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Product
Model A8: All-Purpose Moisture Meter
N/A
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Designed for flat, curved, smooth, or rough surfaces such as cones or beams of yarn, rolls or stacks of paper or paperboard. Covers 3" a diameter (7.6mm) and penetrates 3/4" (1.9cm). Reliable, long battery life. Includes a rechargeable battery, carrying case, and operating instructions book.
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Product
Benchtop 3D Optical Profilometers
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Compact, non-contact metrology instruments used for high-precision, sub-nanometer to micrometer-level measurement of surface topography, roughness, and step heights.
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Product
Process Sense™ NDIR End Point Detector For Chamber Clean
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The Process Sense endpoint sensor is a small, low-cost SiF4 sensor specifically designed for Remote Plasma Chamber Clean Endpoint detection for silicon-based CVD deposition chambers. Process Sense is based on infrared absorption, the only technique applicable to all plasma cleaning processes (in-situ and remote). It gets mounted onto a bypass on the rough line, ensuring no effect on deposition hardware. The signal level reported by the Process Sense, which is proportional to SiF4 concentration, can be used to determine the completion of the chamber clean process.
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Product
Portable Surface Roughness Tester Profilometer
SRG-4000
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The latest in state-of-the-art surface roughness testers profilometer, the SRG-4000 is designed with the shop environment in mind. These surface roughness testers profilometer are distinguished by a high level of accuracy, multiple parameters and simplicity of operation. Extremely sensitive and highly accurate readings from this Phase II surface roughness tester are offered via multiple surface roughness profilometer parameters, Ra, Rq(Rms), Rt and Rz.
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Product
Contour And Surface Measuring Machines
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The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both. The contact-free linear drive makes these machines highly efficient and low-maintenance.
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Product
Stylus Profilometry
Dektak®
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Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Product
Solar Radiation (Sunshine) Test
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This test determines the effects of direct solar radiation on components and material. The heating effects of solar radiation differ from those of high air temperature in that the amount of heat absorbed depends on the roughness and color of the surface on which the radiation is incident and the angle of incidence to the sun. Variations in the intensity of solar radiation over the surface of the component, may cause components to expand or contract at different rates, which can lead to severe stresses and loss of structural integrity. In addition, degradation due to photo-chemical changes can occur such as fading of color, deterioration of natural and synthetic elastomers and polymers. The test items that are subjected to solar radiation testing are those that are exposed to solar radiation during its life cycle, in the open, in warm climates.
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Product
Vibration Control
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m+p VibControl vibration controllers for advanced vibration control and shock testing from 4 to hundreds of input channels are used by many of the leading environmental test laboratories throughout the world. The endusers appreciate the intuitive operation, the extensive analysis and reporting functions, the numerous upgrade possibilities and, of course, the excellent stability and high quality level of the m+p vibration control systems. Applications range from normal to very extreme conditions, and also include rough transportation circumstances.
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Product
Roughness Testers
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Roughness is an important parameter when trying to find out whether a surface is suitable for a certain purpose. Rough surfaces often wear out more quickly than smoother surfaces. Rougher surfaces are normally more vulnerable to corrosion and cracks, but they can also aid in adhesion. A roughness tester is used to quickly and accurately determine the surface texture or surface roughness of a material. A roughness tester shows the measured roughness depth (Rz) as well as the mean roughness value (Ra) in micrometers or microns (µm). Measuring the roughness of a surface involves applying a roughness filter. Different international standards and surface texture or surface finish specifications recommend the use of different roughness filters. For example, a Gaussian filter often is recommended in ISO standards.
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Product
Spectroscopic Reflectometry
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Measure reflectance of flat or curved samples with smooth or rough surface.
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Product
Surface Roughness Meters
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This instrument is compatible with four standards of site to measure surface roughness of various machinery-processed parts, calculate corresponding and clearly display all measurement parameters.When measuring the roughness of a surface, the sensor is placed on the surface and then uniformly slides along the surface by driving the mechanism by the sharp built-in probe. This roughness causes displacement of the probe which results in change of inductive amount of induction coils so as to generate analogue signal, which is in proportion to the surface roughness at output end of phase-sensitive rectifier.
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Product
Sound Quality Evaluation Pack
OS-2740
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The OS-2740 is package software consists of the OS-2700 and plug-in options including sound quality evaluation software. This software quantify sound by using six parameters of psychoacoustic evaluation; loudness, sharpness, roughness, fluctuation strength, AI (Articulation Index), tonality as well as conventional physical quantities such as frequency analysis or octave analysis.
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Product
Analytical Services
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Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
