IV Curve
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Curve Tracer
CS-5000 Series
Maximum peak voltage: 5,000V (high-voltage mode for all models) in CS-5000 Series. Maximum peak current: 1,000A (CS-5300 high-current mode). The CS-5000 Series achieves 5,000V of max. peak voltage with the same physical size as the CS-3000 Series. Best suited for the measurement of a power devices that have 3.3kV and 4.5kV withstanding voltage.
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Curve Tracer
CS-3000 Series
CS-3300 / CS-3200 / CS-3100 three model line-up. Maximum peak voltage: 3,000V (high-voltage mode for all models) in CS-3000 Series.Maximum peak current: 1,000A (CS-3300 high-current mode). The CS-3000 Series are CE-marked and UL listed.
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Pulsed IV
AURIGA 4850
Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
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Curve Tracer
CS-10000 Series
Hi-voltage devicesDevelopment of new devices (SiC/GaN)Automotive Companies
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Goniophotometer For Luminaries Intensity Distribution Curve
LCG-1800
Shenzhen Chuangxin Instruments Co., Ltd.
Mainly used to measure FL etc. When installing luminaires, the lighting center of luminare and the rotating center of rotating table shall be at the same position. In B- coordinates, luminaire axis is superposed with the horizontal axis of rotating table. In A- coordinates, luminaire axis is vertical with the horizontal axis of rotating table.
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Semiconductor Curve Tracer
CS-5000 Series
*Max. Peak Voltage : 5,000V（HV mode）*Max. Peak Current : 1,500A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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I-V Tracers
EKO I-V tracers (MP-160 / MP-11 / MP-180) can be used in three different Power ranges. The research type MP-160 is an all round instrument to be used with single cells and modules or multiple unitswhen connected to the multi channels selectors. The portable MP-11 with remote sensor unit can be used on site to accurately check the performance of Modules and Strings. The high end MP-180 is capable to make high precision I-V measurements of small and large size solar cells and is most suitable for Research and Development applications or production inspection purposes indoors.
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Power Device Analyzer / Curve Tracer
The B1505A Power Device Analyzer / Curve Tracer is focused on the needs of power device manufacturers, while the B1506A Power Device Analyzer for Circuit Design is focused on the needs of power electronics circuit / product manufacturers. The B1507A Power Device Capacitance Analyzer helps both power device development engineers and power circuit designers maximize product value by revealing device capacitance characteristics.
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Curve Tracer
Series 5000C
Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
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Integrated I-V Test Systems
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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IV Characteristics Measurement Device Software
Keithley 2400, 2401 and Keithley 2450
*Windows 10, Windows 11 (Compatible) RS-232C (Keithley 2400, 2401), USB (Keithley 2450)*NI GPIB can also be used (optional)*IPCE PEC-S02 can be used simultaneously. operation panel. *Everything from condition setting to measurement can be done on one screen.
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IV Characteristics Measurement Device [
PECK2400-N
Easy-to-use measurement software supports IV measurement (software + source meter + connection cable) ● Compatible with Windows 10 ● RS-232C connection (PC is optional) ● Works with NI GPIB. ● Simultaneous use with IPCE PEC-S20 D type is possible. ● There is only one operation panel. done on one screen.
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OPV/DSC/Perovskite IV measurement System
King Design Industrial Co., Ltd.
The system can measurement the 3rd generation of solar cell IV performance. The system patent with eliminate capacity effect that can ensure the test repeatability coincidence.
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CAT IV 600 A TRMS Navigator Clamp Meter
ACD-50NAV
ACD-50NAV clamp-on power meter offers AC current measurements to 600 A, AC/DC voltage to 1000 V, and wide jaws to accommodate large conductors. This clamp-on multimeter is ideal for industrial power monitoring and verifying system conditions.
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Monochromator Gratings - Type IV
HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Using Type IV aberration-corrected monochromator gratings, a single concave grating disperses, collimates, and refocuses the light from the entrance slit onto the exit slit. Wavelength scanning is obtained through a simple rotation of the grating.The groove spacing of these gratings is computer-optimized to produce high quality images with a minimum of astigmatism and coma, even at large numerical apertures. Compared with Czerny-Turner monochromators (equipped with one plane grating, one collimating mirror and one focusing mirror), Type IV aberration-corrected monochromator gratings provide much better light collection efficiency and signal-to-noise ratio.
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Parameter & Device Analyzers, Curve Tracer
Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Series provides a wide selection of IV analyzers suitable to your specific measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Curved Needle Test Systems
Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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DELTA™ IV 4-zone Flow Ratio Controller
DELTA™ IV 4-zone Flow Ratio Controller is a digital controlled, browser-enabled, process control instrument providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution for semiconductor, flat panel, and solar panel process uniformity and control. It is available in EtherCAT® or DeviceNet™ providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution.
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Solar Cell I-V Characterization System
VS6825
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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2 Channel IV Analyzer / Source Monitor Unit
E5263A
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Quick I/V Measurement Software For PXIe SMU
PX0109A
The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Precision I/V Source
MeasureReady™ 155
The MeasureReady™ 155 Precision I/V source combines premium performance with unprecedented simplicity for materials scientists and engineers requiring a precise source of current and voltage. Low RMS noise: from 200 nV (10 mV)/7 pA (1 µA). Bipolar, 4-quadrant power source. DC and AC modes supported up to 100 kHz*. Full scale ranges from 10 mV to 100 V (1 μA to 100 mA). 0.001% programming resolution (from 100 nV/10 pA.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Parameter And Device Analyzers, Curve Tracers
Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Semiconductor Curve Tracer
CS-8000 Series
The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
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Multi-functional High-speed I-V Measurement System
“Rakit”
Rakit is a maintenance device to measure current and voltage characteristics string by string, to grasp solar system characteristics, abnormal data, etc. The device comprising of I-V tracer, pyranometer, thermocouple, data logger, and "I-V data analyzer," the multi-functional analyzing software, provides accurate analysis report quickly. The I-V data analyzer is compatible with the following I-V tracers:
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