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Optical Transceivers
Based on Reflex Photonics technology, these rugged embedded transceivers offer bandwidth up to 300 Gbps in a chip-sized component. Designed for harsh environments including space, military, aerospace, and industrial applications, the transceivers provide high I/O density with low SWaP. Versions are available for mounting mid-board, front-panel, or on a VPX backplane (aligned with the SOSA™ technical standard).
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Confocal Microscopes
Our confocal microscopes for top-class biomedical research provide imaging precision for subcellular structures and dynamic processes.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Optical Testing
We place a great emphasis on our ability to test everything we produce and supply. This has provided the impetus for us to design and build comprehensive testing facilities that include standard as well as custom-made testing equipment.
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Soldering Inspection Video Microscope
MS-1000
The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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Active Optics
Radiall designs and manufactures end-to-end optical links for massive data transfers in harsh environments.
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Optical Transmitter
ST1015-3mW
Hangzhou Softel Optic Co., Ltd.
*Designed for FTTH(Fiber To The Home)Networks *Excellent Linearity and flatness *Single-mode fiber high return loss *Using GaAs amplifier active devices *Ultra low noise technology *Using DFB coaxial small package laser *Smaller size and easier install *Red-LED for power indication
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Inspection Microscope
This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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FTIR Microscopes & Imaging Systems
Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Optical Systems
Thorlabs' optics can be incorporated together to create packages with new functionalities. Some of the packages highlighted here range from beam expanders and collimators to interferometers and spectroscopy kits. Optical isolators, Pockels cells, and modulators are other examples.
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Optical Microscopy
Rocky Mountain Laboratories, Inc.
Optical microscopy from 1X to 1000X is achieved with a variety of microscopes. Images can be formed in bright field, dark field, and differential interference contrast (DIC or ‘Nomarski’) modes. Optical microscopy anlaysis is often used before any other techniques to document samples. Color and morphology are important clues in materials identification.
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Optical Calibration
PIMACS which acquired the Korean Laboratory Accreditation Scheme(KOLAS) provides calibration service for your developments & products with a wide range of light measurements, traceable to international standards. We also supply the various optical calibration systems to the customers who want to acquire the qualifications of an optical testing laboratory.
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Industrial Microscope Systems
Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Optical Multimeters
Optical Multimeter integrates both an optical power meter module and an optical light source module and can perform closed-loop tests by using both modules but work individually. It is specifically designed for technical support personnel to test a variety of instruments with a single meter and thus satisfy the user by providing a choice of greater convenience and more advantages.
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Atomic Force Microscope
AFM Heron
New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Cleanliness Inspection System / Microscope
CIX90
The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Acoustic Microscope
AMI D9650
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Optical Comparators
Starrett optical comparators provide a time tested, cost effective, solution for non-contact measurement. Optical comparators are used for an exceptionally wide range of dimensional inspection applications.
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Atomic Force Microscope
DriveAFM
The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
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Compact Inverted Microscope, 1mm Field Of View
Viewing transparent samples from below in a Petri dish, flask, well plate or cavity slide. The microscope is compact and can be put inside most incubators to view experiments without opening the door. Time-lapse images can be saved and viewed remotely.Ideal for use as a Bench Microscope in teaching applications.
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Optical tables
The primary goal of a well designed optical table is to eliminate relative motion between components of test system located on the surface of the optical table because such motion can generate measurement errors.
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Industrial Microscope Solutions
Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Optical Switches
This latest technology platform presents the best value in terms of size, form factor, durability, and cost. The design of our MEMS optical switch centers on DiCon's proprietary dual-axes tilting MEMS mirror and is expandable up to a 1x36 switch configuration. Large fan-out 1xN optical switches and non-blocking fan-out/fan-in NxM matrix optical switches are built by cascading multiple of these 1xN switches. The MEMS 1xN fiber optic switch passes the stringent Telcordia GR-1221 qualification and is vastly deployed in today’s optical communication networks. With a lifetime of over a billion cycles, the durability of this MEMS device makes it a perfect choice for optical network monitoring applications that require frequent switching.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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PXI Optical Switch
The PXI Optical Switch is available in many different switching configurations for customized optical switching. It offers both single-mode and multimode fiber options that can support switching of very small wavelength signals. The switch provides either SC/PC, FC/PC, SC/APC, or FC/APC fiber-optic connectors. You can use the PXI Optical Switch for repeatable, low-loss switching.
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Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
