EV Test Systems
See Also: Electric Vehicle Test Systems, EV Testers
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Product
End of Line Noise Test System
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End of Line Noise Test Systems from VIacoustics are designed to support end of line product noise testing on factory floors and quality assurance environments. Using the Limit Analysis features of the Nelson Acoustic Trident software, users can set noise emission maximum, minimum or control range criteria based on Awtd and/or 1/N octave band criteria. Criteria can be customized for most any type of product based on the noise emissions of known good and bad units. The large front panel Pass/Fail indicator allows operators to quickly determine if units meet the criteria. Data on units that fail can be exported for further analysis.
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Product
Thermal Stability Test System
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Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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Product
High Impact Shock Test System
KRD16 series
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High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Product
Life Cycle Module Testing System
LCN
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Full featured test system for quality control and R&DLife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Product
Vacuum Leak Test Systems
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Vacuum leak testing is the principal leak test method for testing parts that could have leakage from an external source into their housings and casings. Parts like underwater sensors or housings, outdoor electrical housings, sealed components, and components associated with vacuum sources are all prime candidates for vacuum leak testing. Operation of instruments that supply vacuum to test parts instead of pressure works in a similar, yet essentially opposite, manner as pressure decay testing.
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Product
160MHz Test System
IQxel-MW 7G
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Platform solution for 802.11 a/b/g/n/ 802.11ac, 802.11ax, and 802.11be testing in the 2.4 and 5 GHz and 6 GHz bands and the most popular wireless connectivity standards (Bluetooth®, Bluetooth® 5, Bluetooth® 5.1, Bluetooth® 5.2, Zigbee, Z-Wave) as well as LPWAN technologies (Sigfox, LoRa).
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Product
System Tests Radar Pulse Stability
PN9002
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Noise eXtended Technologies S.A.S.
The cost-effective PN9002 test simplifies the testing and analysis of pulse-to-pulse amplitude and phase stability for radar systems and components to 18GHz.
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Product
Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
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Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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Product
Photoelectrochemical Test System
ModuLab XM
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The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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Product
Portable Test System
MT680s
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Actual value, vector, curve displaypower generationerror measurementMeasurement of harmonics up to the 40thVoltage supply via existing measurement voltage
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Product
High Voltage Cable/Harness Test System
CKT1175-50
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The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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Product
Advanced Test Systems
ATS
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The commercial version of the RTS-503, this one is not built with the rugged qualifications of the RTS-503. The case is plastic and fuses are used. Otherwise, the internal components and software capabilities are very similar.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Pressure Decay Test Systems
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Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the industry standards for reliability and repeatability. CTS' 30+ years of experience goes way beyond the pressure test unit by offering our customers comprehensive, custom turnkey solutions to the most challenging leak testing problems.
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Product
Modular Test System
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A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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Product
Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Product
Automotive Test Systems
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Ono Sokki Automotive Test Systems - flow meter, non-contact speedometer, engine tachometer, crank angle detector, and more
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Product
Operating Software for elowerk Test Systems
TestBuilder
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elowerk TestBuilder is the operating software for elowerk test systems. TestBuilder is based on the Microsoft .Net Framework and runs on Windows Vista and Windows XP. Test programs can be created by CAD data import. The comfortable graphical user interface allows a straightforward editing of test programs. Customized applications can be programmed using a programming interface.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Eddy Current Testing /ET System
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Xiamen IDEA Electronic Technology Co., Ltd.
Eddy current testing system uses the most advanced digital electronic technology, photovoltaic technology and microprocessor technology. With beautiful design automatic transmission, complete electromechanical integration system, which is the only company that have a complete system of automatic machine.
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Product
Electric Power System Characteristics Test
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This test is also known as the power supply line voltage and frequency variations test. A few of the measured characteristics are: voltage and frequency modulation, voltage spike, and voltage transient recovery.
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Product
Discrete Devices High-speed Testing System
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QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Benchtop with Drop-In Test System
600 Series Compact ATE Platform
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The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Product
Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Product
Silicon-Microphone 8Ch Auto Test System
BK9015
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Based on the BK3011 MEMS Mic Tester, the BK9015 is our fully automatic 8 channel MEMS (Silicon) mic sweep tester. Testing up to 8 DUT's simultaneously, the BK9015 can test 8 mics simultaneously and sort them according to passing grade and cause of failure! Because it uses a sweep test, it can check characteristics for the entire frequency range. Your data can be viewed in real time or stored so you can analyze problems or trends.
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Product
LED Power Driver Test System
Chroma C8000
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Chroma Systems Solutions, Inc.
The Chroma 8491 ATS is equipped with optimized standard test items for LED driver testing (lighting & TV backlight). The user is only required to define the test conditions and specifications for the standard test items to perform the test.
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Product
HSI System Test Panel
TA-500
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This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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Product
Battery Test System
WBCS3000Le32
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : -1V to 5Vmax. current range : ±1A
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Product
IPC Systems
System
Industrial Server-Grade System delivers a scalable high performance platform for a wide array of industrial applications.
