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Product
Gunn Diodes
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The Gunn diode is the best known and most readily available device in the family of transferred electron devices (TED). They are employed as DC to microwave converters using the negative resistance characteristics of bulk Gallium Arsenide (GaAs) and only require a standard, low impedance, constant voltage power supply, thereby eliminating complex circuitry. Teledyne Lincoln Microwave’s DC1200 series of GaAs Gunn diodes is designed for operation at fixed frequency (determined by the oscillator cavity) within a specified band under CW or pulsed conditions.
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Product
Radar Test System
UTP 5065
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Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
PIN Diodes
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The SemiGen SGP7000 series of PIN Diodes are processed with a high-resistivity epi that have intrinsic layers that range in thickness from 4 micron to 200 micron depending on performance specifications. These devices are typically manufactured with either a robust thermal-oxide passivation or ceramic glass for durable high-power applications. These diodes are made with a grown junction P++ layer that yields abrupt junction structures that provide low punch through voltages and minimize autodoping. They are available as chips or in your choice of packages.
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Product
6TL10 Table Top Test Base
H71001000
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Digital Functional Test
CTS100i
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Capable of performance testing to defined traceable standards, CTS100i is designed to test Military, Aerospace and Safety-Critical equipment. CTS100i is a cost-effective digital functional test system, available in single, dual and three bay versions.
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Product
Three-Path Diode
NRPxxS/SN/SN-V
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The R&S®NRPxxS/SN power sensors use three separate diode paths, each operated in the optimum detector range. As a result, the average power can be determined with high accuracy independent of the modulation type. Measurement results are hardly affected by interfering signals or harmonics.
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Product
Fast Recovery Diodes
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We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Regenerative Battery Pack Test System
17040
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Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
Memory Test System
T5511
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Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
Silicon Carbide Diodes
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In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Laser Diode Burn-In Testing
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Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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Product
FADEC/EEC Test Platform
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The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
SCR, Diodes & Assemblies
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SCR and Diodes are available as assemblies or discrete parts. Most assemblies are encapsulated. CEHCO stocks a variety of rectification products such as Diodes, SCR’s (silicon-controlled rectifiers), and Encapsulated Assemblies. We SCR and diodes replacement specialist. We specialize in obsolete and hard-to-find SCR and diode assemblies. We can offer an equivalent replacement for most obsolete rectification devices.
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Product
SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
PCI Express 3.0 Test Platform with SMBus Support
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The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Bypass Diode Thermal Test System
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King Design Industrial Co., Ltd.
* Power: the heating board control panel uses 220V single-phase power.* Power consumption: 1.0KVA, 1000W(Max)* Volt: 220VAC* Current: 4.5A* Heating board: one controller per board* Power rate: room temperature raise to 75°C± 5°C within one minute.* Heating board dimension: 500mm x 1,000mm* 6-sheet electrical heating boards test: used to test the 2,200mm x 2,600mm module. It can be customer-designed.* The length of board power cable and thermal sensor cable shall exceed 3,000mm.* To get uniform heating effect, the electrical board is sandwiched by 2mm aluminum sheets at both sides of board.
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Product
Steering Diodes
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ProTek's low capacitance Steering Diode Arrays provide high-speed data line and I/O port protection from transients caused by Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), Tertiary Lightning and other induced voltages. Steering diodes divert the transient to the power-bus or ground and away from sensitive IC components.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
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This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
High Voltage Diode Assemblies
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High voltage diode assemblies are built by adding diodes in series to yield a higher peak inverse voltage. For example, if each diode is rated for 1200 peak inverse voltage (PIV), then six diodes in series would have a total peak inverse voltage of 7200 PIV. The detailed circuit is shown below.
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Product
MOSFETs, MESFETs, and Schottky Diodes
Semiconductor Module
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The Semiconductor Module allows for detailed analysis of semiconductor device operation at the fundamental physics level. The module is based on the drift-diffusion equations, using isothermal or nonisothermal transport models. It is useful for simulating a range of practical devices including bipolar, metal semiconductor field-effect transistors (MESFETs), metal-oxide-semiconductor field-effect transistors (MOSFETs), Schottky diodes, thyristors, and P-N junctions.
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Product
Advanced SoC/Analog Test System
3650-EX
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Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Test Fixture
N1295A
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The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
SPDT PIN Diode Switches
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Fairview offers a comprehensive selection of 23 different models of SPDT PIN diode switches that cover frequencies ranging from 10 MHz to 67 GHz. The high isolation levels up to 80 dB ensure that unwanted signals will not leak into the desired signal path. Other critical performance features include low insertion loss as low as 1.1 dB and fast switching speed performance as low as 50 nanoseconds. Both absorptive and reflective designs are available and every model utilizes integrated TTL compatible high speed driver logic circuitry. These SPDT switches are constructed using MIL-Grade rugged coaxial packages and several models support field replaceable connectors. All models are EAR99.
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Product
Diode Lasers
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Offering diode lasers in a wide range of wavelengths, power, and package configurations. Providing optimum solutions for applications in laser pumping, materials processing, medical, defense, and instrumentation.
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Product
Laser Diode Drivers
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Renesas offers a portfolio of laser diode driver (LDD) ICs for DVD/CD/Blue-ray optical drive and laser projection applications.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
