-
product
Portable Receivers
SRc & SRc5P
The SRc5P and SRc consists of two separate receivers built into a single, ultra compact housing with adapters for video camera receiver slots and for stand-alone use. Digital Hybrid Wireless® technology provides superb, compandor-free audio quality and compatibility with other wireless systems. The RF performance is extremely stable over a very wide temperature range, making the receiver perfectly suited to the rough environmental conditions found in field production.
-
product
Very Low Pressure Variable Reluctance Sensor
DP103
The Validyne DP103 is designed for exceedingly low differential pressure measurement applications where high accuracy is required under rough physical conditions. With full scale ranges down to -0.008 psid (-0.56cm H2O), this instrument is being used in the measurement of very low flow rates of gases where symmetrical pressure cavities are required for dynamic response. It is also used in very small leak detection and pressure null detection systems.
-
product
Pharmaceutical Analyser
RA802
The RA802 Pharmaceutical Analyser is a compact benchtop Raman imaging system designed exclusively for the pharmaceutical industry. It rapidly determines API/excipient domain statistics enabling you to formulate tablets more efficiently. With Renishaw's LiveTrack™ focus-tracking technology, the RA802 can efficiently analyse uneven, curved, or rough surfaces at incredible speeds and without any sample preparation. Look at tablets, powders, granules and liquids in their original form.
-
product
USB Oscilloscope
Handyprobe HP3
The Handyprobe HP3 is a small and light weight USB oscilloscope. The Handyprobe HP3 combines a fast sampling up to 100 MS/s with a high input range of 800 V and a differential input in a small and light enclosure. Powered only by USB, this verstatile USB scope enables safely measuring high voltages anywhere in the field. Its rugged housing is specially designed for use in a dirty and rough environment but is compact enough to fit into any tool case.
-
product
Process Sense™ NDIR End Point Detector For Chamber Clean
The Process Sense endpoint sensor is a small, low-cost SiF4 sensor specifically designed for Remote Plasma Chamber Clean Endpoint detection for silicon-based CVD deposition chambers. Process Sense is based on infrared absorption, the only technique applicable to all plasma cleaning processes (in-situ and remote). It gets mounted onto a bypass on the rough line, ensuring no effect on deposition hardware. The signal level reported by the Process Sense, which is proportional to SiF4 concentration, can be used to determine the completion of the chamber clean process.
-
product
Model N8: Narrow Materials Moisture Meter
MRC001948
Designed for flat, curved, smooth, or rough surfaces such as cones or beams of yarn, rolls or stacks of cloth, and more. Electrode covers an area of 1 - 1/4 x 3 inches and penetrates 1/2 inch into the product.
-
product
Vibration Control
m+p VibControl vibration controllers for advanced vibration control and shock testing from 4 to hundreds of input channels are used by many of the leading environmental test laboratories throughout the world. The endusers appreciate the intuitive operation, the extensive analysis and reporting functions, the numerous upgrade possibilities and, of course, the excellent stability and high quality level of the m+p vibration control systems. Applications range from normal to very extreme conditions, and also include rough transportation circumstances.
-
product
Portable Hydrostatic Hose Tester, 15000 psi; USMC
9901HT-8762
The 9901HT-8762 Hydraulic Hose Test System is utilized by the United States Marine Corp. for their portable forward base maintenance stations. The system includes it's own onboard "quiet" air compressor and a set of 37 degree flared test adapters from 3/16" through 2" as well as an onboard calibration gauge and pneumatic castors for use on rough terrain.
-
product
Areal Confocal 3D Measurement
µsurf
The measuring system of the µsurf-product line enable automated 3D surface measurements of roughness, topography, layer thickness and volume. µsurf-measuring systems are available in different designs: from compact mobile systems and laboratory solutions up to multisensor setups on granite portal for use near production lines.
-
product
Vacuum Sensor, Thermocouple Vacuum Gauge for Rough Vacuum
DV-4 Series
Teledyne Hastings, manufacturer of the original DV-4, DV-5, and DV-6 thermocouple vacuum gauge tubes, produces vacuum measurement equipment with exceptional stability, accuracy, and reliability under the most demanding conditions.
