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Product
MFFT (Minimum Film Forming Temperature)
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An instrument for measuring the MFFT point of a latex or emulsion
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Product
Punched Wet Film Combs (Aluminium)
112AL
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The Elcometer 112AL, being punched from aluminium, is not as accurate as precision formed stainless steel wet film combs and has a shorter lifespan.
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Product
Film Thickness Measurement
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Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
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Water Vapor Transmission Rate Tester
(Electrolysis Method)
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Shandong Drick Instruments Co., Ltd.
DRK311 water vapor transmission rate tester (electrolytic method), the instrument is suitable for the determination of water vapor transmission rate of plastic films, composite films and other films and sheet materials. Through the measurement of water vapor transmission rate, the technical indicators of control and adjustment of packaging materials and other products can be achieved to meet the different needs of product applications.
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Product
Handheld Digital Thickness Gauges
HC-210
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Shenzhen Chuangxin Instruments Co., Ltd.
HC series of coating thickness gauge is a portable thickness gauge with eddy current thickness method and electromagnetic thickness method. It can be used to quickly and accurately measure the thickness of coating or cladding material without damaging it. As an essential instrument for professional material protection, this coating thickness gauge is widely used in manufacturing industry, metal processing industry, chemical industry and commodities inspection etc., both in the laboratory and in the engineering field. It can measure the thickness of nonmagnetic layer on magnetic metal substrate condition (such as steel, iron, alloy and hard magnetic steel, etc.) and the thickness of conductive layer on nonmagnetic metal substrate condition (such as rubber, paint, plastic, anodic oxidation film, etc.).
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Laser Scanning Oil Film Detector
LO-300
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LO-300 provides early warning by on-line detection of oil leakage with a laser and a security camera (option)LO-300 uses a laser to scan water surface or the ground to detect an oil film with high sensitivity.LO-300 with camera unit (option) enables to record the video when LO-300 detects the alarm and stores the image captured before and after alarm signal.
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Product
X-Ray Fluorescence Analyzer
MESA-50K
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In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
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Soil Heat Flux Sensors
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Soil heat flux sensors may consist of several thermocouples whose measurements are averaged, a single thermopile, or a single thermopile with a film heater. These sensors measure the rate of energy transferred through a surface. Data regarding the amount of energy stored in soil as a function of time is used in energy-balance and Bowen-ratio flux systems.
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Film and Paper Thickness Gauges
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Economical, Accurate, Easy-to-Operate, our line of off-line paper / film thickness gauges are manufactured to meet TAPPI specifications for paper or ASTM specifications for film.
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Film Impact Tester
QT-FIT-3J
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The impact resistance of films is obtained by measuring the energy consumed by hemispheric impact head to make films rupture under controlled impact conditions to evaluate the impact resistance of material and its effects.
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Optical Thin-Film Metrology for Advanced Thin Films
FilmTek 6000 PAR-SE
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Scientific Computing International
Production-proven metrology system for film thickness, refractive index and stress measurement for a broad range of film layers at the 1x nm design node and beyond. Accommodates 200 or 300 mm wafer metrology. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to meet the challenging demands associated with multi-patterning and other leading-edge device fabrication techniques.
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Thickness Gauges for Plastic films & Paper
CHY-CA
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CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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FWDM Module
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Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
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Product
Anti-Surge High Power Thick Film Chip Resistors
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Panasonic Industrial Devices Sales Company of America
Anti-Surge High Power Thick Film Chip Resistors by Panasonic
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Product
ALD For Research & Development
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Veeco’s atomic layer deposition research systems are designed by ALD scientists and built for maximum experimental flexibility and value. With universal precursor delivery systems, you can use solid, liquid or gas chemistries in any precursor port. There are many options to choose from including ozone generators, in-situ monitoring and various configurations. As always, our team of ALD scientists are ready to answer your recipe development and film characterization questions. Over 2500 published academic papers feature research performed on our Savannah® thermal ALD system and Fiji® plasma ALD system.
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Deadweight Testers
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AMETEK Sensors, Test & Calibration
We provide the world’s only ball-type deadweight testers, where the ball and weights float on a thin film of air, which is virtually frictionless. This design eliminates the necessity to rotate the weights during testing, and allows the user to concentrate on the instrument itself. Our testers are engineered to offer user-friendly, safe operation, in the field, or in a lab. Both pneumatic and hydraulic testers are available.
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Lasting Adhesive Tester
ADT-02
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Jinan Leading Instruments Co., Ltd.
ADT-02 Lasting Adhesive Tester isapplicable in the lasting adhesive testing of pressure sensitive adhesivetapes, adhesive bandage(plaster), adhesive labels and protective films, etc.
