ICT
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: ICT Systems, In-Circuit Test
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
ICT Test Probes
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C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Product
In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Product
ICT Programmer
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Compatible with a wide range of microcontrollers in electronic devices. Supports programming of single product or bulk PCBA boards. Enables quick replacement of the adapter or dedicated product inserts. Equipped with a high-performance, multi-channel industrial ISP programmer.
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Product
ICT/FCT-Fixtures (Large IF)
GenRad CK-2-228X
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2-228X (Large IF) / 230532
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Functional & ICT Tester
igentic® 621t
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Growing demand for light emitting diode (LED) products and increasing testing complexity continue to challenge electronic printed circuit board (PCB) manufacturers. The igentic® 621t is a flexible PCB tester that ensures quality while increasing production. The tester can handle multiple PCB products and test for light measurements, resistance and push button or post detection, as required.
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Product
Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Product
Automated ICT System
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With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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Product
Accessories: Fixture
ICT I3070
Accessory Kit
View ICT i3070 fixture accessories ranging from fixture kits to vectorless test items like nanoVTEP. You can conveniently select items/parts to request for a Quick Quote.
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Product
In Circuit Test Analyser (ICT)
n. v.
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The Feasa In Circuit Analyser (ICT) is available in 3, 5, 10 and 20 channel configurations. Interfaces for this are RS232 or 20-pin port. This model can also be "triggered" by a trigger.The devices with 3, 5 and 10 channels measure 100 mm x 29 mm x 50 mm - the model with 20 channels, on the other hand, measures 140 mm x 29 mm x 50 mm.Each channel has a fibre length of 0.6 m, whereby the fibre has a diameter of 1.0 mm and allows a bending radius of 15 mm.The analyser is designed for a wavelength range of 450 nm to 650 nm and a temperature range of 0 °C to +50 °C.ISSUE: Red, green, blue (RGB), hue, saturation, intensity (HSI), dominant wavelength, CCT, CIE xy, CIE u'v depending on interface.DRIVERS FOR SOFTWARE: Test model for Agilent i3070, test code for Teradyne, DLL for testing, function sequence input Labview, C++.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
In-circuit Test
i3070
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The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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Product
6TL36 Plus In-line Test Handler w/Bypass
EA923
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- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
ICT/FCT-Fixtures Max UUT370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
MMI-DV
100669
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Mechanical test fixture with optimised ergonomics for function tests, end tests and ICT applications. The MMI is prepared for safety switches with guard locking as well as for electrical interlocking. Our MMI-DV test fixture is highly versatile. Reinforced version!
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
MMI-DVH, Mechanical Test Fixture
100360
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Mechanical test fixture with optimised ergonomics for function tests, end tests and ICT applications. The MMI is prepared for safety switches with guard locking as well as for electrical interlocking. Our MMI-DVH test fixture is versatile and has a special cover height (internal cover dimension 114.5 mm). Reinforced version!
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Product
Boundary Scan Test (BST)
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In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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Product
Semiconductor & Electronic Systems Test and Diagnostics Services
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Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Product
Four Channel Relay Board for Power Supply Isolation
FXA-113 PSU Relay 4CH
Power Supply
The FXA-113 is a four-channel relay board designed as an output disconnect option for laboratory power supplies. Especially in ICT applications it’s important, that the power supply is completely isolated from the DUT during measurements. Therefor each channel features two high current relays for the power path and two reed relays for the sense path. All four channels are equipped with a status led and can be switched independently. In addition, it is delivered with an installed DIN rail carrier.
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Product
Function Test and In-Circuit Test
CT350
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ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Product
Spring Contact Probe
ICT
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LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
