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Semiconductor ATE Systems
Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Power Supply Systems
The Auxiliary Power Unit (APU) serves as a cost effective solution for a variety of military vehicle platforms including main battle tanks, self-propelled howitzers, tactical vehicles, and other special purpose armored fighting vehicles. Our family of heavy-duty, automotive APUs for military applications are packaged to meet specific installation requirements and are available as stand-alone units or may be integrated with any combination of life support systems. Each system provides the following capabilities:
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IR Radiation Systems And Systems
Irradiation systems with infrared are used in test applications when a high heat input to the test object is required. In our portfolio you will find a wide range of different designs and areas of application for IR systems. From simple radiation modules to highly complex radiation systems.
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Smart Vision System
VICORE
This versatile system offers excellent performance for inspection applications using traditional 2D imaging, thermal imaging, 3D imaging or a combination thereof. Its small, book style format consumes minimal cabinet space and provides convenient, front-accessible connections for cameras, I/O and system components. This includes a dedicated industrial Ethernet port that offers efficient communication with complementary factory devices using Ethernet/IP or Profinet.
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Transient EM System
TerraTEM24
The new generation terraTEM, the terraTEM24, has been designed to acquire high‑quality transient electromagnetic data from a wide variety of sensors ranging from remote inductive and B field sensors through to single loop and coincident loop configurations.
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Electroluminescence Test Systems
The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Turbine Logging System
This Turbine Overspeed Trip Logging system has been developed to check the operation of steam turbines. The speed of the turbine is monitored using an optical sensor, the logging system can be mounted up to 30 meters from the sensor. This allows the overspeed trip speed to be monitored and recorded with greater safety that using a simple tachometer. The results are logged together with time and date stamp so that it can be demonstrated that the test has been carried out.
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Chip Inspection System
GEN3000T
GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Laser Measurement Systems
Starrett-Bytewise offers laser-based measurement systems that are employed on the factory floor for quality monitoring, process control and inspection. We are a vertical technology company with in-house resources for designing sensors, systems and software. We deliver products through our own sales and service network. Starrett-Bytewise is based in Columbus Georgia, USA, with offices in Europe and China, and is supported by independent sales and service representatives around the world.
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Low-Tc Systems
With our long year experiences in SQUID electronics, SQUID sensors, and SQUID systems, we can offer exactly the system you need. No matter if you need a small 5 litres LHe dewar with just a single channel or a 100 litres multichannel system, we cooperate with excellent dewar manufacturers to guarantee the best possible performance for the overall system.
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Data Integration System
Our innovative AI data integration system will automatically do the mappingof your data in an automated way and integrate all types of global data toa harmonized global database so you can keep your existing data outputsand structures.
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Ferroelectric Test System
RT66B
Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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Process Analyzer System
Process
Process Analyzer System is a facility to measure necessary parameters such as hydrocarbons to help optimize the manufacturing process. The analyzer is chosen so that it best meets the customer requirements.
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Precision Laboratory Systems
With accuracy and reliability, our products set standards in the laboratory technology market.
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Acoustic Emission System
Pocket AE-2
The Pocket AE-2 is a high performance, computerized, dual-channel Acoustic Emission (AE) system which is packed in a robust, portable handheld unit optimal for field use. The Pocket AE-2 offers all the performance, capabilities and features of larger, more expensive MISTRAS’ AE system (wide bandwidth, speed, AE features, sampling rates, waveform processing, audible AE) in a compact, battery-operated package.
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Transient EM System
terraTEM
The terraTEM is a robust transient electromagnetic (TEM) survey system which provides high resolution conductivity imaging. Applications for the terraTEM include mineral exploration, near surface applications including geotechnical and engineering investigations, groundwater and salinity studies, and environmental surveys.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Blackbody System
IR-574/301
Infrared Systems Development Corp.
The IR-574 Series blackbody reference sources are designed to provide infrared radiation as an ideal blackbody emitter. The output energy from the 2.25" Cavity closely follows the theoretical maximum energy curve described by Max Planck's equation, and allow users to calibrate, align, and measure infrared devices and phenoma of all types.
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Modular Recording System
Modular and flexible solutions that don't sacrifice speed are the future of high-speed data acquisition technology. That's why Conduant developed a modular recording platform—so you can have the best of both worlds.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Sampling Systems And Accessories
Parker's selection of sampling systems and accessories features fuel-drip bunker samplers; mini-sample cylinder valves; ultral-seal constant pressure cylinders for gas or liquid applications; single-flow, dual-flow and hot-tap probes; spun end sample cylinders for sample transportation; heated-enclosure systems for use with natural gas samplers; and composite gas samplers, among other solutions.
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3.4 MP GMSL Camera (supports Upto 15 Meters)
NileCAM30_TX2
NileCAM30_TX2 is the four board solution containing the camera module, serializer, deserializer and TX2 base board. This camera is based on AR0330 CMOS image sensor from ON Semiconductor®. The NileCAM30_TX2 comes with 3 meters or 15 meters coaxial cable with FAKRA connector at both ends of serializer/deserializer board. The NileCAM30_TX2 has an S-mount (M12) lens holder which allows customers to choose and use the lens according to their application requirement.
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System Integration
More and more customers want integrated systems in which the devices are supplemented with additional components and delivered turnkey. ET System electronic offers all services for this system integration from a single source. The sources and electronic loads are fully wired according to customer requirements, installed in 19 "cabinets and equipped with special features. For example, sources and loads can be combined with one another and supplemented with special interfaces or emergency stop functions. The integration of insulation monitors, interlock functions and the installation of industrial PCs is also possible, as is the installation of special safeguards, for example if each channel is to be safeguarded separately in multi-channel devices.The respective configuration can be based on any machine guidelines and standards, and the systems can be integrated into any existing environment with additional connections. On request, space and connection options for additional devices can be provided in the 19 “cabinets so that customers can easily integrate their own components.
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ZETVIEW SCADA System
ZETVIEW SCADA serves as a system for collecting and processing data from devices connected to the PC (FFT spectrum analyzers, ADC and DAC boards, multimeters). The SCADA system is also designed for process management automation.
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Telos Systems
Telos Systems—part of the Telos Alliance—was founded in 1985 by Steve Church, a talk show radio host and engineer who was dissatisfied with the poor quality of the on-air telephone calls on his shows. He was also an Engineer determined to do something about it. The resulting Telos 10 telephone interface system was a great success, inspiring Steve to build a business to make and sell the systems. Telos Systems has since become the industry leader in broadcast telephone systems and IP and ISDN codecs. The breakthrough Telos Zephyr audio codec, for example, is one of the most successful digital broadcast products in history, with more than 21,000 in use worldwide. Telos telephone hybrids and on-air talk show systems set the performance benchmark for the industry, and we continue to pioneer groundbreaking technology that pushes boundaries and gives broadcasters the telephony solutions they need for reliability, efficiency, and the best possible sound quality.
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Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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IR Inspection System
EVG®20
The EVG 20 offers a fast inspection method, especially for fusion bonded wafers. A live imageof the entire wafer via IR transmission supports void detection down to a radius of 0.5 mm. The infrared inspection system is a perfect match for fusion bonding processes either as the stand-alone EVG 20 tool or as a station in EVG''s integrated bonding systems.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
