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Product
Radio Test Set
CMA180
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With its frequency range from 100 kHz to 3 GHz, the R&S®CMA180 is ideal for testing all common analog and digital radio systems. Input levels up to 150 W are no problem for the R&S®CMA180. The flexible internal switching capabilities for the audio and RF paths make the R&S®CMA180 suitable for a wide range of test requirements. Users can configure the internal generators, external audio sources, filters and measurements according to the given application. In the predefined test scenarios for receiver, transmitter and duplex tests, the RF and audio paths are preconfigured. This saves time and eliminates configuration errors for standard test cases.
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Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
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Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
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The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
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The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
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The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Mobile, Hardened Test Set
MBX1
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With the MBX1 platform and our software, you can easily test SCADA and substation automation systems (SAS) in a highly secure way. The mobile solution allows you to perform quick assessments and temporary monitoring, e.g. during commissioning.
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Product
Loss Test Sets
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These instruments combine up to 6 sources, a power meter & optional VFL in one unit.
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Product
Tactical Radio Test Set
CTS-6100
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The CTS-6100 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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Product
Component Test Systems
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These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Environmental Control System Test Platform
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The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Product
Multifunction Substation Test Set
STS 5000
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STS 5000 is a multifunction substation maintenance & commissioning test system for current, voltage and power transformers designed to perform primary tests requested in substations commissioning. It allows to perform accurate tests on CTs, VTs, PTs and ground grid.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
RAMP TEST SET
AN/USM-719
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Tel-Instrument Electronics Corp.
Based on entirely new up-to-date technology and digital architecture; the AN/USM-719 large 4.75" x 3.5" in. color LCD screen and surrounding soft-keys and keyboard provides easy and quick access to a multiple of test screens menus, and display options affording single man operation, instant results, and a host of pre-programmed and manually variable parameters to meet the most demanding requirement's for testing of advabced airborne avionic and transponder/interrogator systems.
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Product
Protection Relay Test Set
PW41i
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PW41i is designed with 3 currents (3*40A) and 4 voltages (4*300V). The local software system with many relay testing modules is designed based on Windows system, which is easy and convenient for operation and upgrade.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
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The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
Automatic Relay Test Set
DRTS 64
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DRTS 64 is the most powerful diagnostic test set designed to perform accurate tests on protection relays, transducers, energy and power quality meters. This advanced test equipment is also thought to satisfy all the needs related to commissioning and substation maintenance. 6 Current and 4 Voltage generators simultaneously available.
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Product
NI's Electrical Functional Test Solution
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PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
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The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
Adjustable Test Stab Set
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The ETI adjustable test stab set may be used with your high-current circuit breaker testers to maximize efficiency and convenience for testing multiple breakers. Our stab system allows your technicians to test breakers in-place and avoid jacking breakers up or down for testing. By combining mobility and flexibility into one simple system, this stab set is a proven improvement over conventional designs. The components in the adjustable stab set are made of 120 pounds of 110 copper.
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Product
Radar Altimeter Test Set
Core Technology
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Eastern OptX core technology enables the conversion of microwave signals to optical signals (E/O), time delaying this signal then reconverting the light back to original microwave signal (O/E) with superior fidelity over traditional time delay methods. Products include Radar Target Simulation, Radar Altimeter Testing, Channel Simulation (Air Interface) and Multipath Creation.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Test Sets For Transformer Industries
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Contemporary Test Sets For Transformer Industries are developed to recognize the potentially disastrous current transformer errors. They prevent the primary current from overpowering insulation and short circuits. They are used for developing a testing and maintenance plan for addressing the errors before any failure to save money and time. With these powerful test sets, they are sure to perform saturation testing to test the knee point of a signal by comparing primary and secondary windings.
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Product
Relay Test Set Type SP-I
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Supreme Instrument Laboratories
Supreme make relay testing set is designed for site testing of protective relays which simulate in common fault conditions under which a protective relay will be called into positive function. Periodic field testing is the best way of ensuring the integrity of the protective relays. We offer our relay testing set with specific testing capacity to suit different group of protective relays. The testing set operates on single phase 230 V, A.C. 50Hz. Supply.
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Product
Test Set
TS® 22
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The TS22 Test Set’s unique built-in one-way amplified speaker provides three audio levels for hands-free listening and use with automated voice response systems. Multiple memories enable storage of nine 18 digit telephone numbers in repertory dialer (speed dialing) for easy access to test boards, the central office and other frequently called numbers. The last number redial feature eliminates the need to re-key your last entry. The TS22 Test Set offers an unbeatable combination of reliability, durability and expanded utility.
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Product
Air Data Test Sets
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For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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Product
Wireless Test Set Software
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Extend Keysight wireless test set capabilities with software products designed to streamline wireless measurements and automate testing for time consuming and complex measurement and analysis tasks. Software products are available for all wireless communications test set platforms - automating test for cellular mobile devices, WiMAX™, LTE, and Bluetooth®/WLAN devices.
