Silicon
atomic number 14 tetravalent metalloid chemical element.
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330 System
NSX
With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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Digitizer
742 Family
The 742 is the Switched Capacitor Digitizer family, based on the DRS4 chip by PSI, with the highest sampling frequency (5GS/s) and channel density. It can record very fast signals from scintillators coupled to PMTs, Silicon Photomultipliers, APD, Diamond detectors and others, and save them with high efficiency and precision for advanced timing analysis. The 742 family has an additional channel (two channels in case of VME boards) which can be used as time reference for time of fight measurements. The resolution of this kind of measurements can reach up to 50 ps.
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Embedded Systems
Active Silicon designs and manufactures custom embedded systems, often integrating our leading-edge image acquisition technology. Typically, units are designed for a specific OEM application often in the field of medical devices, industrial automation or remote monitoring. Systems are designed to meet various safety, quality and medical standards as appropriate, as well as being designed for long product life retaining the same fit, form and function for many years.
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Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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Universal Multichannel System up to 100V
- From 12 to 48 independently controllable High Voltage channels- 0 ÷ 100 V output voltage- Maximum Current: 1mA, 10 mA or 1 mA/100 μA (dual range board)- Individual Enable (A1510 only)- Either DB37, DB25 or SHV connectors- Available with either positive, negative or mixed polarity- Up to 20 nA / 100 pA current set / monitor resolution- Up to 2 / 0.2 mV voltage set / monitor resolution- Extreme Low ripple, down to < 3 mVpp- 3 different channel grounding- Common Ground (AGxxxx)- Common Floating Return (Axxxx)- Full Floating (A1510 only)- Independently programmable for each channel:- Output voltage- Current limit- Ramp up/down- TRIP parameter- Current generator operation in overcurrent condition- Specific design for double side silicon detector (A1510)
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Power Assembly Tools
In order to keep up with modern production demands, you need tools that are faster, smarter, more accurate, and more powerful than ever before. Mountz answers that demand from the heart of Silicon Valley with a full line of innovative electric and pneumatic power tools and automation systems. With intuitive Mountz tool controllers, complex multi-pass assemblies become simple and your production speed will skyrocket. Quality control and regulatory compliance can be streamlined with real-time error proofing and time stamped documentation. From the simplest repairs to the most technical manufacturing projects and everything in between, Mountz power tools stand out from the crowd.
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Affordable EDXRF Analyzers
NEX QC Series
Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Pulse Characterization Sensors
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Buffers
Silicon Labs' clock buffers provide ultra-low additive jitter, low skew clock distribution. In addition to differential and LVCMOS buffers, Silicon Labs offers universal clock buffers that support any-in/out signal format and integrate clock muxing and division to further simplify clock tree design.
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Probes
SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Life-time Measurement System For Silicon Bulks/ingots By JIS Method
HF-100DCA
*Global standard model for the lifetime test of silicon bulk*JIS direct current anodizing method*Data processing by digital oscilloscope and PC with software
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Temperature Measurement IR Sensors & Detectors
ST60 High Temperature
A single-channel silicon-based thermopile that will withstand operating temperatures of 225C, with a small active area of 0.61mm x 0.61mm in a TO-5 package. The reduced height package functions as an internal aperture. Two thermistor options provide ambient package temperature measurement. Currently only available with 8-14um silicon window. Time constant of 18ms with Nitrogen encapsulation gas delivers a very low Temperature Coefficient of Responsivity of -0.4%C. This detector has a very short thermal shock response to ambient temperature change.
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MICROWAVE VARIABLE-CAPACITANCE DIODES FROM 1 to 40 GHz
Insight Product Company offers Microwave Variable-Capacitance Diodes with capacity coverage ratio over 10 times and operating in frequency range from 1 to 40 GHz. The p+ -n1 - n2 -n+ silicon variable-capacitance diodes are designed to electrically tune frequences and phases of microwave oscillators - parts of hybrid microcircuits that provide capsulation and protection against ambient action.
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Manual Contactless Wafer Detector
HS-NCS-300
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Silicon heavy-doped Tweezer Tester
HS-MRTT
Mini resistivity tweezer tester is used to check heavy-dope silicon. adaptable for little granular material, little broken IC Wafer and other little silicon material. When the resistivity is lower than the set value, it will make alarm.
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Diode Arrays
a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100 % Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Capacitors - MNOS Series
Macom Technology Solutions Holdings Inc.
MACOM’s MIS capacitors utilize a silicon nitride dielectric over a thermally grown silicon dioxide base. The resultant composite dielectric exhibits low leakage current and insertion loss with excellent long-term stability. The temperature coefficient of capacitance is typically +55 ppm / ºC and is ideally suited for high reliability applications.
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SparkFun Qwiic MicroPressure Sensor
The SparkFun Qwiic MicroPressure Sensor is a miniature breakout equipped with Honeywell's 25psi piezoresistive silicon pressure sensor. This MicroPressure Sensor offers a calibrated and compensated pressure sensing range of 60mbar to 2.5bar, easy to read 24 bit digital I2C output, and can be calibrated and compensated over a specific temperature range for sensor offset, sensitivity, temperature effects, and non-linearity using an on-board Application Specific Integrated Circuit (ASIC). With its ultra-low power consumption and Qwiic ports, you've got yourself a power packed little sensor!
