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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltag...show more -
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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High Current SMU 600/1200/2400 A
AXC85xx
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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PXI 24 Channel High Voltage Multiplexer
40-320-101
The 40-310/320 Range of High Voltage Switching Modules will hot switch up to 750V peak and cold switch up to 1000V peak in either general purpose relay (40-310) or multiplexer (40-320) configurations. These modules contain high-quality reed relays with switching ratings comfortably higher than the 40-310/320 specification. Applications for the 40-310/320 series modules include; circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
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High-resolution, SWIR InGaAs camera
Wildcat+ 640 Series
The Wildcat+ 640 series is based upon a state-of-the-art InGaAs detector with 640×512 pixels and 20 μm pixel pitch. The camera offers superior, high resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 640 camera outputs full frame images up to 300 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 640 is suitable for semiconductor inspection, display insp...show more -
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Vacuum Process And Chamber Environment Monitors
Our process monitors are innovative in-situ process monitoring instruments that are fully integrated, application-specific packages, including component residual gas analyzers (RGAs), analytical equipment, and control software. Process mass spectrometers are used in varied applications, including; Semiconductor, Thin Film (CVD, Etch, PVD and degas), pharmaceutical lyophylization and bulk gas purity monitoring.
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3.4 MP Autofocus (Liquid Lens) Low Light Camera Module
e-CAM31_MI0330_MOD
e-CAM31_MI0330_MOD is a high performance, small form factor, 3.4 MP Autofocus Low Light Camera Module with Liquid Lens. It is based on AR0330 CMOS Image sensor from ON Semiconductor®. This Autofocus Liquid Lens Camera Module has slave mode for precise frame-rate control and for synchronizing two sensors. e-CAM31_MI0330_MOD – Liquid lens camera module has superior low light performance. It supports Full HD @ 60fps for maximum video performance. It also has a support for external mechanical shutte...show more -
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Fast Response Gas Detector
Leaksurveyor
Teledyne Gas & Flame Detection
The GMI Leaksurveyor combines quality, ruggedness and advanced Technology in a user friendly, portable gas detector. The integral fast response and high sensitivity semiconductor sensor enables leakage surveys to be performed and distribution leaks to be quickly found.
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High Precision, High Stability Chemical Concentration Monitor
CS-700
The HORIBA CS-700 chemical concentration monitor enables high performance measurement of the individual chemical constituents of complex chemistries used in the leading edge Semiconductor Manufacturing Processes.By improving HORIBA's renowned spectroscopic measurement technology, the CS-700 realizes up to 5X improvement in measurement performance.
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MPI PA Wafer Probers
MPI Photonics Automation is the industry-leading provider of turnkey wafer test and measurement solutions. We offer a complete line of high-performance wafer probers designed to address the diverse and complex needs of the Photonics, Optoelectronic, Semiconductor, and Laser industries.
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SmartPower® Intelligent Microwave Generators
SmartPower® AX2500 Series intelligent microwave power generators are built on proven experience in designing rugged, reliable microwave power generators for demanding semiconductor fabrication and industrial applications. The compact AX2500 design architecture incorporates field-proven technology, and combines new design features aimed at improved performance and lower cost of ownership.
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PhotoMOS
Panasonic Automotive & Industrial Systems Europe GmbH
Modern semiconductor technology enables fast, quiet, bounce-free switching, even in miniature sizes. PhotoMOS relays nevertheless enjoy an almost unlimited lifetime if used according to the specifications. Moreover, they are extremely reliable, unaffected by vibrations, and their ON-resistance remains stable throughout their entire lifetime.
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Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Biased and Unbiased HAST Testing
Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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Semiconductor
The semiconductor industry faces continuous pressure to reduce device size and costs while improving performance and reliability. Semiconductor, test and assembly automation manufacturers demand the same improvements from the motion technology which drives it. Haydon Kerk Pittman continues to develop new technologies in motors, lead-screws, gears, encoders, actuators, slides, drives and complete sub-systems that increase operational speeds and accuracy while lowering the cost of ownership.
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2-Slot BRIC, 256x4, 1Pole, PXI Matrix (2 Sub-cards)
40-559-201-256x4
This range of BRIC ultra-high-density large PXI matrices are available in 2, 4 or 8-slot PXI sizes to suit all high-performance matrix requirements and are constructed using Pickering Electronics' 4mm x 4mm instrumentation quality reed relays. With their high level of switching density, these PXI matrices allow a complete Functional ATE system to be housed in a single 3U PXI chassis and allow the use of much lower cost 8 or 14-slot chassis. The 40-559 matrices can be used in many i...show more -
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Power Device Analyzer
bsw TestSystems & Consulting AG
Semiconductor manufacturers need accurate data on the exact electrical characteristics of their components as a basis for further optimization.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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4K MIPI NVIDIA® Jetson TX2/TX1 Camera Board
E-CAM131_CUTX2
e-CAM131_CUTX2 - 13MP Jetson TX2/TX1 camera board is a 4-lane MIPI CSI-2 camera solution for NVIDIA® Jetson TX2/TX1 developer kit. This camera is based on 1/3.2" AR1335 CMOS image sensor with advanced 1.1µm pixel BSI technology from ON Semiconductor® and an integrated high-performance image signal processor (ISP) that performs all the Auto functions (Auto White Balance, Auto Exposure control). It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement.
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Laser Head
5517D
The Keysight 5517D is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Compact Photon Counting X-Ray Detector
HyPix-3000
Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Laser Head
5517CL
The Keysight 5517CL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Option 009 allows a larger angular range of measurement by providing a 9 mm beam diameter for use with three-axis interferometers. Please contact Keysight for custom requirements.
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Non-Linear Junction Detectors
ORION® HX Deluxe
The hand-held ORION HX Deluxe Non-Linear Junction Detector (NLJD) has interchangeable 2.4 GHz and 900 MHz antenna heads. The ORION HX Deluxe NLJD is used to sweep areas for electronic semi-conductor components. In this way, the ORION HX Deluxe NLJD detects and helps to locate hidden electronics or eavesdropping devices regardless of whether the electronic device is turned on.
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Frame Grabber
Alta-AN
The Alta-AN is an affordable, versatile analog product family for Semiconductor and Industrial Vision OEMs. This family can acquire from almost any analog camera on the market, from high speed asynchronous-reset monochrome cameras to super high resolution color HDTV cameras. The Alta frame grabbers are high-quality, flexible, PCI Express bus imaging products, well supported by an easy-to-use SDK, and drivers for most popular software imaging packages.
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2MP HDR Jetson TX2/TX1 Camera Board
E-CAM20_CUTX2
e-CAM20_CUTX2 is a 2MP HDR camera board for NVIDIA® Jetson TX2 /TX1 developer kit. It has an ability to stream seamlessly at wide temperature range (-40°C to 85°C). It enables an excellent low-light performance and can capture images even under 0.5 lux. e-CAM20_CUTX2 is based on 1/2.7" AR0230AT CMOS image sensor from ON Semiconductor™. It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement.
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Probe Card Analyzers
PB3600
The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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Piezo-resistive Accelerometer
A Piezo-resistive Accelerometer has a stable structure composed on a silicon chip created by the micromachining and semiconductor production technology. A mass and a beam on which a set of the Piezo-resisters are created on the silicon chip. A set of electrical bridged is formed by such Piezo-resistive resisters to generate signals proportional to the applied acceleration.
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Test Data Investment Services
PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can...show more
