Total Reflection X-ray Fluorescence
-
-
Product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
-
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
-
Product
Reject Station for X-Ray Image Analyser
IV-110I
-
IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
-
Product
Fluorescence Detector
RF-20A/RF-20Axs
-
The excellent basic performance of the Prominence series is further enhanced by the RF-20A/RF-20Axs fluorescence detectors, which offer world-class sensitivity, excellent ease of maintenance, and validation support functions. They support a wide range of applications from conventional analysis to high-performance analysis.
-
Product
Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
-
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
-
Product
X-Ray Fluorescence Analyzer
MESA-50
-
HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
-
Product
X-ray Microscopy
ZEISS Xradia Ultra
-
Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
-
Product
Cold Vapor Atomic Fluorescence (CVAF) Mercury Analyzer
QuickTrace M‑8000
-
The QuickTrace® M-8000 Cold Vapor Atomic Fluorescence (CVAF) mercury analyzer is ideal for ultra-trace to sub-mg/L mercury quantitation. Due to the high sensitivity of the M-8000, it easily achieves the ultra-trace detection limit of <0.05 ng/L total mercury that is demanded by customers following EPA method 1631. The QuickTrace® M-8000 is also versatile enough to analyze samples >400 µg/L without dilution in a research or industrial setting.
-
Product
Reverse Osmosis Meters For Measuring Total Dissolved Solids
RO Meters™
-
The choice of professionals for years, this compact instrument has been designed specifically to demonstrate and test Point of Use (POU) reverse osmosis or distillation systems. By measuring electrical conductivity, it will quickly determine the parts per million/Total Dissolved Solids (ppm/TDS) of any drinking water.
-
Product
Fluorescence Microscopes
-
We develop epifluorescence microscopes with a single fluorescence up to 16 fluorescences in a few seconds. Realized with standard cameras or highly sensitive sensors.
-
Product
UV Fluorescence Sulfur Dioxide Analyzer
Model T100
-
The Model T100 uses the proven UV fluorescence principle, coupled with a state of the art user interface to provide easy, accurate, and dependable measurements of low level SO2.Exceptional stability is achieved with the use of an optical shutter to compensate for PMT drift and a reference detector to correct for changes in UV lamp intensity. A hydrocarbon ‘kicker’ and advanced optical design combine to prevent inaccuracies due to interferents.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel using NumaView™ Software, or via RS232, Ethernet, or USB com ports, either locally or by remote connection using the included NumaView™ Remote PC Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView™ Software.The Model T100 comes with NumaView ™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView ™ Software.
-
Product
Hybrid Diffuse Reflectance Spectrometer
Poly602™
-
Solar Light has developed the fastest performing DRS instruments on the market, keeping product research, formulation and clinical testing in mind. HDRSplus™ software is designed specifically for a clinical testing laboratory environment and simplifies all HDRS calculations.
-
Product
X-Ray Components
-
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
-
Product
Portable X-Ray Systems Bundle
-
Discover our complete range of portable X-ray systems for NDT inspections.Fully developed in-house, these packages combine a detector, an X-ray generator, and Sherlock NDT, a state-of-the-art and user-friendly NDT inspection software.
-
Product
Dynamic X-Ray Detector
Shad-o-Box HS
-
The Shad-o-Box HS family of x-ray detectors are high-performance, high-resolution x-ray imaging devices designed for high speed digital radiography applications. Each model combines our x-ray sensor modules with appropriate readout electronics and a 14-bit digital interface for easy connection to a PC. The high-speed digital connection allows real-time imaging at frame rates up to 66 fps, while the state-of-the-art CMOS technology offers superb contrast, dynamic range, and resolution.
-
Product
Industrial CT X-Ray Inspection System
X5000
-
The X5000 is the most versatile system offered by North Star Imaging. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items.
-
Product
X-ray Diffraction (XRD) Instruments
-
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
-
Product
X5 Pipeline X-Ray Inspection
-
Designed to be integrated into the production line and available with product pipes in 2.5 and 3 ", the X5 pipeline is perfect for a wide range of pumped products such as poultry, meat, slurries and sauces. The system is capable of offering good detection levels on a wide range of contaminants including all metal, bone, glass, dense plastics.
-
Product
Calibrated Diffuse Reflectance Standards
-
Diffuse reflection calibration standards in synthetic ODM and ODMP material
-
Product
Cabinet X-ray System
XPERT 80- L
-
Kubtec's XPERT 80-L, for large area imaging, is a multi-purpose cabinet x-ray system bringing high quality medical-grade imaging and ease of use to applications in scientific research, pathology and industry. A small focal spot with an x-ray source of up to 130 kV offers brighter images with higher contrast for visibility of the smallest details and most subtle variations in density. Optional sources are available for micro-focus and soft x-ray applications.
-
Product
Large-Area CMOS X-Ray Detector
Rad-icon
-
Teledyne DALSA’s Rad-icon product family of large-area digital x-ray cameras offers users a high-speed, high-performance x-ray imaging detector with a fast, reliable PC interface (either GigE or CameraLink) for easy integration.
-
Product
X-ray Inspection System
RTX-113™
-
Glenbrook’s RTX-113 is designed for heavy production environments where X-ray is used to inspect PCBs and assembled PCBs containing advanced components such as BGA, micro BGA, QFN and other devices.
-
Product
Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
-
Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
-
Product
Analyzer for Total Sulfur
FGA-1000
-
ATOM Instrument offers the most versatile total sulfur analyzers available. The ATOM FGA-1000 is an online process analyzer utilizing patented Excimer UV Fluorescence (EUVF) Technology to measure Total Sulfur in a variety of applications such as monitoring refinery flare gas and subsequent sulfur dioxide (SO2) emissions as mandated by the EPA Rule 40 CFR 60, Subpart Ja.
-
Product
MIPI Soundwire Total IP Solutions
Soundwire
-
Soundwire is suited for small, cost-sensitive audio peripherals such as modern digital class-D amplifiers and digital microphones. The Total MIPI SoundWire IP Solution from Arasan enables early adopters the fastest path to adoption of this new standard by offering a comprehensive IP package that includes the Verilog RTL source code for Master and Slave, fully validated for compliance with the standard, a comprehensive test environment with a compliance suite for verification of the IP package, a SoundWire Hardware Development Kit (“HDK”) for FPGA prototyping, a SoundWire protocol analyzer and a complete SoundWire software stack.
-
Product
Reflective Memory Hub
ACC-5595
-
The ACC-5595 is a managed hub designed to operate with our 5565 family of Reflective Memory real-time network products. The Reflective Memory hub can automatically bypass ports when it detects a loss of signal or the loss of valid synchronization patterns, allowing the other nodes in the network to remain operational.
-
Product
Inline 3D-CT Automated X-ray Inspection Systems (3D-AXI)
3Xi Series
-
Saki's 3D-AXI (X-Ray) series adds significant inspection capability. The system utilizes Planar Computed Tomography (PCT) providing high precision CT imaging at high speed.
-
Product
Fluorescence Spectroscopy
-
HORIBA’s Fluorescence division incorporates technology from SPEX, IBH, Jobin-Yvon, PTI and SLM - the dominant names in Fluorescence Spectroscopy. We offer the widest range of Steady State Fluorescence spectrometers, Fluorescence Lifetime spectrometers, Steady State and Lifetime Multi instruments and Microscope-based Microscopy solutions.
-
Product
X-ray CT System
-
The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
-
Product
Nano-focus X-ray Inspection System
X-eye NF120
-
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
