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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
Scienlab Battery Test System — Cell Level
SL1002A
Test System
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40L-013
High Frequency Probe
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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Product
VLF Insulation Testing
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VLF testing uses very low frequencies as part of an AC cable maintenance routine. VLF testers are smaller and more practical than AC testers but output the same amount of power as a 50 Hz mains device. This combination of size and power makes Very Low Frequency cable testing perfect for testing longer sections of cable and apparatus
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
Test Module
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
Engine Test Systems
Dynas3
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Dynas3 Machines are specially suited for use in engine test stands. The AC machine, variable frequency drive with test stand controller and safety module are tuned to one another to form a system that has proven itself many times over. It can be used in any type of development and function test stand. The applications range from simple test stands for steady state operation up to sophisticated test stands for dynamic test cycles. Nearly every application in the field of engine testing can be performed on a test stand with DYNAS3.
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Product
Communications Test System for Frontline Diagnostics
CTS-2750
Test System
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Product
3-Slot Data Acquisition Mainframe With GPIB, Three 20-Channel Multiplexer Modules, And BenchVue DAQ Software
DAQ973MBX
Mainframe
The DAQ973MBX Best Multiplexer Bundle offer includes a DAQ973A three-slot data acquisition mainframe, three 20-channel DAQM901A multiplexer modules, and a BV0006B BenchVue DAQ software with a KeysightCare software support subscription. This bundle provides the following:3-slot mainframe with USB, LAN, and GPIB6.5-digit (22-bit) internal DMM60 channels of multiplexer switches6 channels of dedicated current measurements2-and 4-wire scanning300 V switching80 channels/s scanningbuilt-in thermocouple reference junctionbuilt-in signal conditioning measures thermocouples, RTDs and thermistors, AC / DC volts and current; resistance, frequency / period, diode test, and capacitance36-month node-lock BV0006B BenchVue DAQ software license with KeysightCare software support subscription
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Calibration
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Calibrations of electronic equipment is one of the activities that Kiwa Dare offers to its clients. these calibrations are under accreditation in the field of electrical quantities. Besides calibrations in the field of DC current, DC voltage and low frequency (test and measuring) equipment, Kiwa Dare is specialized in calibrating high frequency measuring equipment and in particular EMC equipment in a frequency range of (DC) 40 GHz. New the site validation calibrations whereby Kiwa Dare can calibrate shielded rooms (Faraday room) and anechoic chambers under accreditation.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
Instrument Transformer
CT & PT Test Equipment
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Measurements International Ltd.
Calibration of Voltage and Current Transformers from a Single Instrument, Calibration of Instrument Transformers with Different Rated Ratios Using One Single Reference Standard, Calibration of Voltage Transformers (VT) up to 800 kV When Used with MI 2500 Series of HV Dividers and Standard Capacitors, Calibration of Current Transformers (CT) Up to 10000 A When Used With MI 7020 and/or 7200 Series of Precision Current Transformers and/or Current Comparators, Test Frequency from 15 Hz to 100 Hz70.
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Product
LCR Meters
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Teledyne Test Tools range of high precision LCR meters offers three models with maximum test frequency ranging from 2 kHz to 300 kHz and basic accuracy of 0.05%. The T3LCR series provides a wide range of measurements while maintaining a compact size.
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Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
3-Slot Data Acquisition Mainframe With GPIB, Two 20-Channel Switch Modules, And One 20-Channel Multiplexer Module
DAQ973SB
Mainframe
The DAQ973SB Better Multiplexer Bundle offer includes a DAQ973A three-slot data acquisition mainframe, two 20-channel DAQM903A Actuator / GP switch modules, and one 20-channel DAQM901A multiplexer module. This bundle provides the following:3-slot mainframe with USB, LAN, and GPIB6.5-digit (22-bit) internal DMM60 channels of multiplexer switches6 channels of dedicated current measurements2- and 4-wire scanning300 V switching80 channels/s scanningbuilt-in thermocouple reference junction20-channel actuator / general-purpose switch with independent single-pole, double-throw (SPDT) relaysbuilt-in signal conditioning to measure thermocouples, RTDs and thermistors, AC / DC volts and current; resistance, frequency / period, diode test, and capacitance
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Product
350 MHz RF Frequency Counter, 10 digits/s
53210A
Frequency Counter
Single-channel, RF frequency counter One 350 MHz input channel, plus optional second channel (6 GHz or 15 GHz)10 digits/second resolution Built-in math analysis and color, graphical display (trend and histogram)LXI-C/LAN, USB, GPIB Optional: Lithium Ion Battery BenchVue software enabled: Do more with your PC and instrument together, no programming required. Easily control your counters, quickly build automated tests and log data for faster analysis and save precious time.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
