IV Curve
-
Product
Photovoltaic Testers
-
A range of products to verify safety and efficiency of photovoltaic installations. This range includes 1500V I-V Curve Tracers, Insulation testers (IEC/EN62446), designed to provide more and more functional solutions for the activities to be performed.
-
Product
Pulsed IV
AURIGA 4850
-
Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
-
Product
Semiconductor Curve Tracer
CS-8000 Series
-
The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
-
Product
Semiconductor Curve Tracer
CS-10000 Series
-
This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
-
Product
BH Curve Tracer
6700BH Series
-
This BH curve tracer is adopted pole coil measuring method. The limit of size and shape for measuring work is very little and it can measure the difference of both face and reverse side of magnet.
-
Product
Monochromator Gratings - Type IV
-
HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Using Type IV aberration-corrected monochromator gratings, a single concave grating disperses, collimates, and refocuses the light from the entrance slit onto the exit slit. Wavelength scanning is obtained through a simple rotation of the grating.The groove spacing of these gratings is computer-optimized to produce high quality images with a minimum of astigmatism and coma, even at large numerical apertures. Compared with Czerny-Turner monochromators (equipped with one plane grating, one collimating mirror and one focusing mirror), Type IV aberration-corrected monochromator gratings provide much better light collection efficiency and signal-to-noise ratio.
-
Product
I-V Tracers
-
EKO I-V tracers (MP-160 / MP-11 / MP-180) can be used in three different Power ranges. The research type MP-160 is an all round instrument to be used with single cells and modules or multiple unitswhen connected to the multi channels selectors. The portable MP-11 with remote sensor unit can be used on site to accurately check the performance of Modules and Strings. The high end MP-180 is capable to make high precision I-V measurements of small and large size solar cells and is most suitable for Research and Development applications or production inspection purposes indoors.
-
Product
SENSOR FOR THICK & CURVED MATERIALS
S3
-
The smallest, simplest, most affordable high-precision non-contact sheet resistance sensor availableNon-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterReads any conductive coatingon even the thickest nonconductive substratesOptions include PC-based productivity software, stage, and morePerformance limited by "lift off" phenomenonelevation of sensor above conductive layer must be carefully controlled
-
Product
Power Device Analyzer / Curve Tracer
-
The B1505A Power Device Analyzer / Curve Tracer is focused on the needs of power device manufacturers, while the B1506A Power Device Analyzer for Circuit Design is focused on the needs of power electronics circuit / product manufacturers. The B1507A Power Device Capacitance Analyzer helps both power device development engineers and power circuit designers maximize product value by revealing device capacitance characteristics.
-
Product
Transistor Curve Tracers
-
Store characteristic curves and panel setting parameters. Programmable test conditions ,measured results PC stored. Three cursor measurement modes: point, line, window. Two cluster characteristic curves display simultaneouslyfor compare and pairing. Screen read outβ, gm, Vce, Ic, breakdown voltage, leakage current and other parameters . Repeat and single measurement. Self-checking function . 7 Inch high-resolution TFT color LCD. Standard interface: USB, RS232, LAN
-
Product
Solar Cell I-V Characterization System
VS6821
-
Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
-
Product
Semiconductor Curve Tracer
CS-5000 Series
-
*Max. Peak Voltage : 5,000V(HV mode)*Max. Peak Current : 1,500A(HC mode)*Equipped all models with LEAKAGE mode (Cursor resolution 1pA)*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
-
Product
Parameter And Device Analyzers, Curve Tracers
-
Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
-
Product
Pulsed IV Systems
AM3200-Series
-
AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
-
Product
Parametric Curve Tracer Configurations
Keithley PCT
-
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
-
Product
Goniophotometer For Luminaries Intensity Distribution Curve
LCG-1800
-
Shenzhen Chuangxin Instruments Co., Ltd.
Mainly used to measure FL etc. When installing luminaires, the lighting center of luminare and the rotating center of rotating table shall be at the same position. In B- coordinates, luminaire axis is superposed with the horizontal axis of rotating table. In A- coordinates, luminaire axis is vertical with the horizontal axis of rotating table.
-
Product
IV Tester System
PET-CC
-
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
-
Product
Quick I/V Measurement Software For PXIe SMU
PX0109A
-
The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
-
Product
Curve Tracer
Series 5000C
-
Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
-
Product
Integrated I-V Test Systems
-
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
-
Product
In-Line Light I-V Testing for Solar Cells
FCT-750
-
In-line, light I-V and Suns-Voc measurements in a single flash at 2400 units per hour. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
-
Product
AC/DC CAT IV 600 A TRMS Navigator Clamp Meter
ACDC-52NAV
-
The ACDC-52NAV clamp-on power meter is the ideal choice for jobs that require AC/DC current measurements to 600 A, AC/DC voltage to 1000 V and wide jaws to accommodate large conductors.
-
Product
Multi-functional High-speed I-V Measurement System
“Rakit”
-
Rakit is a maintenance device to measure current and voltage characteristics string by string, to grasp solar system characteristics, abnormal data, etc. The device comprising of I-V tracer, pyranometer, thermocouple, data logger, and "I-V data analyzer," the multi-functional analyzing software, provides accurate analysis report quickly. The I-V data analyzer is compatible with the following I-V tracers:
-
Product
Semiconductor Curve Tracer
CS-3000 Series
-
*Max. Peak Voltage : 3,000V(HV mode)*Max. Peak Current : 1,000A(HC mode)*Equipped all models with LEAKAGE mode (Cursor resolution 1pA)*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
-
Product
Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture)
B1505AP
-
B1505AP provides eight different pre-configured packages that satisfy a wide variety of power device measurement requirements. The package can be selected according to voltage / current range and the requirement for capacitance measurement.
-
Product
OPV/DSC/Perovskite IV measurement System
-
King Design Industrial Co., Ltd.
The system can measurement the 3rd generation of solar cell IV performance. The system patent with eliminate capacity effect that can ensure the test repeatability coincidence.
-
Product
Power Device Analyzer / Curve Tracer
B1505A
-
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
-
Product
Automated I-V/AOI/EL and Sorting System
-
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
-
Product
IV Characteristics Measurement Device Software
Keithley 2400, 2401 and Keithley 2450
-
*Windows 10, Windows 11 (Compatible) RS-232C (Keithley 2400, 2401), USB (Keithley 2450)*NI GPIB can also be used (optional)*IPCE PEC-S02 can be used simultaneously. operation panel. *Everything from condition setting to measurement can be done on one screen.





























