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PICMG 2.11 47-Pin Hot-Swap Redundant 3U CompactPCI 8HP 250 W Power Module
cPS-H325/AC
- PICMG® 2.11 CompactPCI® Power Interface compliant- 3U CompactPCI® 8HP form factor- PICMG® 2.11 47-pin CompactPCI® in-rack power module interface- 250 W DC output
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Waveguide Power Sensor
R8486D
Excellent SWR for reducing mismatch uncertainty50 MHz calibration port Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 26.5 GHz to 40 GHz Diode power sensing element
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Power Monitor, AC- or DC-Powered
109
NAI’s 109 is an AC- or DC-Powered Power Monitor used to monitor voltage, frequency, and phase characteristics of single- or three- phase power lines. This allows normal operation of system loads when the power-line characteristics are within predetermined limits.The 109 monitor provides three separate control circuits and output relays indicating the condition of each line characteristic. It is ideally suited for rugged defense and industrial applications.
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Power, Patchcord, Receiver, 36", High Power, 2 AWG, Single -Ended (150 Amps)
7-221902000-036
Power, Patchcord, Receiver, 36", High Power, 2 AWG, Single -Ended (150 Amps).
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Power Module, 100V, 3A, 300W
N6776A
The Keysight N6776A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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High Power, Contact, ITA, 150 Amps, 2 AWG
610150101
Primary mating contact 610149101. (May mate with other Receiver contacts, as well.)Specifications Operating Current 150 Amp Continuous using 2 AWG wireContact Resistance 0.35 mOhmsOperating Voltage 600VDC or Peak ACContact Body Cu alloyIP Tip - ThermoplasticContact Plating 30µ" Au over 100µ" NiOperating Temperature -40°C to +125°CT-Rise +40°C at 150 Amps+30°C at 125 AmpsContact Termination CrimpCycle Life 10,000 CyclesRoHS Directive 2011/65/EU Status CompliantREACH Article 33 Status CompliantECHA Article 59 of Reach Regulation CompliantAVG Mating Force (lbs) 1.39
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Compact Functional Test System
E2230C / TS-5040
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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IOL & Power Cycling Test Systems
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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35 W Triple Output, 6V, 2.5A & 20V, 0.5A
E3630A
Keysight basic DC power supplies offer essential features for a tight budget. The multiple output, 35-50 W, E3620A and E3630A provide dual and triple outputs; small, compact size for bench use; low-noise and excellent regulation; and overload indicator to monitor output. The Keysight 35W, triple output E3630A has three versatile outputs for benchtop applications; and is offers stable and reliable power plus essential features for manual testing.
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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10 MHz To 50/53 GHz LAN Wide Dynamic Range Average Power Sensor
L2055XA
The Keysight L2055XA is a fast, accurate and wide dynamic range 10 MHz – 50/53 GHz LAN average power sensor.
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Mini Power, Receiver, 50u Gold (22 Amps). 18 AWG Twisted Pair Red/Black (5 Amps). Banana Plug Black, Banana Plug Red, 41"
7-242418000-041
Mini Power, Receiver, 50u Gold (22 Amps). 18 AWG Twisted Pair Red/Black (5 Amps). Banana Plug Black, Banana Plug Red, 41"
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60W Dual Output Power Supply, Two 8V, 3A or 20V, 1.5A
E3646A
Keysight basic DC power supplies offer essential features for a tight budget. The single & dual output, 30-100 W GPIB E3640 series provide small, compact size for bench and system use; low output ripple and noise; and built-in measurements and basic programmable features with GPIB and RS232 interface. The Keysight 54W, multiple output E3646A is a clean, reliable power supply for general purpose applications, and combine convenient benchtop capabilities with flexible system features in a compact, multi-output package.
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Power, Patchcord, ITA, 36", High Power, 2 AWG, Single Ended (150 Amps)
7-222902000-036
Power, Patchcord, ITA, 36", High Power, 2 AWG, Single Ended (150 Amps).
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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30W Power Supply, 35V, 0.8A or 60V, 0.5A
E3641A
Keysight basic DC power supplies offer essential features for a tight budget. The single & dual output, 30-100 W GPIB E3640 series provide small, compact size for bench and system use; low output ripple and noise; and built-in measurements and basic programmable features. The Keysight 30W, single output E3641A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
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Diode Power Sensor
8487D
Excellent SWR for reducing mismatch uncertainty Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 50 MHz to 50 GHzDiode power sensing element
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Bottom Electrode SMD Test Fixture
16197A
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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P-Series Wideband Power Sensor, 50 MHz to 40 GHz
N1922A
Peak, peak-to-average ratio, average power, rise time, fall time, maximum power, minimum power, and statistical data of wideband signals.
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Power, Patchcord, Receiver, 72", Micro Power, 14 AWG White, Single Ended ( 22 Amps)
7-252914000-072
Power, Patchcord, Receiver, 72", Micro Power, 14 AWG White, Single Ended ( 22 Amps).
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Power Sensor and SNS Noise Source Cable (1.5m / 5 feet)
11730A
The Keysight 11730 series power sensor cables are used with the 8480 and E-series power sensors (except the E9320 family of peak and average sensors). These cables are designed to reduce RFI effects on low power readings with an improved shielding design in the cable itself. Cables may be ordered individually or in pairs in any combination desired for single and dual-channel measurements.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Autoranging System DC Power Supply, 750 V, 20 A, 5000 W, 400 VAC
N8944A
The Keysight N8900 Series is a family of 5 kW, 10 kW, and 15 kW autoranging, single-output power supplies available in 14 different voltage, current, and power combinations and either 208 VAC or 400 VAC (28 total models).
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
