IV Curve
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Pulsed IV
AURIGA 4850
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Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
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Product
Semiconductor Curve Tracer
CS-10000 Series
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This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
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Product
Goniophotometer For Luminaries Intensity Distribution Curve
LCG-1800
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Shenzhen Chuangxin Instruments Co., Ltd.
Mainly used to measure FL etc. When installing luminaires, the lighting center of luminare and the rotating center of rotating table shall be at the same position. In B- coordinates, luminaire axis is superposed with the horizontal axis of rotating table. In A- coordinates, luminaire axis is vertical with the horizontal axis of rotating table.
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Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
Source Measure Unit
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Product
SENSOR FOR THICK & CURVED MATERIALS
S3
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The smallest, simplest, most affordable high-precision non-contact sheet resistance sensor availableNon-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterReads any conductive coatingon even the thickest nonconductive substratesOptions include PC-based productivity software, stage, and morePerformance limited by "lift off" phenomenonelevation of sensor above conductive layer must be carefully controlled
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Product
Semiconductor Curve Tracer
CS-8000 Series
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The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
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Product
Automated I-V/AOI/EL and Sorting System
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OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Product
Parameter & Device Analyzers, Curve Tracer
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Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Series provides a wide selection of IV analyzers suitable to your specific measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Product
Stand-alone I-V Test Systems
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OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Precision Curve Tracer
CurveMasterTM
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The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power chip tester for years, so the CurveMasterTM is built with today’s components and technology. With all new high-accuracy DC Parametrics, you’ll enjoy the most powerful curve tracer you have ever used.
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Product
Triple Alarm CAT IV Non-Contact Voltage Detector with Flashlight
FLIR VP50-2
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The FLIR VP50-2 is a durable, CAT IV-rated non-contact voltage detector featuring light, vibration, and beeper feedback alarms and a powerful LED flashlight. Use the VP50-2 to reliably check if an AC circuit is live before beginning work; detect voltage on exposed conducting parts or through insulation; identify live wires within electrical panels, switches, and outlets; or trace live wires and map circuits. With an ergonomic and drop-tested design, the FLIR VP50-2 is the right choice for professionals performing field troubleshooting and verification of electrical installations within residential, commercial, and industrial buildings.
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Product
CAT IV 600 A TRMS Navigator Clamp Meter
ACD-50NAV
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ACD-50NAV clamp-on power meter offers AC current measurements to 600 A, AC/DC voltage to 1000 V, and wide jaws to accommodate large conductors. This clamp-on multimeter is ideal for industrial power monitoring and verifying system conditions.
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Product
IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
Mainframe
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Mainframe
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
IND CAT IV TRMS Clamp Meter with Temperature
ACD-3300
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This CAT IV rated ACD-3300 IND Clamp On Tester is ideal for industrial applications and utilities that require an extra level of safety. Including True-rms sensing for accuracy, this clamp on meter’s extra large jaws can clamp on to those wide diameter wires making taking measurements in industrial environments simple.
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Product
Solar Cell I-V Characterization System
VS6825
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Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Product
OPV/DSC/Perovskite IV measurement System
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King Design Industrial Co., Ltd.
The system can measurement the 3rd generation of solar cell IV performance. The system patent with eliminate capacity effect that can ensure the test repeatability coincidence.
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Product
Semiconductor Curve Tracer
CS-3000 Series
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*Max. Peak Voltage : 3,000V（HV mode）*Max. Peak Current : 1,000A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Product
Power Device Analyzer / Curve Tracer For Circuit Design
B1506A
DC Power Analyzer
The Keysight B1506A Power Device Analyzer / Curve Tracer for Circuit Design is a complete solution that can help power electronic circuit designers maximize the value of their power electronics products by enabling them to select the correct power devices for their applications. It can evaluate all relevant device parameters under a wide range of operating conditions, including IV parameters such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge, and power loss. The B1506A Power Device Analyzer/Curve Tracer for Circuit Design meets and exceeds all curve tracer capabilities.
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Product
IV Tester System
PET-CC
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Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Product
Light I-V Testing for Solar Cells
FCT-650
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Advanced analysis of solar cells including light I-V and Suns-Voc data.
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Product
Multi-functional High-speed I-V Measurement System
“Rakit”
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Rakit is a maintenance device to measure current and voltage characteristics string by string, to grasp solar system characteristics, abnormal data, etc. The device comprising of I-V tracer, pyranometer, thermocouple, data logger, and "I-V data analyzer," the multi-functional analyzing software, provides accurate analysis report quickly. The I-V data analyzer is compatible with the following I-V tracers:
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Product
43 Inch UHD C Type Curved LCD Curved Monitor
CRV-430WP
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Advantech CRV-430WP is designed with a 43 inch UHD C type curved LCD which features a1500R curvature. It supports 10 multi-touch controls.
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Product
Flat Field and Imaging Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
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Product
AC/DC CAT IV 600 A TRMS Navigator Clamp Meter
ACDC-52NAV
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The ACDC-52NAV clamp-on power meter is the ideal choice for jobs that require AC/DC current measurements to 600 A, AC/DC voltage to 1000 V and wide jaws to accommodate large conductors.
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Product
DELTA™ IV 4-zone Flow Ratio Controller
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DELTA™ IV 4-zone Flow Ratio Controller is a digital controlled, browser-enabled, process control instrument providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution for semiconductor, flat panel, and solar panel process uniformity and control. It is available in EtherCAT® or DeviceNet™ providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution.
