy software, the UX20 facilitates fast and precise inspections of cast parts and helps increase overall production efficiency.
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Reflectance Standards
STAN Series
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Total Dissolved Solids (TDS) Tester
TDS
Take precise measurements of total dissolved solids with Series TDS. Lightweight and compact, these testers are ideal for field testing of TDS concentrations. Large easy-to-read LCD displays the full scale readout in ppm (parts per million), no additional calculations are required to obtain actual test values
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Desktop Fluorescence Microscope
Nanoimager
The complete package for super-resolution microscopy
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Trace-Level UV Fluorescence SO2 Analyzer
Model T100U
Teledyne Advanced Pollution Instrumentation
The Model T100U Trace-level SO2 analyzer has been developed specifically to address the challenges of low level monitoring as required, for example, in the US NCore network. It uses the proven UV fluorescence principle, and is designed to allow ultra-sensitive SO2 measurements while still meeting the requirements for use as a US EPA compliance analyzer.The analyzer uses both the light and dark phases of the pulsed UV light source to continuously detect and correct for electronic noise, giving exceptionally stable and sensitive performance. A separate UV detector allows the instrument to continuously correct for variations in lamp intensity. Exceptional stability is achieved with the use of an optical shutter to compensate for PMT drift, and a reference detector to correct for changes in UV lamp intensity. A hydrocarbon "kicker" and advanced optical design combine to prevent inaccuracies due to interferents.
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Adjustable Range Reflective Photoelectric Sensor
RX-LS200
Panasonic Industrial Devices Sales Company of America
Panasonic's Die-cast Adjustable Range Reflective Photoelectric Sensor. The Sensor does not detect the background beyond the set point and the color or size of the object does not affect its sensing performance.
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*Micro-fluoroscopic X-ray Inspection System
Cath-X
The Cath-X is a bench top system employing Glenbrook’s micro-fluoroscopy technology providing highly detailed x-ray video of the critical components of the needle device. The transparent, safely shielded, view chamber permits the operator to locate the critical areas of the needle for inspection. The x-ray image can be further magnified using the electro-optical zoom feature of the Cath-X.
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X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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X5 Spacesaver X-Ray Inspection
Designed to be integrated into line with optional free standing reject, Available in 300mm and 500mm belt width models, the X5 SpaceSaver is perfect for packed products with a width of up to 250mm.
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FLuorescent Lamp And Ballast Tester
2210-20
The Milwaukee 2210-20 Fluorescent Lighting Tester is a new to world tool that tests fluorescent lighting fixtures and cuts troubleshooting time in half. The Fluorescent Lighting Tester delivers complete Lamp, Ballast and Pin testing. Test Lamps before or after installing, and test without dismantling the fixtures.Recognized for its innovation, the 2210-20 Fluorescent Lighting Tester will dramatically improve the productivity of professional electricians and maintenance technicians. Instead of a “replace and hope” strategy, users can test their lighting fixtures faster and easier. The 2210-20 Fluorescent Lighting Tester solves a top residential, commercial and industrial application.
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Convergent Reflective Photoelectric Sensor
EX-40
Panasonic Industrial Devices Sales Company of America
The Convergent Reflective Photoelectric Sensor EX-40 offers reliable object detection in a limited area. Due to convergent distance sensing, the color or material of the object has almost no effect. Further, the background also has very little effect, enabling stable sensing.
