Showing results: 121 - 135 of 199 items found.
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Emergent Electro-Mechanical
Emergent Electro-Mechanical designs and manufactures customized test fixtures and burn-in racks. Each of our custom designs is unique to our customer's particular project requirements. Emergent fixtures feature innovative design components including a linear collapsing system, interchangeable and reusable plate design, and top and bottom probing.
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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VEGA Series -
MPI Photonics Automation
MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets. MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force.
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85024A -
Keysight Technologies
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Direct Dock -
SV Probe, Inc.
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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TK9LIN50 -
Techna-Tool Inc.
BK Mikro Linear is based on the existing design concepts for tool, object and free space monitoring and is modified to utilize a rack and pinion probe instead of a wand. This system monitors a specific distance or depth with longitudinal scanning. This is especially useful in cases where rotary scanning is inappropriateorimpossible. Some examples would be cavities, blind or through holes and places where space is limited. It can also be used to verify a part is in place during assembly or that the proper part is on the machine by probing a specific feature.
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410130104 -
Virginia Panel Corporation
The i2 Micro iCon ITA is capable of holding up to 120 QuadraPaddle contacts and up to 12 Micro Power or Micro Coax contacts. Its sleek, 0.8” footprint increases the horizontal stackability. The 30 degree U-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 0.77 in. The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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142 -
Electronic Specialties Inc.
#142 Pro Test Lead Kit includes our premium set of interchangeable specialty test probes designed for automotive use. This lead set features an extended length of 64 inches. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. In addition, the large Crocodile Clips are good for clipping to grounds and battery terminals. Includes roll up storage pouch to keep your leads organized. These are compatible with most DMM’s and scopes.
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SPS 2600, SPS 2800, and SPS 12000 Series -
MicroXact, Inc.
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Teledyne LeCroy
Teledyne LeCroy has a wide variety of world class probes and amplifiers to complement its product line. From the ZS high impedance active probes to the WaveLink differential probing system which offers bandwidths up to 25 GHz, Teledyne LeCroy probes and probe accessories provide optimum mechanical connections for signal measurement.
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SemiProbe
SemiProbe high frequency probing solutions provide a broad array of capabilities for measurements ranging from DC to over 300 GHz. We design PS4L systems for high frequency applications with carefully selected components including chucks, probe arms, probes, cables, tuner modules, and calibration suites that are optimized for the frequency range that the application will operate in.
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TDP Blade Probe -
PacketMicro Inc.
The TDP Blade Probe enables fast and convenient TDR measurements and debugging. The BladeProbe tips are made from strong and rigid beryllium copper blades for handheld and probe station probing. The passive probe can be used to measure impedance, clock jitters, and skews. The TDP BladeProbe series can be connected to TDR, high performance scopes, and vector network analyzers.
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T-4 Series -
Picoprobe
T-4 tips are for use in most standard commercial micropositioners for probing integrated circuits, pads, or lines. Each T-4 tip uses the same 10, 22, 35, 60, or 125 micron diameter tungsten wire as our Model 12C Picoprobe, but is mounted to a 0.020 inch diameter, 2 inch long tinned copper shaft.
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410130106 -
Virginia Panel Corporation
The i2 Micro iCon ITA with oversized cable clamp is capable of holding up to 168 QuadraPaddle contacts. With a wider 1.97” footprint, it is ideal for applications requiring shielded twisted pair wiring or other wire types with oversized jackets. The 30-degree u-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.80". The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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Pilot 4D V8 -
SEICA SpA
The Pilot 4D V8 represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance: the highest test speed, low to medium volume, test coverage and flexibility, for prototyping, manufacturing, or repairing any type of board. Its vertical architecture is the optimum solution for probing both sides of the UUT simultaneously.
