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Product
Software
SLICEWare
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Diversified Technical Systems, Inc.
SLICEWare is an intuitive set-up, control and data viewing software for SLICE NANO, SLICE MICRO, SLICE IP68 and SLICE PRO SIM hardware. Designed to provide fast, easy-to-use tools for data collection, SLICEWare is ideal for both small and large-scale tests. SLICEWare offers advanced features such as automatic sensor assignment, detailed channel diagnostics and real-time data display to support successful data collection every test.
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Product
SoC Test Systems
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Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
Conformance Test System
TS8980
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The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
16-CH 12/16-Bit 100 kS/s Low-Cost Multi-Function DAQ Cards
PCI-9111 Series
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ADLINK PCI-9111 series are 16-CH, 100 kS/s low cost multi-function DAQ card. The PCI-9111 series feature flexible configurations on analog inputs. A RC filter is implemented on each A/D input channel for user to attenuate or filter input signal. The PCI-9111 series provide analog inputs with 5 programmable input ranges for bipolar inputs. The PCI-9111 series also support automatic analog input scanning. PCI-9111DG provides 12-bit A/D resolution while PCI-9111HR provides 16-bit A/D resolution. The PCI-9111 series also feature 1-CH 12-bit analog output, 16-CH TTL digital inputs and 16-CH TTL digital outputs. ADLINK PCI-9111 series deliver cost-effective and reliable data acquisition capabilities, and is ideal for a broad variety of applications.
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Product
Test Board For QSFP28 Transceiver
EQSFP28
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The OPTELLENT EQSFP28 is a cost-effective and convenient test board for testing QSFP28 optical transceivers in R&D and manufacturing environments. The EQSFP28 is equipped with high quality RF connectors for data signals and test points for low frequency control and status signals. The EQSFP28 is equipped with power supplies to enable voltage margining. Key status signals are displayed using LED indicators.
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Product
Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
ESD Test System
58154 Series
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ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Combination Board Functional Test System
QT 4256 ATE
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Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
4-CH 24-Bit Universal Input USB DAQ Modules (OEM Version Available)
USB-2401
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The USB-2401 is a 24-bit, 4-channel simultaneous-sampling universal input USB DAQ modules featuring built-in signal conditioning circuitry, providing direct measurement of commonly used sensors including current output transducers, thermocouple, RTD, load cell, strain gauge, and others. Individual channels can be programmed to measure different signal types. The USB-powered USB-2401 is equipped with removable screw-down terminals for easy device connectivity, and the included multi-functional stand fully supports desktop, rail, or wall mounting.
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Product
PXI Data Acquisition
DAQ
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Installation and configuration is fast and easy with standard connectors, soft front panels and Keysight connection expert. In addition, software drivers support the most common programming environments such as Visual Studio®, C, C++, Visual Basic, MATLAB® and LabVIEW™.
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Product
16-Channel 250kSa/s USB Modular Multifunction Data Acquisition
U2351A
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The U2351A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2351A to simulate simultaneous analog input acquisition.
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Product
19” Rackmount Data Collection System
DCS-211
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- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Product
Test Board For SFP+ / SFP28 Transceiver
ESFP280
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The OPTELLENT ESFP280 is a cost-effective and convenient test board for testing SFP/SFP+/SFP28 optical transceivers in R&D and manufacturing environments. The ESFP280 is equipped with high quality RF connectors for data signals and test points for low frequency control and status signals. The ESFP280 is equipped with power supplies to enable voltage margining. Key status signals are displayed using LED indicators.
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Automatic Capacitance and Tan Delta Bridge
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*Automatic Microprocessor controlled Guarded Bridge Circuit.*Suitable for testing at voltages up to 500kV.*Can be used to measure both Grounded and Un-Grounded Specimens.*Automatic guard circuit for three-terminal measurement.*Interface measurement and automatic interference suppression circuitry.*Optional range Extension Transformer for large capacitance values.*Test data storage facility.*RS-232 computer interface and USB printer interface.*Window Interface Software for data transfer.
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Product
Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
Brake Fluid Boiling Point Tester With Bluetooth Printer
6513D
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Peaceful Thriving Enterprise Co Ltd
This tester can measure the boil point of the brake fluid. It can obtain the wet boiling temperature of the brake fluid for technician as a reference for maintenance. It can be the reference when technician is going to change the brake fluid.The testing data print by Bluetooth printer.
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Product
BTS Software
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Shenzhen Sinexcel RE Equipment CO., Ltd
Sinexcle-Re BTS software is a backend control system designed for battery charge and discharge testing. It is suitable for various scenarios and test types, primarily encompassing three modules: battery test monitoring, process editing, and data analysis. The software strictly executes tests according to customer simulation requirements, providing highly customized testing solutions to meet personalized testing needs. It automatically generates the necessary test data reports, enabling quick and efficient product analysis.
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Product
Magneto-inductive Testing
MAGNATEST D-HZP
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Foerster Instruments, Incorporated
The MAGNATEST D-HZP by FOERSTER is the ultimate magneto-inductive test instrument: the fully automatic system tests materials for their properties. It operates in single coil absolute mode, making a comparator coil unnecessary. The combination of high excitation currents and complex evaluation electronic equipment detects even very small structural discrepancies. The MAGNATEST D-HZP also provides comprehensive options for documenting test results, such as test piece statistics, histogram, and test data export, which are displayed clearly on the large color display.
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Product
DYNAMIC SIGNAL ANALYZERS
900 Series
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The new SignalCalc 900 Series software makes the process of defining a test, making measurements, analyzing data and generating high-quality reports easier than ever before. All setup, project, test article, and customer information is saved along with measurement data in a database. Easily search for data from different test runs and test types for analysis and report generation.
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Product
LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Ethernet/LXI hybridNETBOX 16 Bit Digitizer and AWG - 180 MS/s Digitizer on 4 Channels, 625 GS/s AWG on 4 Channels
DN2.827-04
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The hybridNETBOX DN2.82x series internally consists of a Digitizer and an AWG that can run together or independently. That allows simultaneous data generation and data acquisition for stimulus-response tests, ATE applications, MIMO applications or closed-loop applications. Used independently, the digitizer can acquire test data in the field and the AWG can replay this test data in lab. The hybridNETBOX offers 14/16 bit resolution and is available with digitizer sampling rates of up to 500 MS/s and AWG sampling rates of up to 1.25 GS/s. The hybridNETBOX can be installed anywhere in the company LAN and can be remotely controlled from a host PC.
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Product
Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
