IV Curve
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Product
Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture)
B1505AP
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B1505AP provides eight different pre-configured packages that satisfy a wide variety of power device measurement requirements. The package can be selected according to voltage / current range and the requirement for capacitance measurement.
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Product
Single Long Pulse Solar Simulator & I-V Test System
TriSOL SLPSS
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The OAI Test System for HIGH EFFICIENCY SOLAR CELLS overcomes the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match the cell’s dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell efficiency leading to increased profitability.
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Product
Stand-alone I-V Test Systems
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OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Product
Parameter And Device Analyzers, Curve Tracers
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Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Product
Curved Needle Test Systems
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Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Product
Curve Tracer
CS-10000 Series
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Hi-voltage devicesDevelopment of new devices (SiC/GaN)Automotive Companies
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Product
DELTA™ IV 4-zone Flow Ratio Controller
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DELTA™ IV 4-zone Flow Ratio Controller is a digital controlled, browser-enabled, process control instrument providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution for semiconductor, flat panel, and solar panel process uniformity and control. It is available in EtherCAT® or DeviceNet™ providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution.
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Product
Semiconductor Curve Tracer
CS-3000 Series
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*Max. Peak Voltage : 3,000V（HV mode）*Max. Peak Current : 1,000A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Product
Solar Cell I-V Characterization System
VS6821
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Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Product
Quick I/V Measurement Software For PXIe SMU
PX0109A
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The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Product
CAT IV 600 A TRMS Navigator Clamp Meter
ACD-50NAV
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ACD-50NAV clamp-on power meter offers AC current measurements to 600 A, AC/DC voltage to 1000 V, and wide jaws to accommodate large conductors. This clamp-on multimeter is ideal for industrial power monitoring and verifying system conditions.
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Product
Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Mainframe
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Parametric Curve Tracer Configurations
Keithley PCT
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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Product
BH Curve Tracer
6700BH Series
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This BH curve tracer is adopted pole coil measuring method. The limit of size and shape for measuring work is very little and it can measure the difference of both face and reverse side of magnet.
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Product
In-Line Light I-V Testing for Solar Cells
FCT-750
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In-line, light I-V and Suns-Voc measurements in a single flash at 2400 units per hour. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
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Product
1500V Multifunction I-V Curve Tracer
SOLAR I-Ve
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SOLAR I-Ve allows both testing a single-phase (three-phase with optional MPP300) photovoltaic system and verifying I-V curve. Thanks to remote unit SOLAR02, it is possible to test the system complying with the requirement of simultaneity as provided for by the reference standard. SOLAR02 is a datalogger which, synchronized with SOLAR I-Ve, acquires the data relevant to irradiation and temperature while tests carried out by SOLAR I-Ve are carried out.
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Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
Source Measure Unit
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Product
Multi-functional High-speed I-V Measurement System
“Rakit”
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Rakit is a maintenance device to measure current and voltage characteristics string by string, to grasp solar system characteristics, abnormal data, etc. The device comprising of I-V tracer, pyranometer, thermocouple, data logger, and "I-V data analyzer," the multi-functional analyzing software, provides accurate analysis report quickly. The I-V data analyzer is compatible with the following I-V tracers:
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Product
IV Characteristics Measurement Device Software
Keithley 2400, 2401 and Keithley 2450
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*Windows 10, Windows 11 (Compatible) RS-232C (Keithley 2400, 2401), USB (Keithley 2450)*NI GPIB can also be used (optional)*IPCE PEC-S02 can be used simultaneously. operation panel. *Everything from condition setting to measurement can be done on one screen.
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Product
IND AC/DC CAT IV TRMS Clamp Meter
ACDC-3400
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The Amprobe ACDC-3400 clamp multimeter is CAT IV rated to add an extra level of safety for high voltage, industrial or utility testing applications. It is an AC/DC current clamp meter and a voltage meter all in one.
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Product
Curve Tracer
CS-3000 Series
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CS-3300 / CS-3200 / CS-3100 three model line-up. Maximum peak voltage: 3,000V (high-voltage mode for all models) in CS-3000 Series.Maximum peak current: 1,000A (CS-3300 high-current mode). The CS-3000 Series are CE-marked and UL listed.
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Product
IND CAT IV TRMS Clamp Meter with Temperature
ACD-3300
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This CAT IV rated ACD-3300 IND Clamp On Tester is ideal for industrial applications and utilities that require an extra level of safety. Including True-rms sensing for accuracy, this clamp on meter’s extra large jaws can clamp on to those wide diameter wires making taking measurements in industrial environments simple.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
Curve Tracer
Series 5000C
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Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
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Product
Solar Cell I-V Characterization System
VS6825
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Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Product
Monochromator Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Using Type IV aberration-corrected monochromator gratings, a single concave grating disperses, collimates, and refocuses the light from the entrance slit onto the exit slit. Wavelength scanning is obtained through a simple rotation of the grating.The groove spacing of these gratings is computer-optimized to produce high quality images with a minimum of astigmatism and coma, even at large numerical apertures. Compared with Czerny-Turner monochromators (equipped with one plane grating, one collimating mirror and one focusing mirror), Type IV aberration-corrected monochromator gratings provide much better light collection efficiency and signal-to-noise ratio.
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