-
product
Optical Tactile Surface Finish
1000Z
The Adcole Model 1000-Z features both optical and tactile measuring heads to deliver high precision surface measurements of camshafts, crankshafts and turned parts. The non-contact interferometric probe greatly expands on the measurement capabilities from the diamond tipped contact probe of the standard Adcole 1000 gage, as the optical accessory can precisely measure surface finish of cam track groove sidewalls, cam track bottom grooves and more. Profilometers such as the 1000-Z quantify surface roughness and are relied on to maintain quality and identify potential problems in the manufacturing and coating process.
-
product
Three Phase Electronic Meter DTS999
Bofa Instrument & Equipment Co., Ltd
DTS999 series Single Phase energy Meter are new and high-tech products adopting special large-scale IC, latest micro-electronic technology and SMT production crafts. It is designed for rough working condition and components selection as foundation, so it can ensure the long-term stable operation. DTS999 series Electronic Single Phase Watt-hour Meter features long life, high accuracy, high reliability, high allowable overload, little power consumption, small size & light weight, etc.
-
product
Stereo and Zoom Microscopes
Generate three-dimensional and laterally precise images. With Stereo Microscope you observe large samples such as leafs and tissues or inspect rough material surfaces. Upgrade your microscope flexibly with different digital cameras and benefit from various types of illumination techniques.
-
product
Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
-
product
Optical 3D Measuring Systems & Devices For Your Quality Assurance
As a manufacturer of optical industrial metrology, we offer a broad portfolio of optical 3D measuring systems & devices to support companies in various industries with precise quality assurance in production. Based on Focus Variation technology, our measuring systems not only enable surface roughness measurement, but also the detection of micro-geometries, shapes and structures.
-
product
Gratings for Synchrotron, FEL and EUV Light Sources
HORIBA Scientific holographic lamellar gratings exhibit ultra-low grooves roughness and unique efficiency uniformity making them ideal for Synchrotron, Free Electron Laser (FEL), EUV or Soft X-ray light sources.
-
product
Surface Roughness Gauges & Testers
Surface roughness gauges are used for measuring the surface roughness of a material. GAOTek’s surface roughness gauges are reliable, high quality, and affordable instruments that provide an accurate measurement. They are an efficient and quick means for inspection or testing. Our gauges are compact, easy to carry and portable, allowing the user to work in complex conditions, and are available for sale to the United States, Canada and globally.
-
product
3D Roughness Measurement System
IF-Profiler
The If-Profiler is a handheld 3D roughness measurement system for high resolution measurement of surface finish. You measure roughness of flat and curved components with only one system. Measurements are performed both profile based (ISO 4287) and areal based (ISO 25178). The measurement system achieves flexible measurements and applications at high measurement speed. Various positions and measurement fields are traceably and intuitively measured. The IF-Profiler is also used to measure geometries with steep flanks and various coatings.
-
product
Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
-
product
3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
-
product
Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
-
product
Analog Force Gauges
Phase II force gauges are designed and engineered to achieve WORLD-CLASS tension/compression measurements. Heavy duty construction allows the force gauges to undergo rough handling in any environment, while providing for extremely sensitive and highly accurate readings. The Phase II force gauges include a direct dual scale reading in both lbf and kgf, eliminating the need for two separate gauges in the shop.
-
product
Optical CMM Systems
Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
-
product
Spectroscopic Ellipsometry
Spectroscopic ellipsometers measure film thickness and refractive index of single layers, and multi‑layer stacks. Related properties of bulk materials, isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analysed.
-
product
LVDT Displacement Sensors With Ball Swivel Heads
INELTA Sensorsysteme GmbH & Co. KG
This LVDT Series is made for a rough, industrial use. The housing having a diameter of 20mm is fastened "floating" to the application using two ball swivel heads. There is a diversity of displacements up to 200m possible.
-
product
Spectroscopic Reflectometry
Measure reflectance of flat or curved samples with smooth or rough surface.
-
product
PCB Material Characterization
N19308B
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
-
product
Roughness Measurement CMM Stylus
ZEISS ROTOS
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
-
product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
-
product
Coating Thickness Gauge - Integral
Elcometer 456
Whether you are measuring on smooth, rough, thin or curved surfaces, the Elcometer 456 Dry Film Thickness Gauge produces accurate, temperature stable measurements thanks to its ±1% thickness measurement capability and increased reading resolution.
