Showing results: 106 - 120 of 199 items found.
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SMT Adapters -
Ironwood Electronics
Ironwood’s SMT package emulation adapters are often called “surface mount feet” or “emulator bases”. These adapters provide access and interconnections to surface mount lands. Typically, the adapters are soldered to the target board in place of the IC device and provide a pluggable array of pins interface for sockets, probing adapters, package converters, and even board-to-board connections. These adapters are often utilized as a base for many of our probing adapter products. We constantly innovate to provide the most reliable, cost effective interfaces available. For example, many of our PLCC, QFP and SOIC emulation bases use our proprietary shaped solder techniques, replacing expensive, and often fragile, J-lead and Gull Wing leads. Shaped solder parts are easily fluxed and reflowed onto the target system. Our emulator bases can present either a male or female interface at 1.27mm or 1mm or 0.8mm pitch gold plated array pins for pluggable connection.
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SemiProbe
The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.
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Tektronix, Inc.
Passive voltage probes ship standard with most oscilloscopes and provide a low cost, general purpose probing solution. Generally, these probes lack the performance of an active voltage probe but provide the ruggedness and wide dynamic range suitable for visualizing signals over a broad range of applications. Tektronix has released a new class of passive probes that redefine performance in the passive probe product category.
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Tektronix, Inc.
Verification and debug of today's high speed, low voltage digital signals requires probing solutions that can accurately acquire from a wide variety of electronic designs and protect signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions.
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50 -
Picoprobe
The MODEL 50 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 50 Picoprobe®, with or without the bias T option, achieves an insertion loss of less than 0.8 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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75 -
Picoprobe
The MODEL 75 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 75 Picoprobe, with or without the bias T option, achieves an insertion loss of less than 1.0 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Teledyne LeCroy
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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TPA-GFG -
High Power Pulse Instruments GmbH
*Electrically isolated probearm for GND needle contact or general purpose DC, twin-wire HBM or flexible pitch VF-TLP/TLP/HMM/HBM force/sense probing based on the HPPI GF-A flexible pitch setup.*Flexible rotation of the probearm by precision gear 80:1*Suitable to mount the GF-A ground fixture needle for flexible pitch measurements. In addition a cable (e.g. for HBM) can be directly connected to the contact pin.*High stability
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Reedholm Systems
Reedholm has configured an integrated system, not just a set of boxes, for testing high power devices at the wafer level. Sophisticated testing, prober control, and database management do not carry a programming burden. As a result, fast, automated wafer testing is done in an inexpensive, compact probing platform.
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PP066 -
Teledyne LeCroy
The PP066 is a high-bandwidth passive probe designed for the use with the WaveMaster™ and other high-bandwidth oscilloscopes that have 50 Ω input termination. This very low capacitance probe provides an excellent solution for higher frequency applications, especially the probing of transmission lines with 20–100 Ω impedance.
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LCD 2424 -
Korima, Inc.
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
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I-prober 520 -
Aim-TTi
Current measurement from insulated probing of conductorSuitable for observation and measurement of current in PCB tracks, component leads and ground planesWide dynamic range of 10mA to 20A peak to peakWide bandwidth of DC to 5MHzLow noise figure equivalent to <6mA rms at full B/WSafety rated to 300V Cat II (600V Cat 1)Suitable for connection to any oscilloscopeHigh accuracy general purpose H-field probeConverts to 'closed magnetic circuit' current probe
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410130101 -
Virginia Panel Corporation
The i2 Micro iCon ITA is capable of holding up to 168 QuadraPaddle contacts. Its sleek, 0.8” footprint increases the horizontal stackability. The 30 degree U-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 0.77 in. The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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S-Probe -
PacketMicro Inc.
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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400SW -
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.