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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
96-Pin SCSI Micro-D Discrete Wire
40-962-096-F
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This connector is designed to allow users to terminate discrete wires with IDC connections to the 96-Pin SCSI Style Micro-D connector. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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Product
6TL10 Table Top Test Base
H71001000
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Digital Functional Test
CTS100i
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Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
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Product
96-Pin Micro-D Connector Block, Female With Backshell
44-965-096-F
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This connector block provides a simple method of connecting to high density 96-Pin SCSI Style Micro-D BRIC connectors. The screw terminals accept wires up to 20 AWG and use a rising cage screw clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Regenerative Battery Pack Test System
17040
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Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
Memory Test System
T5511
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Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
FADEC/EEC Test Platform
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The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
200-Pin LFH Connector, Female, M3 Female Screwlocks, With Backshell
40-961A-200-M3-F
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This connector is designed to allow users to directly terminate with soldered connections to the 200 pin LFH connector.
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Product
Connector, 104-Pin D-Type Male, PCB Mount, Right Angle, 4-40 UNC
40-963-104-RM
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This 104-pin male D-type connector allows users to create their own connection solutions. Right angled PCB mounting - supplied with 4-40 UNC screwlocks. This connector is not suitable for direct connection to Pickering modules that use the 104-pin D-type connector.
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Product
SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
PCI Express 3.0 Test Platform with SMBus Support
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The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
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This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
Advanced SoC/Analog Test System
3650-EX
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Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
96-Pin Micro-D Connector Block, Male With Screwlocks
44-965-096-M
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This connector block provides a simple method of connecting to high density 96-Pin SCSI Style Micro-D connectors. The screw terminals accept wires up to 20 AWG and use a rising cage screw clamp mechanism to minimize risk of copper strand breakage. The metal shell includes an internal insulation barrier under the carrier board.
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Product
SCB-12, Nano-Pitch Connector Block, 8 SE DIO, 1 QSFP+
787419-01
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8-Pin 3.5 mm Pitch Connector to Nano-Pitch I/O, QSFP28 Terminal Block - The SCB-12 converts the Nano-Pitch connector to the industry-standard QSFP28 connector for interfacing I/O signals to plug-in data acquisition. This Terminal Block features the QSFP28 variant of the quad small form-factor pluggable (QSFP) transceiver for high-capacity data communication. The SCB-12 combines with shield cables to provide low-noise signal termination. Additionally, the SCB-12 supports the Nano-Pitch I/O Interconnect System that provides data transfer at 24 Gbps per lane and compatibility with PCI Express, Serial Attached SCSI (SAS), and SATA protocols. The SCB-12 breaks out the NanoPitch connector to a QSFP28 connector as well as an 8-pin connector for general-purpose DIO signals.
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Product
Test Fixture
N1295A
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The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Scienlab Combined Battery Test Solution
SL1133A
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Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
Flight Control System Test Platform
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The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
50-Pin D-Type Connector, Right Angle PCB
40-963-050-RF
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Accessory allows a user to create their own PCB based termination solution mounted directly on the front of the product or on the end of a cable. Interfacing PCBs should be designed with suitable clearances for the voltage the application requires.
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Product
PCIe 5.0 Test Platform
PXP-500A
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The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
Test Connectors
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A wide range of standard test Connectors that can fit many of your applications and services. We offer a ideal solution for your testing needs in automatic or manual mode.
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Product
160-Pin DIN41612 Connector, Straight PCB Mount, Male
40-963-160-SM
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Accessory allows a user to create their own PCB based termination solution. This male connector is modified to enable it to be fitted to Pickering's 160-pin cable assemblies
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
SMD Test Fixture
16034G
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Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
