Silicon
atomic number 14 tetravalent metalloid chemical element.
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High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Absolute Contamination Standards (ACS)
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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High Pressure Sensors
Honeywell Industrial Automation
Honeywell Sensotec is among a handful of companies offering pressure sensors that can measure pressure up to 200,000 psi with superior accuracy and reliability. Foil based strain gauge technology enables our pressure sensors to withstand pressure that would destroy silicon based or micromachined pressure sensors.
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Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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3-5 Watt Power Amplifiers
CCM1095 and CCM2096
The CCM1095 and CCM2096 are power amplifiers that use current efficient Silicon Carbide output semi-conductors to achieve +35 to +38 dBm output power. An internal sequencing circuit is included to provide for safe operation of the output power device.
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Fused Test Probes with Silicone Test Leads
AL-56FL
Standard Electric Works Co., Ltd
Fused Test Probes with Silicone Test Leads
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Hardness Testers
Shore hardness tester, also called durometer, we have Shore A hardness tester, Shore C hardness tester, Shore D hardess tester.shore A Hardness tester is designed to measure the penetration hardness of rubber, and other rubber like substances such as neoprene, silicone, and vinyl. It can also be used for soft plastics, felt, leather and similar materials.Shore D Hardness tester is designed for plastics, Formica, Epoxies and Plexiglas.shore C hardess tester is designed for various foam and sponge.Leeb hardness tester is for metal.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Colorimeter
CM 10
Instrument Systems Optische Messtechnik GmbH
The CM 10 from the Instrument Systems Optronik line is a precise tristimulus colorimeter for a wide range of light sources. It features an impressively high signal dynamic range and a wide measuring range of up to 600 klx. The colorimeter head of the CM 10 contains four silicon photodiodes with full-glass filtering for the Xred, Xblue, Y and Z tristimulus functions. This permits particularly precise correction.
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Switches-SP6T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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X-Band Silicon Radar Quad Core IC
AWS-0101
The AWS-0101 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and dual beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain during transmit mode, +15 dBm output power during transmit, and 3.4 dB NF during receive. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 QFN for easy installation in planar phased array antennas.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Screen Brightness Tester
Adopting a detector powered by a silicone photocell with high stability, photostability, and shock resistance, strict vision correction and accurate photometric measurement can be realized.
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Kelvin Clips
129141
Comprising of a Red/Grey & a Black/Grey Kelvin Crocodile Clip lead using low loss 1mm²multistranded ( 7/36/0.071. ) double skin silicone cables terminating in 4mm ...
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SiC Schottky Barrier Diode
We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.We are also employing a new material (silicon carbide: SiC) for products with even higher efficiency.
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Networking Solutions
Bluetooth Solutions
Quickly introduce Bluetooth connectivity into sports and fitness, consumer electronics, beacons and smart home applications with easy-to-use and innovative Bluetooth SoCs, modules and software from Silicon Labs.
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CMOS and HVMOS Modeling
Significant process technology advances, including miniaturization of devices and introduction of new configurations and materials have led to a more diverse range of product applications for silicon devices. Beyond the traditional logic and memory applications, a number of new applications for CMOS technology are being developed. These include advanced applications such as high voltage devices for flat panel displays and high power devices for automotive systems.
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Probe And Test Adaptors Set (13PCS)
3601B
Peaceful Thriving Enterprise Co Ltd
1. Extra thin test probe.2. Flexible silicone cable.3. For use in conjunction with test probe.4. Bi-color test leads for polarity indication.5. High quality testing and test accessories.
