ICT Systems
See Also: ICT
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Mezzanine System
5147
System
ECM P/N 5147 provides two channels of 12 bit A/D conversion using the Analog Devices AD9235, and is suitable for medium resolution high speed applications. The two differential inputs are terminated in 120 ohms and buffered with a gain of 1 differential amplifier. Differential Input range is +/-3.0V. Sample rates are 20MHz per channel with a 5MHz 4 pole elliptical analog input filter.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
ICT / FCT Probes
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*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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Product
VIP Inflight Entertainment Systems
System
Astronics can outfit your entire cabin with the perfect A/V system to match your needs. From a custom monitor to a robust speaker system, Astronics' integrations will improve your inflight entertainment experience.
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Product
ICT Probes
Merica Serirs- MP175
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Minimum Center: 1.91mm (75mil)Current Rating: 3amps, continuousContact Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.40mmRated Stroke:4.30mmSpring Force: 203gf (7.2oz)/227gf(8oz)
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Product
Systems Certification
System
Project integration offering a complete turnkey solution including design, engineering, FAA and international regulatory certification services and testing, and installation kit manufacturing.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
AI Inference System
MIC-741-AT
Edge AI Inference System
AI Inference System Powered by NVIDIA® Jetson Thor™. Embedded with NVIDIA® Jetson T4000™ up to 1200 TFLOPS (FP4). Supports 1 x SFP28 (1 x 25GbE). Supports 2 x 1GbE, 2 x 10GbE4, 6 x USB 3.2 Gen 2, 2 x M.2 2280, 1 x M.2 Ekey (Support both WiFi AEKey), 1 x M.2 Bkey (LTE,5G).
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Product
5G Carrier Acceptance Test System
NetOp
Test System
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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Product
AI Inference System Based On NVIDIA Nova Orin For AMR Applications
MIC-732-AO
Edge AI Inference System
Fanless and ultra-compact design. Embedded with NVIDIA® Jetson AGX Orin™ up to 275 TOPS. Supports 1 x 10GbE, 1 x 2.5GbE, 3 x USB 3.2 Gen 2 (10 Gbit/s). Supports 2 x CANbus, 1 x mPCIe, 2 x Nano SIM slots. Support Total 8-ch GMSL3.0/2.0 with FAKRA connectors.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
ICT Probes
Merica Series-MPI50
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minimum center: 1.27mm (50mil)Current Rating: 3 amps, continuousContact Resistance: 60 milliohmsMounting Holes Size: 1.0Full Stroke: 6.35mmRated Stroke:4.30mmSpring Force: 150gf(5.5oz)
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
ICT Probes
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ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Single-TAP CFM JTAG Controller for Teradyne ICTs
USB-1149.1/CFM
Controller
The USB-1149.1/CFM High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.
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Product
Data Processing System
CRS-D8I-3VF1
System
The CRS-D8I-3VF1 VPX system’s I/O flexibility is capable of meeting a large number of configurations. It is designed to support Abaco Systems’ Intel 3rd generation Core i7 3U SBCs, Gigabit Ethernet switch, video compression card, CUDA-based graphics cards and a MIL-STD-1553/ARINC429 multi-protocol card.
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Product
VME Data Acquistion System
ADM-31
System
The VME-based ADM31 data acquistion system supports up to 48 differential or up to 96 single-ended analog inputs. The ADM31 control card is an intelligent A/D subsystem master or slave device that controls the analog A/D cards. Up to two A/D cards can be configured with the control card to complete the A/D system.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
ICT Probes
Merica Series-MPAL50
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Minimum Center: 1.27(50mil)Current Rating: 3amps, continuousCurrent Resistance: 60milliohmsFull Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 185/227gf(7/8oz)
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Product
ICT Tester
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Adapter design, assembly and validation for Agilent, Keysight, HP, Checksum, Spea. Preparing and debugging ICT scripts. ISP Programming Integration. Integration of edge scan testing, Jest testing, digital testing, semi-functional testing, IC programming, FINN probes, and more
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