Relay Test
See Also: Relay Test Sets
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
PCI 39xSPST 2Amp Relay Card
50-132-003
Relay
The 50-132-003 39xSPST relay module is part of our range of PCI, low cost, general purpose electro-mechanical relay modules which are capable of switching voltages up to 300VDC/250VAC and current up to 2A. They are suitable for use where reed relay based switching modules do not have sufficient voltage or current carrying capability.
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Product
PXI 10 x DPST 8 Amp Power Relay Module
40-160-002
Relay
The 40-160 module has a choice of 10 x SPST, 20 x SPST or 10 x DPST Power Relays, suitable for switching inductive/capacitive loads up to 10A at 250Vac.Power Relay Modules are intended for switching heavy AC or DC loads or for slaving up to large external relays, contactors and solenoids.It is suitable for applications requiring switching of either mains voltage or DC current.
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Product
PXI 10 x SPST 10 Amp Power Relay Module
40-160-001
Relay
The 40-160 module has a choice of 10 x SPST, 20 x SPST or 10 x DPST Power Relays, suitable for switching inductive/capacitive loads up to 10A at 250Vac.Power Relay Modules are intended for switching heavy AC or DC loads or for slaving up to large external relays, contactors and solenoids.It is suitable for applications requiring switching of either mains voltage or DC current.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
PXI 12xSPST 16A Power EMR Module
40-161-002
Relay
This40-161 range of PXI power relay modules is available with achoice of 16 x SPST, 12 x SPST, 10 x SPST, 12 x SPDT and 6 x SPDT power relays, for switching loads up to 16A at250VAC. These Power Relay Modules are intended for switching heavy AC or DC loads or for the slave switching of large external relays, contactors and solenoids. The 40-161 is ideal for switching up to 16A in both AC and DC applications.
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
PXI/PXIe Power Relay Module, 8xSPDT, 5 Amp, 50-Pin SGMC Connector
40-158-004-HI
Relay
The 40/42-158-004-HI is a PXI/PXIe high density power relay module with 8xSPDT switches rated at 5A and includes the hardware interlock option. User connection is via a 50-pin SGMC male connector, hardware interlock is via a 4-pin 00 series socket (mating plug is supplied). The 40/42-158 range is available in 8, 16, 24 or 32 SPST configurations with or without hardware interlock.
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Product
PXI Dual Microwave SPDT Relay 18GHz 50 SMA - External Termination
40-781-122
Relay
The 40-781 Microwave switching module consists of one, or two changeover switches capable of switching frequencies to 18GHz in 50 Ohm. Versions are available with either internal or external terminations and connections are made via front panel mounted high quality SMA RF coaxial connectors.
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Product
PXI/PXIe Microwave Relay, Single SPDT, 12.4GHz, 50Ω, N-Type
40-780B-511
Relay
The 40-780B-511 (PXI) and 42-780B-511 (PXIe) are single SPDT 12.4GHz unterminated microwave relay modules. The 40/42-780B range is available with one, two, three or four SPDT switches capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via front panel mounted high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions. Remote versions are also available which can support up to three SPDT relays in a single slot.
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
PXI/PXIe Microwave Relay, Single SPDT, 40GHz, 50Ω, SMA-2.9
40-780B-541
Relay
The 40-780B-541 (PXI) and 42-780B-541 (PXIe) are single SPDT 40GHz unterminated microwave relay modules. The 40/42-780B range is available with one, two, three or four SPDT switches capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via front panel mounted high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions. Remote versions are also available which can support up to three SPDT relays in a single slot.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
ARINC-708 Module
M4K708
Test Module
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
PXIe Microwave Relay, Dual SPDT, 2.5 GHz, 75 Ω, 1.6/5.6, Failsafe
42-780B-752
Relay
The 40-780B-752 (PXI) and 42-780B-752 (PXIe) are dual failsafe SPDT 2.5 GHz 75 Ω unterminated microwave relay modules. The 40/42-780B range is available with one, two, three or four SPDT switches capable of switching frequencies up to 67 GHz in 50 Ω or 2.5 GHz in 75 Ω. Connections are made via front panel mounted high quality RF coaxial connectors, SMA or N-Type for 50 Ω and 1.6/5.6 in 75 Ω versions. Remote versions are also available which can support up to three SPDT relays in a single slot.
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Product
Sealed Beam Bulb Testing System
H710019SSL
Test Platform
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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Product
PXI/PXIe Microwave Relay, Single SPDT, 18GHz, 50Ω, SMA
40-780B-521
Relay
The 40-780B-521 (PXI) and 42-780B-521 (PXIe) are single SPDT 18GHz unterminated microwave relay modules. The 40/42-780B range is available with one, two, three or four SPDT switches capable of switching frequencies up to 67GHz in 50Ω or 2.5GHz in 75Ω. Connections are made via front panel mounted high quality RF coaxial connectors, SMA or N-Type for 50Ω and 1.6/5.6 in 75Ω versions. Remote versions are also available which can support up to three SPDT relays in a single slot.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
Automotive Ethernet Test Fixture
AE6941A
Test Fixture
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Product
Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Test Handler
M6242
Test Handler
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
