-
Product
HPA-40 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
-
Product
Analyzer Probes
-
The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
-
Product
Probes
-
Prepare the IM6/Zennium for special fields of application like high impedances, low impedances, very low capacitance or boost the compliance voltage.
-
Product
SPM Probes
-
AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
-
-
Product
Probes
RTD
-
No matter the application, ThermoWorks has a probe for you: penetration probes, immersion probes, air probes, surface probes, wire probes, even specialized probes like griddle probes, burger probes, pipe clamp probes, and probes for medical and lab use. Choose from standard tip, reduced tip, corkscrew tip, alligator clip, or needle probes; different handle types; and straight, coiled, stainless overbraid or even armored cables. Sensor types include type T or type K thermocouples, RTD sensors and our Pro-Series® line of thermistor probes.
-
Product
Probes, Clamp-On
EM-6981 | 9 KHz – 110 MHz
-
Current probes enable you to measure conducted current without direct connection to the circuit under test by clamping around the conductor, current carrying wire or structural member being tested.
-
Product
High Impedance Active Probes
34A
-
Engineered to meet the stringent demands of advanced high frequency circuit designers. This high impedance probe combines full DC capability, rise/fall times of 120 ps, and a nominal loading input impedance of 10 megohm shunted by 0.1 pf. Signal attenuation is 20:1 with a 50 ohm oscilloscope input.
-
Product
Mercury Probes
-
Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
-
Product
T3 Low & High Voltage Differential Probes
T3 Series
-
Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
-
Product
Test Probes
-
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
-
Product
Hall Effect Probes
-
Magnetic Instrumentation manufactures Hall Effect Probes in a wide range of styles and sizes. Probes are supplied with magnetic, electrical, temperature stability and calibration data for each measurement range.
-
Product
Spring Contact Probes
-
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
-
Product
Threaded Step Probes
Step Probe
Pin position sensing - adjustable height - custom designs - anti-jump solution.
-
Product
Mid Bus Probes
MBP850
-
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
-
Product
Soil Temperature Probes
TP32MTT.03 / TP32MTT.03.1
-
The temperature probe TP32MTT.03 is equipped with seven Pt100 1/3 DIN sensors for measuring the temperature at the depth of: +5 cm, 0, -5 cm, -10 cm, -20 cm, -50 cm, -1 m with respect to the ground level, according to the WMO indications.
-
Product
TSP157 Switch Probes
Switch Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 984Overall Length (mm): 25.00Switch Point (mil): 67Switch Point (mm): 1.70
-
Product
Ultrasonic Probes And Cables
-
The cable connects the main body of ultrasound diagnostic equipment and the probe used for echographic investigation.
-
Product
Medical Temperature Probes
-
types include: skin medical temperature probes, general purpose medical probes, esophagael/stethoscope medical temperature probes and foley catheter medical temperature probes.
-
Product
DDR4 MSO Probes
-
The DDR4 DIIM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR4 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR4 signals for convenient analog probing. The user can then easily observe both the digital and analog representation of the DDR4 Address, Command and Control bus. Solder down N5541A analog probes purchased separately from Keysight Technologies.
-
Product
General Purpose Test Probes
-
Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
-
Product
High Voltage Differential Probes
-
A high voltage differential probe is used for measuring the voltage difference between two test points where neither test point is at ground. High voltage differential probes from Tektronix can be used for signals up to 6000 V. These probes are the best choice for making non-ground referenced, floating or isolated measurements in large part due to their common mode rejection capability. These products are designed, manufactured, and serviced by Tektronix.
-
Product
Microwave Probes
D-Probe
-
With only two signal pins, D-Probes can perform accurate measurements without the need of nearby ground pads.
-
Product
Probes, Magnetic Field
EM-6880 | 9 KHz – 520 KHz
-
The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.
-
Product
Temperature Probes
-
Our Temperature Probes are ideal for the Instrumentation, medical, communication, machine builder and HVAC industries.
-
Product
Broadband Current Probes
-
Conducted currents can be measured without making direct contact with the source conductor or metallic surface by means of clamp-on broadband current probes. The BCP-5xx EMC Current Probes are designed to permit field intensity meters, spectrum analyzers, and other 50W impedance instruments to measure quantitative magnitudes of current.
-
Product
Semi-Rigid Test Probes Up to 6 GHz
-
Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
-
Product
HPA-52 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
-
-
Product
Near Field Probes 30 MHz - 6 GHz
XF Family
-
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
