X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD - Helmut Fischer AG (Fischer Technology, Inc.)
Premium model with universal application characteristicsHighest excitation flexibility, for both the size of the measurement spot and the spectral compositionWith the silicon drift detector, even very high intensities> 100 kcps can be processed without a loss in energy resolutionVery low detection limits and excellent repeatabilityLarge and easily accessible measurement chamberAutomated series testing with fast, programmable XY-stage
