Relay Test
See Also: Relay Test Sets
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
PXI/PXIe Power Relay Module, 8xSPDT, 5 Amp, 37-Pin D-type Connector
40-158-104
Relay
The 40/42-158-104 is a PXI/PXIe high density power relay module with 8xSPDT switches rated at 5A. User connection is via a 37-pin D-type male connector. The 40/42-158 range is available in 8, 16, 24 or 32 SPST configurations with or without hardware interlock. Electro-mechanical power relays are used which are suitable for switching loads up to 5A at 250VAC.
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Product
PXI 50 x DPST Electromechanical Relays
40-146-202
Relay
The 40-145/46/48 range of high density switching modules are available in Normally Open (SPST & DPST) and changeover (SPDT) configurations. Connections are made via a front panel 200 pin female connector. General purpose relays are suitable for the construction of small switching networks, I/O port switching, for slave switching larger relays or for operating external devices (e.g. lamps, solenoids etc.).
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 40 GHz, 50 Ω, SMA-2.9, External Termination, Failsafe, Remote Mount
40-781A-522-E
Relay
The 40-781A-522-E (PXI) and 42-781A-522-E (PXIe) are dual failsafe SPDT 40 GHz microwave relay modules with external terminations and remotely mounted relays. The 40/42-781A range is available with one or two SPDT switches capable of switching frequencies up to 50 GHz in 50 Ω. They are available with either internal or external terminations and connections are via front panel mounted high quality SMA, SMA 2.9 or SMA 2.4 connectors.
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Product
PXI/PXIe Power Relay Module, 3xSPDT, 20 Amp
40-166-102
Relay
The 40/42-166-102 is a PXI/PXIe high density power relay module with 3xSPDT switches rated at 20A. The 40/42-166 range is available with SPST, SPDT or SP4T switching configurations. It uses power relays which are suitable for switching loads up to 20A at 240VAC (SPDT & SP4T versions) or 30A at 277VAC (SPST versions).
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
PXI Power Relay Module, 12xSPST, 16 A, With Interlock
40-161A-002-HI
Relay
The 40/42-161A-002-HI is a PXI/PXIe 12xSPST power relay module with optional hardware interlock. It is part of a range of high density power switching solutions with a choice of SPST, and SPDT relay configurations with or without hardware interlock.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
48-Ch SPDT 1A-100VAC 24VDC Switching
YAV91074
Relay
The YAV90074 module contents 48 SPDT Relays independent. Each relays PCB contact track is shielded individually in order to handle very low voltage signals and audio signals with extremely low crosstalk. The build-in power supply includes two extra filters to reduce the DC voltage ripple to the relay coils; the control tracks have been drawn in quadrature with signal ones, reducing the inductive coupling produced by the transient current.
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Product
Bottom Electrode SMD Test Fixture
16198A
Test Fixture
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 67GHz, 50Ω, SMA-1.85, Remote Mount
40-780B-572-E
Relay
The 40-780B-572-E (PXI) and 42-780B-572-E (PXIe) are dual SPDT 67GHz unterminated microwave relay modules with remotely mounted relays. The 40/42-780B range is available with one, two, three or four SPDT panel mounted relays capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions.
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Product
Compact Functional Test System
E2230C / TS-5040
Functional Test
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
PXI/PXIe Power Relay Module,5 Amp, 50-pin D-type Connector
40-153-103-HI
Relay
The 40/42-153-103-HI is a PXI/PXIe high density power relay module with 25xSPST switches rated at 5A and includes the hardware interlock option. User connection is via a 50-pin D-type male connector, hardware interlock is via a 4-pin 00 series socket (mating plug is supplied). The 40/42-153 range is available in 18, 25, 36 or 50 SPST configurations with or without hardware interlock.
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 26.5 GHz, 50 Ω, SMA, Remote Mount, Failsafe
42-780B-532-E
Relay
The 40-780B-532-E (PXI) and 42-780B-532-E (PXIe) are dual failsafe SPDT 26.5 GHz unterminated microwave relay modules with remotely mounted relays. The 40/42-780B range is available with one, two, three or four SPDT panel mounted relays capable of switching frequencies up to 67 GHz in 50 Ω or 2.5 GHz in 75 Ω. Connections are made via high quality RF coaxial connectors, SMA or N-Type for 50 Ω and 1.6/5.6 in 75 Ω versions. Remote versions can support up to three SPDT relays in a single slot.
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Product
32-Ch SPDT 5A-240VAC 24VDC Switching
YAV90132
Relay
32 relays, 5A 28 SPDT relays, 5A Mux. 1 a 4 relays CAN Control or Ethernet (with Ethernet to CAN Gateway) Drivers dll & VIs available
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Product
6TL10 Table Top Test Base
H71001000
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
PXI/PXIe Microwave Relay, Single SPDT, 40GHz, 50Ω, SMA-2.9, Remote Mount
40-780B-541-E
Relay
The 40-780B-541-E (PXI) and 42-780B-541-E (PXIe) are single SPDT 40GHz unterminated microwave relay modules with remotely mounted relays. The 40/42-780B range is available with one, two, three or four SPDT panel mounted relays capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions. Remote versions can support up to three SPDT relays in a single slot.
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Product
PXI/PXIe Microwave Relay, Dual SPDT, 18 GHz, 50 Ω, SMA, Internal Termination, Failsafe, Remote Mount
40-781A-022-E
Relay
The 40-781A-022 (PXI) and 42-781A-022 (PXIe) are dual failsafe SPDT 18 GHz microwave relay modules with internal terminations and remotely mounted relays. The 40/42-781A range is available with one or two SPDT switches capable of switching frequencies up to 50 GHz in 50 Ω. They are available with either internal or external terminations and connections are via front panel mounted high quality SMA, SMA 2.9 or SMA 2.4 connectors.
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Product
Safety Compliance Test System
EN 60601
Test System
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Product
EFT Module for Teststand
test
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781420-11
Reed Relay
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
Test System
Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
