Probe Cards

U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.

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Probe Cards
Cards
Probes
Test Cards
Test Probes
IC Probes
IC Test
RF Probes
Spring Probes
Memory Device