Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
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Product
Pendulum Impact Testing Machine
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Direct indication of impact energy absorbed by specimen on large diameterAvailable with safety guard for the operatorInitial potential energy for Charpy is 300 Joules & for Izod is 170 Joules with a L.C. of 2 Joules (for Analogueodels) & resolution of 0.5 Joules (for Digital Model)Pendulum drop angle for Charpy is 140° & for Izod is 90°ASTM Impact Testing machine is also supplied, which conforms to E-23 ASTM standarAvailable with Gauges, Tongs, Sub-zero bath, Templates, U & V-Notch milling cutter (Optional)
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Product
NI-9236, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module
779994-02
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10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 V rms transient isolation, providing high‑common‑mode noise rejection and increased safety.
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Product
IEC60068-2-75 Spring Operated Impact Hammer 0.5J Testing Equipment
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60068-2-75 spring operated impact hammer 0.5J testing equipment Universal Impact-test Hammer with 0.20 J, 0.35 J, 0.50 J, 0.70 J and 1.00 J, five selectable impact energies
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Product
Drop Testing Machines
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Infinity Machine International Inc.
Drop Testing Machines by Infinity Machine International Inc. - for applications such as: tumble tester, drop weight impact testing machine, mobile phone roll drop tester, micro drop testing machine for mobile phone, and more.
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Product
2.3KG Steel Impact Test Ball
CX-325
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Shenzhen Chuangxin Instruments Co., Ltd.
UL858 2.3KG Steel Impact Test Ball
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Product
PTL Impact Hammer
F22.50
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Shenzhen Chuangxin Instruments Co., Ltd.
The Universal Impact Hammer is designed to perform impact tests for product durability. The F22.50 meets the testing needs of industry standards such as IEC 60068-2-75 and required by IEC 60065, 60335, 60598, 60601, 61010 and others. The hammer simulates mechanical impact to electronic products and electrical appliances.
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Product
NI-9236, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module
785996-01
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10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 V rms transient isolation, providing high‑common‑mode noise rejection and increased safety.
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Product
Film Impact Tester
DRK136B
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Shandong Drick Instruments Co., Ltd.
DRK136B Film Impact Tester is applicable in the precise impact resistance test of plastic films, sheets, laminated films, rubber and other nonmetal material.
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Product
Impact Testing Machine
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Instron Dynatup drop weigh impact testing machine next generation is the Instron 9400 Series. A drop weight impact testing machine is used to determine the energy required to break or damage a material in which a defined weight falls onto a specimen or a component from a specific height and with a specific impact energy and velocity.
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Product
Air Jet Erosion Tester
AJ-1000
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The Rtec Instruments Air Jet Erosion Tester (AJ-1000) is a state-of-the-art solution for accurate air jet erosion testing of materials and coatings. Designed to perform repeated impact tests, the AJ-1000 directs a high-velocity jet of gas carrying abrasive particles onto the sample surface to precisely measure erosion rates. This advanced tester offers closed-loop temperature control up to 1000°C, enabling erosion studies under extreme environmental conditions. With the ability to vary abrasive particle type, shape, size, temperature, and impact velocity, the AJ-1000 provides a reliable way to rank and compare the erosion resistance of diverse materials and protective coatings.
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Product
Package Testing
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Lansmont package testing equipment is designed to perform industry standards, such as ASTM, ISTA, ISO, EUMOS and others. Our equipment is compliant with all of the most common ASTM and ISTA package testing procedures. There are individual standards that specifically reference how to perform drop testing, compression testing, side impact testing and vibration testing. In addition to those standards, there are groups of procedures referred to as distribution simulation tests, which incorporate some strategic combination of testing inputs, with the idea of simulating a typical journey through the supply chain. Some of the most common distribution simulation standards that are performed globally are published by ASTM and ISTA.
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Product
IEC60669 Pendulum Impact Test Machine
CX-BC1
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60669 Pendulum Impact Test Machine
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Scienlab Combined Battery Test Solution
SL1133A
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Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
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NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Test System
UltraFLEX
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The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Functional Test Fixtures
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Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
