High Temperature Test System

129620A - Ametek Scientific Instruments (Ametek SI)

Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.

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Materials Test Systems

Ametek Scientific Instruments

An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.

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Materials Test System

ModuLab XM MTS - Ametek Scientific Instruments

I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) High-speed pulse (used to activate charge carriers in electronic and dielectric materials)Staircase and smooth stepless analog ramp waveformsImpedance, admittance, permittivity / capacitance, electrical modulusC-V capacitance - voltage, Mott-SchottkyAutomatic sequencing of time domain and impedance/capacitance measurements

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Materials Lab XM

Ametek Scientific Instruments

The Materials Lab XM product provides a fully integrated reference grade time domain and AC measurement platform. No need to switch sample connections between techniques. Time domain measurements include I-V (current voltage) characterization as well as fast pulse techniques. AC testing techniques include everything from single-sine analysis, to multisine / Fast Fourier Transform for faster low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. Measurements of electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance are all provided from the XM-studio MTS software platform, together with integrated equivalent circuit analysis functionality.

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Dielectric Interface System

1296A - Ametek Scientific Instruments

Analyzing low conductivity, low loss materials stretches the capabilities of even the best impedance analyzers. Used alone, they lack the sensitivity required for accurate measurements, especially at low frequencies.

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LHe/LN2 Cryostat System

129610A - Ametek Scientific Instruments

Liquid nitrogen (LN2) or liquid helium (LHe) can be used as the cryogen depending on the required operating temperature range. This allows standard tests to be performed using relatively low cost LN2 as the cryogen. Higher cost LHe can be substituted for the duration of tests where very low temperature is required, providing an economical solution to your test requirements.

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Room Temperature Sample Holders

12962A - Ametek Scientific Instruments

The 12962A sample holder is designed to allow accurate impedance tests of solid materials to be performed at room temperature. The sample holder consists of two parallel electrodes, one of which is fixed in position and the other which can be moved into contact with the sample by adjustment of a micrometer. The sample holder makes use of guard ring and reference techniques in order to improve accuracy by reducing “fringing” effects at the edge of the sample. The standard electrode provided is 20mm diameter.

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High Temperature Test System

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Materials Test Systems

Materials Test System

Materials Lab XM

Dielectric Interface System

LHe/LN2 Cryostat System

Room Temperature Sample Holders