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Product
Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
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*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Product
Haze Meter
HAM-02
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Jinan Leading Instruments Co., Ltd.
HAM-02 Haze Meter is a kind of small hazer meter designed according to ASTMD1003—61(1997). It is applying to test the light transmittance,transmission haze, and reflection haze, reflectivity of transparent and semitransparent parallel level material and plasticfilms. Also it is suitable for liquid samples (water, beverage, pharmacy,colored liquid, grease) turbidity measurement. It is the basic instrument for plastic, glass products, all kinds oftransparent packaging films, colored and colorless of organic glass andaerospace, automotive glass and photographic film.
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Product
Spectroscopic Ellipsometer
PH-SE
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The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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Product
PLD/PED Components
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Neocera offers a variety of components that can be fitted and combined into new or existing PLD and PED systems to provide improved functionality and enhanced capability. Components include:*Oxygen-compatible substrate heaters for epitaxial oxide film depositions..*Automated Target Carousels for preparing multilayer heterostructures.*Deposition chambers design specifically for PLD and PED systems.*Manual and automated laser window-change Accessories.*Pulsed Electron Deposition (PED) sources for laser transparent materials.*Ideal for retrofitting existing systems or construction of new systems.
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Product
Water Vapor Permeability Tester
WPT-304
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WPT-304 Water Vapor Permeability Tester is manufactured based on the gravimetric method and is applicable to test the water vapor transmission rate of plastic films, composite films, sheets, and other materials used in packaging, medical and constructive industry.
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Product
Affordable EDXRF Analyzers
NEX QC Series
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Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Product
Vibrating Sample Magnetometer
VSM-P2H
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This is low magnetic field type of exclusive use for soft thin film sample by the use of Helmholtz Coil.The type is capable of measuring variations of temperature from -50°C to 200°C by adding gas-flow type of temperature controller as an option.
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Product
SINE M-5 Sinusoidal Array
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The Sinusoidal Array SINE M-5 is made on a strip of 70mm film approximately 5.12 inches (130mm) in length.The upper row contains the sinusoidal areas with the spatial frequencies in cycles per mm. All sinusoidal areas are carefully oriented with respect to the others, and the lines at the left end of the array have been added for alignment purposes.
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Product
Polarization Maintaining Band Pass Filter
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Zhongke Rayzer Optical Technology Co.,Ltd
Selects the thin film filter withgood performance to ensure the high quality opticalperformance, stability and reliability. It is uses to shieldnoise signal in EDFA and fiber laser system. It has thecharacteristics of high isolation, low insertion loss, highreturn loss and high power.
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Product
DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
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Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Product
Tearing Tester
TGT-01
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Jinan Leading Instruments Co., Ltd.
TGT-01 Tearing Tester is applicable in thetearing test of films, sheets, flexible PVC, PVDC, waterproof films, wovenmaterials, polypropylene, polyester, paper, cardboard, textile and non-woven,etc.
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Product
High Temperature Absolute Pressure Transducers
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Our high temperature Baratron® capacitance manometers are controlled to temperatures of 150°C or higher for use use in demanding semiconductor manufacturing vacuum processes such as metal etching and nitride film chemical vapor deposition (CVD).
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Product
Microwave Dielectric Measurement Systems
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This system enables fast and non-destructive measurements of materials having various shapes, including thin films. Enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator.
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Product
SINE (Sinusoidal) Targets & Arrays
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Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm, while the transmission film arrays are offered in various sizes up to 256 cycles per mm. In addition, the sinusoidal arrays are available in a Single Frequency Grating or with Multi-Frequency Gratings. If instead of continuous sinusoidal frequency, you are looking for a square wave frequency design, then look to the Ronchi Gratings page. Should you need to alter the size of the pattern or the substrate, fill out our Custom Test Targets and Charts form and start the conversation.