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Thickness Gauges
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Precision Thickness Gauge is specifically designed to quickly and accurately measure the thickness of a variety of substrates including film, paper, board, foil, tissue and textiles.Operated via an intuitive touch screen interface the instrument will allow the user to define batch size, dwell time & measuring speed.Full test statistics can be easily viewed or printed to label for easy documentation control.
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Non-contact Film Thickness Measurement
ALTO-IRT-7000
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ALTO-IRT-7000 (IMPEDANCE RESONANCE TECHNOLOGY ) FILM THICKNESS METROLOGY TOOL UTILIZES NON-CONTACT CAPACITIVE AND EDDY CURRENT TECHNOLOGY TO ANALYZE MICRO SECTORS ON COATED SURFACES THAT ARE 1000 TIMES SMALLER THAN ANY COMPARABLE EDDY CURRENT PRODUCTS. BUT MOST IMPORTANTLY, THIS UNIQUE IRT TECHNOLOGY ALLOWS FOR SOPHISTICATED ANALYSES OF THE CONTINUOUS AND DISCRETE FILMS BELOW 50 ANGSTROMS, DRAMATICALLY IMPROVING THE ACCURACY OF QUALITY CONTROL READINGS.
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RFoG 4-Band Multiplexer. 1550, 1610 & 1310/1490nm MWDM
WD5643
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Hangzhou Huatai Optic Tech. Co., Ltd.
WD5643 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
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Thin Film Analyser
TFA
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The TFA instrument has be designed to monitor dissolution rates with a minimal volume of developer, typically ≤ 1 ml. The design uses surface tension to hold the developer in a small gap between the sample and the detector head. The instrument allows multiple measurements on the same sample. Thickness measurement can be made in the same geometry as dissolution measurements.
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Continuity of Insulation Tester (Low Voltage Method)
DYQ-005
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Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.5-2008/IEC60851-5;Inspection standard: JB/T4279.12-2008Used to test the film continuity (namely the pinhole number of enamelled wire sample per unit length) of enameled round wires with nominal conductor diameter of0.050mmand below;The application of advanced SCM control allows for faster operation and stronger anti-interference capacity.
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Cross Sections and Metallography
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Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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Moisture Permeability Tester
DRK501F
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Shandong Drick Instruments Co., Ltd.
The principle of moisture permeable cup weighing method is to measure the transmittance of water vapor to film, sheet, paper and other materials by weighing the weight of moisture permeable cup.
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Horizontal Tensile Tester
BLD-200H
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BLD-200H Horizontal Tensile Tester can be used for peeling, stripping and other performance tests of adhesives, adhesive tapes, pressure-sensitive tapes, medical adhesive bandages, protection films, release paper, laminated films, leather, woven bags and paper.
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Film Shrink Tester
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The Hanatek FST Film Shrink Tester is used to measure the effect of temperature on plastic films. The application of heat causes certain plastic films to rapidly contract; this effect can be used to seal and pack many items from food to consumer goods. The shrink effect is due to internal forces locked into the film during manufacture being released by heating, it is also known as linear thermal shrink or free shrink. The amount of shrinkage is dependent on the film type, thickness and sealing temperature. Testing the percentage shrink of a film ensures that it is suitable for a particular packaging application and establishes the correct temperature for that application.
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C-Band / L-Band MWDM
WD1615/C, WD1516/L
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Hangzhou Huatai Optic Tech. Co., Ltd.
WD1615/C, WD1516/L WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to EDFA and DWDM network to achieve the combination and separation of C-Band and L-Band.
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Variable Attenuator
VAXE
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The VAXE Variable Attenuators are waveguide components for tunable signal leveling or reflection compensation in waveguide networks. The Attenuators consist of waveguide section with a resistive film evaporated on the mica surface. The Attenuators has 0 ÷30 dB minimum attenuation range. The VAXE Attenuators are available in four waveguide bands between 33 GHz and 170 GHz.
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Thin Film SPY Inspection w/ Built In Jeep Meter
780
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For thin film coatings the easy-carry and easy to handle SPY Model 780 speeds inspection time with its built in Jeep meter and various other time saving and comfort features.
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PLD/PED Components
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Neocera offers a variety of components that can be fitted and combined into new or existing PLD and PED systems to provide improved functionality and enhanced capability. Components include:*Oxygen-compatible substrate heaters for epitaxial oxide film depositions..*Automated Target Carousels for preparing multilayer heterostructures.*Deposition chambers design specifically for PLD and PED systems.*Manual and automated laser window-change Accessories.*Pulsed Electron Deposition (PED) sources for laser transparent materials.*Ideal for retrofitting existing systems or construction of new systems.
