EV Test Systems
See Also: Electric Vehicle Test Systems, EV Testers
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HSI System Test Panel
TA-500
This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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Battery Test Systems
Was designed to meet the specific demands of our loyal customers. This system is used to test both single cell batteries as well as super-capacitors.
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Brake Test Systems
GIANT 9000 Series
The major test target is to detect noise and vibrations generated by the vehicles brake. Our intention was to build a dynamometer that can operate either with brakes mounted to the complete vehicle, or with just the axle module mounted to a universal adaptor system or wheel suspensions.
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Universal Test System
LS6601A
LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Fully-automated Test Systems
Special mechanical systems/solutions
Foerster Instruments, Incorporated
Alongside individual test instruments, we collaborate closely with our customers to develop and produce customized test systems for their application. Following a consultation with our product and sales specialists, we develop a concept to suit you. For the production process that follows, we enter into product-specific collaborations with professional mechanical system manufacturers to achieve the best possible solution. We are also happy to work with mechanical system suppliers proposed by our customers. These suppliers are often familiar with the peculiarities of the component and know how to handle them. Even after the production stage, we assist you with commissioning the test system and are are on hand to answer any questions afterwards.
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Transmission Performance/Endurance Test System
This system is suitable for vehicle drive test with only the transmission unit in combination with the real-time model calculation by the measurement/control panel and low inertial motor. Simulation test of an actual vehicle running condition can be executed by modeling engines, tires or vehicles other than transmission. The engines, tires and vehicles are modeled by MATLAB® / Simulink®, so they can be evaluated under various conditions by changing parameters or replacing models.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Test System
MxDSRC™
The MxDSRC Test System simulates systems in the vehicle that interact with the DSRC radio module to create tests closely replicating real-world scenarios. Its integrated approach allows the DSRC components, such as RF quality and protocol conformance, to be exercised with multiple system components. MxDSRC provides a powerful and easy-to-use framework for testing your DSRC system.
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Coil Test System
CTS
International Electro-Magnetics, Inc.
The system is controlled by a PC using software written in Visual Basic. It offers visually oriented menus that allow easy coil configuration and test set up procedures.
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METES - Meter Test Systems
Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Electronic Transformer Test System
UI2000-ET
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Handover Test Systems
Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
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Flying Probe Test System
A8a
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Compact EMC Test System
Multi-CE5
The Multi-CE5 includes an Electrical Fast Transient Generator (EFTG), a Combination Wave Generator (CWG) and a Coupling-/Decoupling Network (CDN) for single-phase power supply lines. The software program CE-REMOTE allows full remote control of the test generator via Ethernet light guide as well as recording, evaluation and documentation of test results, according to IEC 17025. To record the wave shape of impulses, it is equipped with an Impulse Recording Function (IRF).
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Testing System
OpTest™ MTF
The Optikos OpTest™ MTF Testing Equipment is the most flexible and complete system for characterizing the optical performance of optical elements, lens assemblies and optical imaging systems in Infinite Conjugate, Finite Conjugate and Afocal configurations spanning the UV, Visible, NIR, SWIR, MWIR and LWIR spectral regions . OpTest™ software drives Optikos hardware, is easy to use and controls all motion control, image acquisition, configuration set-up and data reporting.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Capacitance & Tan-Delta Test System
TD-1
By measuring the electrical properties such as capacitance and Tan-Delta regularly on periodical basis, it is possible to ensure the operational unexpected breakdown. Dissipation factor (Tan Delta) is one of the most powerful off-line nondestructive diagnostic tool to monitor the condition of solid insulation of various high voltage equipment.
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MirrorLink Test System
Catena 2210
The Catena 2210 is a test tool with two USB Network Control Model ("NCM") devices. These devices create a bridge between two USB hosts. Validation testing is made possible by connecting a test control computer to the USB host being tested. Ethernet traffic from the test host is transferred through the Catena 2210 device to the control host, and vice versa.
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AC Resonance Test System
KV Hipot Power Test Equipment Co.,Ltd
KVXZ-270kVA/270kV Variable Frequency AC Resonance Test System is applied for AC dielectric test for electric equipment.
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Automatic Transformer Test System
TH2829AX-48
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 48 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Compact Functional Test System
E2230C / TS-5040
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Vehicle Test Systems
What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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RF Conducted Immunity Test System
RFCI61000-4-6
RFCI61000-4-6 RF Conducted Immunity Test System is an automatic test system which is for the conduction sensitivity testing, it is fully meets IEC61000-4-6.2006, ISO11452-4, GB/T17626.6-2008 and GTB152B-CS114 etc standards. RFCI61000-4-6 internal source and broadband power amplifier can be generated 3 voltage test levels: 1v, 3v and 10v, and has the function of the real detect output level. It has two operation software which is calibration software and test software. When measuring, the signal is in 1 KHZ sine wave amplitude modulation system (80%) to simulate the actual harassment, and can through the coupling/decoupling network (CDN or electromagnetic clamp) to make the harassment signal coupled to the device.
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Automatic Transformer Test System
TH2829AX
Changzhou Tonghui Electronic Co., Ltd.
*Number of Test PIN: 20*Frequency: 20Hz-200Hz, Resolution: 0.5mHz*Signal Level: 50mV-2Vms (Option 2nv-10Vms)*Test Speed: max 13ms
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