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Product
Film Application & Test Charts
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For numerous products, such as paint, ink, varnishes, glue and cosmetics, the reliability of many laboratory tests is directly related to the quality and consistency of the samples. Any measurements made on coatings for the purpose of describing their physical properties (drying time, elasticity, abrasion, gloss, colour, shade, etc.) are made on the basis of uniform and comparable samples with precisely controlled thickness.
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Product
Stand-Alone Models
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A self-contained metrology system's ability to measure film properties using intrinsic hardware and software algorithms, often without needing extensive prior knowledge of the sample or connectivity to external process control systems for initial data analysis.
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Product
Reflectance Standards
STAN Series
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Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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Product
Anti-Fogging Progerty Tester
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Shijiazhuang Zhongshi Testing Machine Co., Ltd.
The instrument is used for testing anti-fogging property of the soft PVC Calendar stenter film. It is the ideal testing equipment for science research department, universities, commodity inspection, laboratory, graduate school and quality supervision departments.
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Product
10-GHz Split Cylinder Resonator
85072A
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The Keysight 85072A 10-GHz split cylinder resonator measures permittivity and loss tangent of thin film, un-clad substrates and low loss sheet materials according to the IPC TM-650 2.5.5.13 test method. Designed for robustness and ease of use, it features precision cylinders to ensure high Q factor and loss tangent resolution. Compatible with the Keysight 85071E-300 materials measurement software, the 85072A and can be purchased separately or as part of a complete turn-key solution.
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Product
Glossmeter
DRK8681
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Shandong Drick Instruments Co., Ltd.
As the instrument is equivalent to international standards ISO 2813 "Nonmetallic coating film 20 °, 60 °, 85 specular gloss measurements." so a larger scope. It applies to all use of paintand coatings industry, such as furniture, paint, appliances, but also for plastics, packaging and decoration.
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Product
Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
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The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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Product
Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
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Product
Elcometer Bresle Patches
135B
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Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Product
Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
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Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
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Product
ALD Knowledge Center
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As one of the first companies to market with a flexible commercially available atomic layer deposition system (ALD), we have a tremendous ALD Knowledge Center for researchers to draw upon. We have gathered together a wide range of information about ALD applications and thin films technology. This includes images and explanations of the exciting uses for ALD. We also gather and provide access to theses on the subject and a searchable database of scientific abstracts.
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Product
POLARIZATION CAMERAS
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Conventional high-speed cameras have been utilized for nearly eighty years and are widely accepted worldwide through continuous technological development to visualize fast occurring phenomena. In recent years, demand for using polarization in structural dynamics and high-speed object detection has been increased due to the advancement of robotics, clear film production and new materials testing technologies. On the other hand, traditional high-speed cameras lack any polarization sensitivity.
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Product
Falling Dart Impact Tester
DRK135A
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Shandong Drick Instruments Co., Ltd.
DRK135A Falling Dart Impact Tester is applicable in the impact result and energy measurement of the falling dart from a certain height against plastic films and sheets with thickness less than 1mm, which would result in 50% tested specimen failure.
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Product
Infiniium Oscilloscopes
Z‑Series
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The Infiniium Z-Series delivers this and more with its RealEdge technology enabling 63 GHz of oscilloscope bandwidth and superior signal integrity. The Z-Series takes advantage of indium phosphide chip technology and custom thin film packaging to give you extremely low noise, low jitter, and high effective number of bits. These technologies allow you to see the true representation of your signal.
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Product
Guardian HD Web Profiling Series
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Accurate moisture, coat weight and film thickness profile measurement for process control in paper and film converting applications.
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Product
Audio Line Drivers and Receivers
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Analog Devices audio line driver and receiver solutions feature differential-output buffer amplifiers and differential input buffer amplifiers to support a wide range of applications. By using low noise thermally matched thin film resistors and high slew rate amplifiers, these parts maintain the sonic quality of audio systems by eliminating power line hum, RF interference, voltage drops, and other externally generated noise commonly encountered with long audio cable runs. Applications involving this product portfolio include ADC drivers, high performance audio, sine/cosine encoders, and other professional and consumer uses.
