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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Ethernet POE & PHY Testing
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Networked Communication Solutions, LLC
A multi-port programmable load.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
EN50155 Managed Ethernet Switch
EKI-9528E-8GMX
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M12 connector with ruggedized IP54 certified housing, Complies with EN50155 and EN50121-3-2 standards, Wide nominal power input range: 24 ~ 110VDC. Operating power input range: 16.8 ~ 137.5VDC, X-Ring Pro delivers rapid and predictable convergence, Leverages IXM technology to ease maintenance.
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Product
Conformance Test System
TS-RRM
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The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
8FE PoE And 2G Combo Managed Ethernet Switch
EKI-7710E-2CP
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8 x IEEE 802.3 af/at PoE Fast Ethernet ports + 2 x Gigabit Copper/SFP combo ports, SFP socket for Easy and Flexible Fiber Expansion. Redundancy: Gigabit X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D) IXM function enables fast deployment.
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Ethernet Service Testing
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Artiza Networks offers compact Ethernet service testing devices for Carrier/Metro Ethernet service providers. The GEST-1K and XEST-1 are fast and lightweight, and don’t require a technician to install.
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Product
EN50155 Managed Ethernet Switch
EKI-9528E-8GMW
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M12 connector with ruggedized IP54 certified housing, Complies with EN50155 and EN50121-3-2 standards, Wide nominal power input range: 24 ~ 110VDC. Operating power input range: 16.8 ~ 137.5VDC, X-Ring Pro delivers rapid and predictable convergence.
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Product
8FE+2G Combo Managed Ethernet Switch
EKI-7710E-2C
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Certified to IEC 62443-4-2 SL2, 8 Fast Ethernet ports + 2 Gigabit Copper/SFP combo ports, Redundancy: Gigabit X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D).
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
16FE Managed Ethernet Switch Support Modbus/TCP, -40~75℃
EKI-5526I-MB
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16 ports Fast Ethernet RJ-45 (EKI-5526/I-MB)Entry-Level Managed SwitchIXM function enables fast deploymentManagement: SNMP v1/v2c/v3, WEB, Standard MIB, Private MIB
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Product
4GE+4G SFP Managed Ethernet Switch, -40~75℃
EKI-7708G-4FI
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4 Gigabit ports + 4 SFP ports, SFP socket for Easy and Flexible Fiber Expansion, Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D), IXM function enables fast deployment, Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption), RADIUS.
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Product
PXIe-8234, 2-Port Gigabit PXI Ethernet Interface Module
780244-01
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Vision Software Included, 2-Port Gigabit PXI Ethernet Interface Module—The PXIe-8234 with Vision Acquisition Software can acquire images from the fastest GigE Vision cameras. It transfers images at full Gigabit Ethernet bandwidth on both ports simultaneously, and it is optimized for extremely low CPU load. The PXIe-8234 with Vision Acquisition Software provides full GigE Vision bandwidth at every port, giving you the bandwidth you need for your most demanding vision applications. It also includes NI Vision Acquisition Software, which is driver software for acquiring, displaying, logging, and monitoring images from a multitude of camera types. With a set of easy-to-use functions and example programs, you can quickly create applications using LabVIEW, C, C++, C#, Visual Basic, and Visual Basic .NET.
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Product
PXI Ethernet Interface Module
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The PXI Ethernet Interface Module equips PXI systems with high-bandwidth Ethernet-based connectivity with up to 40 Gb/s data rates per port. Featuring compatibility with industry-standard network and automatic cable polarity detection, this module is ideal for high-performance data transfer and vision applications on the PXI platform. Additionally, the PXI Ethernet Interface Module has independent bandwidth to support up to four GigE Vision cameras without PoE.
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Product
Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
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Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
Mixed Signal Battery Test System
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The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
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Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
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The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
IoT Ethernet I/O Modules
ADAM-6000/6200
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Supporting Modbus & IoT protocols, Ethernet remote data acquisition modules offer analog, RTD, thermocouple, digital, relay and counter I/O.
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Product
8-Ports Gigabit Ethernet RCV Interface
YAV90058C
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8x RJ45 LAN connectors to VPC RCV 192 pins module
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Product
Ethernet Switches
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Choose Omega's industrial-grade Ethernet switches to facilitate reliable data transmission speeds. These switches can withstand extreme conditions.
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Product
Ethernet Cameras
HT Series
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Our cameras are available with resolutions of 2, 4, 12, and 20 megapixels in monochrome, color, or near-infrared enhanced (NIR) with full frame rates of up to 338fps, 179fps, 84fps, and 32fps respectively (we can also provide taped on glass). As the first 10GigE industrial digital camera series in the world, our HT cameras obtain their high performance from industrial CMOS sensors with Global Shutter technology in combination with the cross-industry standard 10 Gigabit Ethernet (10GigE) interface.
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Product
Ethernet
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The UNH-IOL has been providing Ethernet testing services since its inception in 1988. We have a strong and wide-reaching industry reputation and participate in many industry organizations including the IEEE, the Ethernet Alliance, and the OpenAlliance. We were honored to receive the IEEE-SA Corporate Member of the year award in 2013 for "unwavering contributions to interoperability testing of IEEE standards".
