Showing results: 5191 - 5205 of 6387 items found.
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MKS Instruments
MKS modular vacuum transducers feature compact size that dramatically reduces installation costs. These vacuum/pressure gauges are ideal for applications where controller size and local control are critically important. They are available as pressure transducers with an analog output, or as vacuum modules with digital communications used to transmit the pressure signal.
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STMicroelectronics
ST’s Xpander family of general-purpose input/output port expanders are used to interface digital ASICs via a two-line bidirectional bus (I²C) . ST’s dual-supply level translators are used as interface between multi-voltage chipsets and system I/Os, ranging from 5.5 V down to 1.2 V.
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QT65 -
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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PTG 1802 -
LYNX Technik AG
Testor | lite 3G is a compact SDI video and audio test generator designed to address a multitude of test and verification needs in modern digital infrastructures. The large color touch-screen provides a simple, intuitive user interface and the integrated rechargeable battery will provide for up to 4 hours of continuous use.
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ZT-Series -
Teradyne, Inc.
Teradyne develops and supports Modular Digitizers, Digital Storage Oscilloscopes, and Waveform Generators under the ZT-Series brand. Teradyne’s ZT-Series works to solve the test and measurement challenges of various end markets such as Defense and Aerospace, Semiconductor Test, High Energy Physics Applications, Industrial Control and Automotive Test.
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JT 57××/RMIC -
JTAG Technologies Inc.
The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.
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AE6910R -
Keysight Technologies
Unlike CAN, LIN, or MOST, the IEEE standard for automotive Ethernet demands rigorous compliance verification using specific test cases. The test requirements include complex measurements: vector network analysis with S-parameters, bit error rate (BER) test, and protocol analysis of high-speed digital signals.
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Keysight Technologies
The Remote Radio Head Test, Reference Solution provides the physical interfaces together with the vector signal analysis and vector signal generation you need to carry out comprehensive functional and performance testing of your RRH). Fully characterize the uplink and downlink, RF air-interface to and from the digital "front-haul".
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RCB-3 -
Standard Electric Works Co., Ltd
● The RCB-3 is used to verify and proof any High Voltage Insulation Testers. It can be utilized to calibrate all High Voltage Insulation Testers very accurately Analogs or Digitals.● Some institutions and large industries requested their own calibrator too, therefore, SEW started manufacturing the RCB for special customers.
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RCB-1 -
Standard Electric Works Co., Ltd
● The RCB-1 is used to verify and proof any High Voltage Insulation Testers. It can be utilized to calibrate all High Voltage Insulation Testers very accurately Analogs or Digitals.● Some institutions and large industries requested their own calibrator too, therefore, SEW started manufacturing the RCB for special customers.
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Model 58651 -
Pentek, Inc.
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Four 500 MHz 12-bit A/Ds- Four multiband DDCs (digital downconverters)- Two DUCs (digital upconverters)- Four 800 MHz 16-bit D/As- Two multiboard programmable beamformers- Up to 4 GB of DDR3 SDRAM; or: 64 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Model 57621 -
Pentek, Inc.
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Three 200 MHz 16-bit A/Ds- Three multiband DDCs (digital downconverters)- One DUCs (digital upconverters)- Two 800 MHz 16-bit D/As- One multiboard programmable beamformers- 2 GB of DDR3 SDRAM; 32 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Model 57651 -
Pentek, Inc.
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Two 500 MHz 12-bit A/Ds- Two multiband DDCs (digital downconverters)- One DUC (digital upconverter)- Two 800 MHz 16-bit D/As- One multiboard programmable beamformers- Up to 2 GB of DDR3 SDRAM; or: 32 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Model 58621 -
Pentek, Inc.
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Six 200 MHz 16-bit A/Ds- Six multiband DDCs (digital downconverters)- Two DUCs (digital upconverters)- Four 800 MHz 16-bit D/As- Two multiboard programmable beamformers- 4 GB of DDR3 SDRAM; 64 MB of QDRII+ SRAM- PCI Express (Gen. 1 & 2) interface up to x8- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Testhouse Ltd
Mobile testing ensures the quality of applications and other digital properties running on mobile devices. The dynamism, complexity and competitive nature of the mobile application space makes it imperative that publishers choose a highly responsive and well-equipped test partner to ensure the greatest user experience of their digital properties across all types of mobile devices.- Mobile testing involves all testing types (functional, performance, etc).- Mobile application testing involves thousands of complex parameters- Mobile applications see faster development iterations and hence have to be tested more frequently than at the normal application SDLC.- DevOps practices become indispensable in mobile testing as you have to anticipate and stay one step ahead of changes in the market