Wide Band Gap Production System

Reedholm has configured an integrated system, not just a set of boxes, for testing high power devices at the wafer level. Sophisticated testing, prober control, and database management do not carry a programming burden. As a result, fast, automated wafer testing is done in an inexpensive, compact probing platform.

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Topics

Wide Band
Systems
Band
Test Systems
Wafer Level
Wafer Probers
Wafer Probing
Control Systems
Device Programmers
Power Management