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Digitizer
751Family
The 751 is a family of CAEN Waveform Digitizer able to perform basic waveform recording and run online advanced algorithms (DPP) of charge integration and pulse shape discrimination with constant fraction timing and zero-length encoding. Data is read by a Flash ADC, 10-bit resolution and 1GS/s sampling rate (2GS/s using half of the channels in DES mode), which is well suited for fast signals as the ones coming from fast organic, inorganic and liquid scintillators coupled to PMTs or Silicon Photomultipliers, Diamond detectors and others. The acquisitioncan be channel independent and it is possible to make coincidence/ anti-coincidence logic among diferent channels and external veto/ gating. Multiple boards can be synchronized to build up complex systems.
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Si1145 UV / Ambient Light / Proximity Sensor
SEN-36002
SEN-36002 is a highly integrated carrier board designed for the Si1145 UV, Ambient Light and Proximity sensor IC from Silicon Labs. This sensor has 100mLUX resolution, and has a dynamic range of 1 LUX to 128 kLUX with IR correction. This means that whether your application is indoors in poor lighting conditions or outside in full sunlight, this sensor has you covered. In addition, we added a high power LED (150mA max, 20 degree) to take full advantage of the proximity sensing capability of this IC - something you won't see on most competitive carrier boards. Integration is easy with 4 x 4-40 sized mounting holes at the corners of the PCB and signal translation to handle interface voltages from 3V to 5V. The board is interfaced via an I2C interface and function pins have been broken out to a 0.1" pin header. The INT pin is also broken out for interrupt capability.
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Laboratory Centrifuges
Centrifuge systems are designed for the development, test, evaluation and calibration of accelerometers and a variety of inertial devices. Centrifuges provide a cost-effective solution for simulating high-"G" environments in the laboratory. They support testing of devices such as MEMS-based Inertial Measurement Units (IMUs), low-cost quartz or silicon sensors, Ring Laser Gyros (RLGs), Fiber-Optic Gyros (FOGs), fuzes and crash sensors.
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Surge Suppressor Tester
(SST) 450
The ATSI SST-450 Surge Suppressor Tester is designed to quickly and easily test allcommonly used transient voltage suppressors: metal-oxide varistors (MOVs), gas-discharge tubes (GDTs), silicon avalanche diodes (SADs), thyristor surge protective devices (TSPDs), and hybrid devices.
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Wireless Protocols for 2.4 GHz and Sub-GHz
Proprietary
Silicon Labs' proprietary wireless devices provide high-performance wireless connectivity and ultra-low power 8-bit and 32-bit microcontroller options. With support for major frequency bands in the 142 to 1050 MHz range and 2.4 GHz these devices can be used to develop many classes of Internet of Things (IoT) systems.
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Light Meter
PLMT56
Light Meter Measures In LuxOver-Range IndicatorLong-Life Silicon Photo Diode InsideMeasurement Rate: 1.5 Times per SecondMax Range: 50,000 LuxAccuracy: +/- 5% Under 10000 Lux, +/- 10% Over 10000 LuxMax Resolution: 0.1 LuxDimensions: 7.40' H x 2.52' W x 0.96' DAccessories Included: 12V A23 Battery, Photo DetectorSold as : Unit
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Light Meters
LXP-2
The digital light meter is a precision instrument used to measure illuminance (Lux, footcandle) in the field. It is meet CIE photopic spectral response. It is fully cosine corrected for the angular incidence of light. The illuminance meter is compact, tough and easy to handle owing to its construction. The light sensitive component used in the meter is a very stable, long-life silicon photo diode and spectral response filter.
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256-Element Active Antenna Innovator’s Kit
AWA-0142
The AWA-0142 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0135 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0135, the antenna provides +60dBmi (1000 W) of EIRP. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWA-0142 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
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Oscillators - Voltage Controlled
Teledyne RF & Microwave offers Voltage Controlled Oscillators (VCOs) utilizing bipolar transistors & silicon varactors over the frequency range of 40 MHz to 18GHz. Many of the VCO designs incorporate internal filtering, regulation & amplifiers to meet total system requirements in a small integrated package. Additionally, our hermetic hybrid designs can be screened to the most demanding military and space applications.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Spectroelectrochemical Flow Cell
SEC-2F
Using the spectroelectrochemical flow cell, it is possible to have a different optical path length changing the gasket. We offer, as an optional item, a silicon and Teflon gasket with a 100, 250 and 500 m of the thickness. SEC-2F Spectroelectrochemical flow cell was designed to fit perfectly in the SEC2000 Spectrometer, and it eliminated the use of the optical fiber to connect the Spectrometer to the SEC-2F. Even for another brand of the spectrometer, you can connect the SEC-2F using the collimating lens and optical fiber.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
