Impact Test
forceful strike to UUT determining strength and durability or detection of loose particles.
See Also: Drop Testers, Pendulum Impact, Impact Hammers, Crush, Hardness Testers, Rupture
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Portable Hardness Tester
PHT-1700
Loaded with features, this economically priced hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with the universal D impact device, calibrated test block and rugged carry case.
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Battery Test Equipment
Shenzhen Bonad Instrument Co., Ltd.
The tests that can be performed by lithium-ion battery safety testing equipment include temperature cycling test, thermal abuse test, high altitude low-pressure simulation test, vibration test, shock test, external short-circuit test, forced internal short-circuit test, drop test, crush test, impact test, nail penetration test, burning test, etc. These test items mainly apply to various lithium-ion cells such as 18650 cells and prismatic cells, lithium-ion batteries, lithium-ion battery modules, lithium-ion battery packs, and so on.BONAD battery safety testing equipment complies with various standards such as IEC 62133, IEC 62133, UL 2580, UN 38.3, UL 1642, etc. For more information, please contact us, BONAD will provide you with professional technical consultation and high-quality testing equipment.
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Battery Testing Machine
Dongguan Kejian Instrument Co., Ltd.
Test method is to use test sample cell on a plane, a diameter of 15.8 mm (5/8 inch) rods on the cross placed in the center of the sample.one 9.1 kg or 10 kg weight from a certain height (610 mm or 1000 mm) fell to the samples.Cylindrical or square battery in accepting the impact test, the vertical axis parallel to the plane, vertical steel column longitudinal axis.The longest axis vertical steel column square battery, the bedding face perpendicular to the direction of impact, each battery only accept an impact test.
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Inclined Impact Testers
Inclined impact testing simulates environmental dynamic forces that packaged goods may endure throughout transport and handling operations. These hazardous dynamics are simulated using impact test systems. Inclined impact test systems utilize a carriage that propels the test sample down a ramp at predetermined velocities before impacting into a fixed backstop. The specimen’s reaction to these extreme conditions indicates how the product would fare in real-world supply chain settings, allowing design engineers to make improvements to either the product and/or the protective packaging as needed.
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NI-9235, 10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module
785995-01
10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9235 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9235 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 Vrms transient isolation, providing high‑common‑mode noise rejection and increased safety.
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Portable Hardness Tester For cast/rough surface parts
PHT-1750
Loaded with features, this economically priced portable hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This portable hardness tester comes complete with the G impact device, calibrated test block and rugged carry case.
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2 Inch 535g Steel Impact Ball For Impact Test
CX-B2
Shenzhen Chuangxin Instruments Co., Ltd.
2 inch 535g steel impact ball for impact test
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IEC60950 50mm Impact Test Balls
CX-15
Shenzhen Chuangxin Instruments Co., Ltd.
The Impact Test Ball is a specially machined ball to test impact resistance according to IEC, CSA and UL Standards. It is made of chrome-plated-steel for durability, and is fitted with an eyelet to facilitate testing for pendulum applications. Eyelet is threaded to the ball to allow attachment of a handle or force gauge. Weights are closely controlled.
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sbRIO-9235, Non-Enclosed, 10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module
781579-01
Non-Enclosed, 10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The sbRIO‑9235 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The sbRIO‑9235 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 Vrms transient isolation, providing high‑common‑mode noise rejection and increased safety. Non-enclosed modules are designed for OEM applications.
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Drop Tester
KD 688 A
King Design Industrial Co., Ltd.
*PLC control, linear motor fast speed control the height setting.*Alarm warning before testing.*Light support structure decreases the test impact.*Support dropping very smooth with dual lubrication guide.*No second impact. *A data acquisition for the impact wave record (Option).*Non maintenance request for continue operation.*According to ISTA, ASTM .....etc international standard.*Equipped edge & corner holder.
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Drop Weight Impact Testing Machine
DWTT Series
Jinan Testing Equipment IE Corporation
DWTT Drop Weight Impact Testing System is suitable for drop weight tear test of various kinds of ferrite, especially for the test of DWTT for pipeline steel as ASTM-E 436, API-RP 5L3, ASTM-E 208 and DIN EN 10274. DWTT has integrated mechanical, electrical, and automatic control technology, and achieved full automation of feeding, hammer lifting impact, and fracture specimen collection. The load frame has a four-column design, features in stable supporting structure, rigid, dual sliding rails. The Drop Weight Drop Weight Tester is equipped with positioning mechanism, anti-dumping mechanism, safety mechanism, hydraulic buffer devices and security guard net. The impact energy is determined by the lifting height and configuration of different net weights. DWTT Drop Weight Impact Testing System is the essential quality control equipment for pipeline manufacturers, steel mills, iron and steel enterprises, and is also widely used for research institutes.1. Buffer device is equipped to avoid the second impact and absorb the residual energy after breaking the specimen so as to prevent the weigher and anvil from destroying. The installation of safety mechanism, buffer device, and security guard net will effectively secure the testing machine and its operation to extend its life.2. Configuration of the specimen-feeding system, anti-second impact device, and specimen centering mechanism will guarantee a quick, accurate and reliable test.
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SINGLE ENERGY IMPACT HAMMERS
Shenzhen Chuangxin Instruments Co., Ltd.
It’s used to test the mechanical integrity of product enclosures and check the durability of enclosures for electrical appliances of other electrical appliances and other electronic products. If damage occurs from the Impact Hammer test, accessibility probes can be used to measure the extent or severity of the damage. The Impact Hammer simulates the mechanical impact to which electrical equipment maybe subjected.
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Automatic Metallic Pendulum Impact Testing Machine
Jinan Testing Equipment IE Corporation
JB-450/750A automatic type pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and is capable of doing a large number of impact tests continuously. The automatic type pendulum impact tester can display the impact power, impact toughness, and the pendulum's rotation angle. All the testing reports can be printed out. JB-450/750A can be equipped with fully automated sample feeding system, which greatly improves the test efficiency, and reduce labor intensity. The crygenic cooling device is available for impact tests under the lowest temperature down to -196 C. The automatic type pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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ARINC-708 Module
M4K708
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
