System Integration
incorporates all functioning sub-elements into one orchestrated service.
See Also: System Integrators, Test Systems, Location Based Services
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Modular Breakout System 3-Pin & 20-Pin Plugin Module
95-199-004
The 95-199-004 Plugin Breakout Module is designed to be fitted to a PXI 40-199 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Spectrophotometer & Integrating Sphere Test System
LPCE-1
This Test System is suitable for photometric and colorimetric measurement of luminaries such as Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps), CCFL and LED. The measured data meets the requirements of CIE and IES LM-79 for the measurement of photometry and colorimetry.
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FMV Compression System
daq8580
The Daq8580 is designed to address the challenges of processing, transporting and storing full motion video through video encoding, and can interface with a wide variety of analog and digital I/O and process standard video formats up to 1080p30 as well as computer resolutions up to 1600x1200.
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Integrating Spheres
Artifex Engineering GmbH & Co. KG
We offer integrating spheres made from a special polymer suitable for the wavelength range 250nm – 2.5 µm. For longer wavelengths in the range 700nm – 20 µm, a gold coating on a rough, metallic surface is used. Since lasers in this spectral range are usually also high power, we use solid copper as a thermally conductive substrate material. By choosing the size of the integrating sphere, the overall sensitivity of the system can be adjusted. In addition, the detector is independent of inhomogeneities in power density and polarization. The detector is also independent of the incidence location and angle of the laser radiation.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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COTS Integrations
Sundance Multiprocessor Technology Ltd.
Our “COTS” Integrations are some examples of what could be achieved with combinations of our carriers and FMC modules.They are systems for data acquisition, signal generation, video processing and more.
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Integration Spheres
Offers a wide range of integration spheres (0.25m to 3 m diameter) and spectrometer options, application-specific modules as well.
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Vision Systems
Embedded vision systems, also referred to as compact vision systems, offer an alternative to Smart cameras and computer-based systems. The ADLINK EOS series is a complete embedded system that offers image acquisition, processing, archiving, and display capabilities. It is equipped with a multi-core CPU, ideal for applications requiring high computing power and multi-camera imaging, such as 3D vision and robotics guidance. Featuring rich I/O connectivity with factory-floor networks, including RS-232/422/485, USB, and isolated digital I/O, as well as onboard storage, ADLINK’s embedded vision system is ready to deploy. A system monitoring feature, feeding back temperature and voltage data, combines with a watchdog timer to maximize robustness and reliability of the ADLINK EOS series in mission critical applications.
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Integrity Assessment
Accurate and up-to-date insight into the structural integrity of your pipeline gives you a reliable basis for prioritizing maintenance tasks and investments, business planning and mission-critical decisions – helping you optimize costs. Does the pipeline fulfill its functional purpose? Are day-to-day operations being hampered by flaws or anomalies? What is the expected remaining lifetime of the asset?
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Integrated Lithography Track Systems
Lithography track systems complete the EVG lithography product family with a fully integrated production system and high grade of automation combining mask alignment and exposure with integrated pre- and post-processing. Based on a modular platform, the HERCULES lithography track system merges EVG’s established optical mask alignment technology with integrated cleaning, resist coating, baking and resist development modules. This turns the HERCULES platform into a “one stop shop”, where pre-processed wafers are loaded into the tool and fully structured processed wafers are returned.
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Test Systems & Sub-systems Development and Integration
Research, development and the production of electronic test equipment, systems and subsystems for the industrial, scientific, and defense markets.
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PXIe System Sync Module, 2 Port
M9032A
The M9032A has a Soft Front Panel (SFP) that provides a graphical user interface to the system sync module. It allows the user to set up the most commonly used functionalities of the module. The SFP also gives you the ability to check the module's connection status, configure the reference clock and IO settings, and perform firmware udpates.
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Integrating Sphere Based Spectroradiometer Systems
Spectroradiometer systems with integrating sphere for the measurement of UV-VIS-NIR spectral radiant flux (W/nm) and luminous flux (lm) and chromaticity metrics.
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Passive Component Integration - MATRIQ
The Passive is a highly customizable benchtop accessory that can integrate the passive components of your choice for convenient storage and integration into your test set up.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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Integrated I-V Test Systems
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Turret Integrated Rotating Systems (OMFV)
Slip Rings can be fitted on tank turrets and military vehicles for frontline operations, allowing power, Ethernet, video and CAN bus signals to be transmitted on the battlefield using fiber optic channels.
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Integrating Sphere Coating
SP-80
Integrating Spheres are essential tools for photometric research laboratories & lamp / luminaire manufacturers. A good internal coating is essential forintegrating spheres. It is a special water based BariumSulphate (BaSO ) white reflective paint particularly suitablefor internal coating of Integrating Spheres. It offers an almost constant reflectance in the range of 380 nm to 780 nm (visible wavelength range).
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PCB S.I/P.I (Signal Integrity/ Power Integrity)
Why need for PCB Simulators?Higher data speed (>GHz) Higher density Larger system size EMI concern Cost cut down Reduce of project term
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Integrated Assemblies
Teledyne RF & Microwave offers full first-level integration capabilities, providing not just performance components but also full subsystem solutions to help reduce program schedule and cost. Drawing on our expanding breadth of components, Teledyne delivers customer-specified subsystems of analog and mixed analog-digital design, including hybrid, MMIC, and mixed hybrid-MMIC configurations. Designed to meet military or space applications, some typical subsystems Teledyne delivers include I/Q demodulators, coupled detector assemblies, switched amplifier detector assemblies, and dual-band VCOs.
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Integrated Microwave Assemblies
IMAs
Communications & Power Industries
• High power handling• Low-noise figure• Calibrated couplers• Variable attenuation• Frequencies from 100 MHz to 40 GHz
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Integrated Displacement Sensing
IDS3010
With its slim size, the IDS can be directly integrated into machines for free-beam operation and is the product of choice for challenging OEM & synchrotron applications. A passively cooled housing prevents contamination of optical and electrical components.
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Digital Current Integrator
The ORTEC Model 439 Digital Current Integrator was designed to accurately measure DC currents or the average value of pulse currents such as produced by accelerator beams. It digitizes the input current by producing an output pulse for specific values of input charge. A front-panel switch permit the selection of three different amounts of charge (10–10, 10–8 or 10–6 coulomb) required to produce an output pulse. The instrument has a digitizing rate from 0 to 10 kHz to provide wide dynamic range on each setting and high-resolution readout without meter interpolation.
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IFEC Embedded System Hardware
State-of-the-art system components serve as building blocks for you to create the ideal IFEC system.
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Mezzanine System Carrier
MMS6245
The MMS6245 gives you the ultimate flexibility in rugged embedded I/O by allowing you to customize the 64 user-configurable front panel signals with our patented Electrical Conversion Module (ECM) technology. This configurable XMC carrier can host up to four ECMs giving you the ability to customize I/O to your specific needs.
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Scienlab Battery Test System - Cell Level
SL1007A
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
