Production Test Systems
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TDR Test System
GATS-310
The GATS-310 TDR test system provides you with the ability to test nets as down to less than 1/2" in length using Industry Standard Techniques.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Power Products
With the advancing development and expansion of renewable energies, modern electrical equipment must be developed, manufactured and tested according to nationally as well as internationally valid standards. This requires powerful power supplies & test equipment.Thanks to our extensive product portfolio with the full range of devices, we are able to cover all relevant areas of application. Our range includes standardised desktop units for single workstations up to individually and customised modified special solutions in 19” racks in the megawatt range with voltages up to 2.25 kV.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Grid-Connection Testing System
This system is a power supply test system that performs grid-connection testing of distributed power sources (solar cells, fuel cells, gasoline engines, etc.)Enable inverter device testing that complies with the Agency for Natural Resources and Energy’s “Guidelines for System Interconnect Technical Requirements” and the Japan electrical Safety & Environment Technology Laboratories (JET) publication “Testing Methods for Small Solar Cell Power Generation System and System Interconnection Safety Devices”.
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VIP Cabin Management Systems
Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
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CT/VT Test System
Fully pre-wired comprehensive turn test system. *Suitable for CTs up to 6000A & VTs up to 132kV. * Precision to (0.005 class) internal multi-ratio standard CT. * Internal 4KA current source. * State-of-the-art Instrument Transformer Test Set AITTS-98 with computer & printer interfaces. * Electronic potential divider facilitates testing any VT ratio upto 132kV. * Current & potential burdens.
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Shock Test Systems
Sanwood Environmental Chambers Co ., Ltd.
Is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and collision test, can perform conventional half-sine wave, post-peak sawtooth wave, square wave and other waveform shock tests.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Automated Testing System
PV-LIT
Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Optics Test Systems
Contract Measurements And Services
Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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Automotive Production Test Unit
GTU
The GTU vehicle bumper electronics tester helps engineers to ensure that the correct components are present, of the correct engineering revision and that they function as designed.
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Development System
PCIe490
The PCIe490 Expansion Chassis enables users to scale application workstations with up to eight additional PCIe boards per chassis and up to 63 total slots with chassis daisy chaining. It was designed to accommodate the Abaco Systems PC820 and PC821 with Xilinx Ultrascale technology and multiple FMC+ interfaces.
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Meter Test System
MTS-50
Kongter Test & Measurement Co., Limited
This meter test equipment features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 50A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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JTAG Boundary-Scan Controllers for High-Volume Production Systems
Corelis has designed special hardware that autonomously performs concurrent (gang) testing and programming of multiple units without additional user intervention. The entire testing and programming, including on-the-fly verification of results, is done in modular and expandable hardware.
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NVIDIA® Jetson Xavier™ NX Edge AI Vision Inference System
EOS-JNX Series
The EOS-JNX series has a built-in Smart PoE feature to control PoE power remotely to reduce maintenance efforts in challenging environments and provides PoE power loss detection to alert of any unexpected PoE disconnection. The EOS-JNX-I is designed as an AI PoE switch for connecting to IP cameras to enable AI inferencing, and also provides an uplink port to connect to a network video recorder (NVR) for recording video streams, making upgrading existing surveillance systems easy. The EOS-JNX-G is designed for industrial AI machine vision applications, providing a dedicated bandwidth of 1Gb per channel with a GigE camera connection, which is crucial for production line and manufacturing applications.
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Low Voltage Products and Systems
ABB provides a full range of low voltage solutions to connect, protect, control and measure a wide range of electrical installations, enclosures, switchboards, electronics and electromechanical devices. The business improves the reliability and efficiency of its customers’ activities across all major industries including the residential sector.
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PXI Products
As we continue to innovate in PXI, our goals are to help you accelerate time-to-market and achieve a lower cost of test. Through a growing range of PXI and PXIe modular products, Keysight provides quality, performance and measurement expertise to bring you breakthrough capabilities. To help you quickly develop test systems with your software platform of choice, Keysight provides PXI modules with a comprehensive portfolio of instrument drivers, documentation and examples for Microsoft C/C++, C#, or Visual Basic, MATLAB, VEE, LabVIEW and LabWindows/CVI software platforms.
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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VXI Products
VXI bus is an established standard with many years of success. With Keysight Technologies´ large portfolio of full-featured instrument quality VXI measurement modules, you can quickly develop systems for a broad range of applications and measurement domains such as DC, Analog, RF and microwave.
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BMS Test System
6020
High Extensibility: for multi-string battery cell, 4 cells per channel, expandable from 1 to 16 cells per strings
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Leak Test System
NorCom 2020
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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OEM Products
Avantes, the leading OEM spectroscopy manufacturer and designer is the best choice for high-quality and highly reproducible spectroscopy solutions for low-volume and high-volume customers. We take pride in collaborating with our customers to supply the right solution. Whether you need a custom-configured optical bench or a specialized fiber-optic probe, we have the experience and dedication to make it happen. While we gladly develop custom-made devices, we also offer several modular and highly configurable OEM options.
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Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
