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Jandel Four Point Probes
Jandel probe heads are manufactured solely by Jandel Engineering Limited and there is one to fit all mountings and systems known to us.
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Photometric Probes for Illuminance
LPPHOT03… Series
The probe LPPHOT03 measures illuminance (lux), defined as the ratio between the luminous flux (lumen) passing through a surface and the surface area (m²). The spectral response curve of a photometric probe is similar to the human eye curve, known as standard photopic curve V(λ). The difference in spectral response between LPPHOT03 and the standard photopic curve V(λ) is calculated by means of the error f’1.
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Microscopic Four-Point Probes
M4PP
CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Differential Probes (8-30 GHz)
The DH series of 8 to 30 GHz active differential probes provides high input dynamic range, large offset capability, low loading and excellent signal fidelity with a range of connection options.
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High-Current Leaf Spring Probes
Made for flat contacts - fully customizable - great contacting.
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Hall probes
Axial, transverse, multi-axis, and tangential Hall probes for measuring magnetic flux density. Choose from a wide range of lengths and thicknesses—probes are also available for cryogenic applications.
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High Force Type Spring Probes
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Specialist Test Probes
High Current Test Probes, Ultra-high Current Test Probes,Kelvin Test Probes, High Frequency Test Probes, Switching Test Probes
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BIP-12 Battery Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Resistance Remark: Probe Resistance Steel: 30 mOhms, Gold plated: 100 mOhmsTest Center (mil): 260Test Center (mm): 6.60Full Travel (mil): 394Full Travel (mm): 10.00Recommended Travel (mil): 315Recommended Travel (mm): 8.00Overall Length (mil): 1,220Overall Length (mm): 31.00
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Probes, Magnetic Field
EM-6880 | 9 KHz – 520 KHz
The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.
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BPLT-1 Long Travel Bead Probes
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Probes for Tube Inspection
Probes for tube inspection are lightweight but solidly constructed eddy current, remote field, magnetic flux leakage, and IRIS ultrasound. These probes are used for ferromagnetic or non-ferromagnetic tube inspection applications.
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C-S General Purpose Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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Probes, Clamp-On
EM-6980 | 20 Hz – 50 KHz
Current probes enable you to measure conducted current without direct connection to the circuit under test by clamping around the conductor, current carrying wire or structural member being tested.
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A-A-S General Purpose Probes
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 310Overall Length (mm): 7.87Rec. Mounting Hole Size (mil): 31.5Rec. Mounting Hole Size (mm): 0.80Recommended Drill Size: #68 or 0.79 mm
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Contact Probes
Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Accessories, Styli & Probes
Pratt & Whitney Measurement Systems, Inc.
A Standard to Grow With
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CP-059-19 Battery Probes
Current Rating (Amps): 10Average Probe Resistance (mOhm): 25Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 40Recommended Travel (mm): 1.02Mechanical Life (no of cyles): 100,000Overall Length (mil): 276Overall Length (mm): 7.01
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TSP100 Switch Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Standard Pitch Spring Probes
Other than spring probes with gold plating, we have spring probe with anti-solder migration coating and plating that were developed by KITA. We also have anti-solder migration material for plunger tip. These are all included in “MARATHON” series. They have wide range of tip type for various use for every popular total length.
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Oscilloscope Probes
Connections to the ground of Oscilloscope Probes with the mini PCM Parrot Clip provide improved accessibility , reliability and accuracy. Ground clips for the oscilloscope probe were usually alligator clips but they have poor accessibility in narrow places due to the large jaws.
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Digital Inspection Probes
DI-1000
The ergonomically designed DI-1000 is Lightel’s all digital video microscope probe. It connects directly to your PC through the computer’s USB2.0 port. Featuring easy single finger focusing, a built-in image freeze/capture button, and detectable resolution to 0.5µm, the DI-1000 package includes our free ConnectorViewTM (standard) software, providing digital zoom, image display, image capture, auto-calibration and basic analysis tools.
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Fiber-Optic Probes
Once your Universal Light Probe Sensor has been selected best for your test, the two-part solution is completed by selecting the suitable Fiber Optic Probe which is best for your application.Fiber Optic Probes come in a variety of different aperture sizes, lengths and cable types to suit your application.
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Energy Probes
RjP-700 Series
The RjP-700 Series probes are designed to measure lower pulse repetition rate, longer duration pulses - up to 1msec pulse width at a maximum rep rate of 40Hz. This allows for measurement of pulsed flashlamps and other sources not possible with other probes. The combination of large area detector surface and long pulse width allow for measurements up to several Joules total energy. Integrated preamplifiers allow for longer probe-to-instrument cable runs, useful for manufacturing environments.
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High Impedance Active Probes
12C
A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
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High Impedance Active Probes
28 AND 29
Designed to serve the needs of integrated circuit engineers working in the most advanced high speed, submicron, MOS technology. These high frequency instruments include the attractive features of the Models 18C and 19 including full dc capability, negligible dc current drain, and extremely low input capacitance. In addition the frequency range of the Models 28 and 29 has been extended to a full 1 GHz.
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Touch Probes And Vision Systems
HEIDENHAIN offers universal, high-accuracy touch probes for machine tools, enabling exact tool measurement, edge measurement on parts, and more. Proven technologies, such as wear-free optical sensors, collision protection, and integrated cleaning blowers, make these touch probes a dependable asset for tool and part measurement. The vision systems from HEIDENHAIN can also be conveniently deployed to monitor tools for even greater process reliability.
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Frequency Shaped Isotropic Electric Probes
PI-SH-FCC, PI-SH-ICNIRP
An isotropic electric field probe with shaped frequency response meeting the ICNIRP or FCC RF safety standards for occupational and general public exposure limits (see the specified frequency ranges below). Meter readings are shown in % of the STD – standard reference level, eliminating the need to know the source frequency. Probe output is proportional to RF power density in the whole specified power range, producing the correct RF power measurements in single and multi-signal environments, typically present at multiple antenna sites.
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Low Voltage Differential Oscilloscope Probes
Differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a Tektronix low voltage differential oscilloscope probe ensures that you see every possible detail. Tektronix offers TriMode™ architecture which streamlines measurement acquisition by enabling you to make differential, single-ended, and common mode measurements with a single connection!
