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Product
High Frequency Coaxial Analytical Probes
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D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm differential, single-ended probe.
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Product
Multi-Purpose Probes
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*For All your Functional Test Needs *Machine Building *end of line test
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Product
RF/High Frequency Probes
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Everbeing is proud to distribute GGB Industries line of PicoProbes for customers everyday RF probing needs. The popular model 40A has been serving the needs of many high frequency researchers in the sub-40 GHz range. For more information on their products, visit www.ggb.com. If a product they sell is not shown here, we are still able to acquire for you. Please contact us for more details.
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Product
Raman Probes
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As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
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Product
General Purpose Probes
PIT-12
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PIT-12 General Purpose Probe for Pressurized Systems - 12'' #304 stainless steel shaft. Diameter is 1/16''. Immersible. Maximum temperature 350°C, Time constant 0.5 Seconds. Shaft Terminated in a sub-miniature Type T Thermocouple plug. 10 foot Sub Miniature Type T extension lead supplied. Not isolated.
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Product
Optical Probes - Low Bandwidth
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Depend on Tektronix to provide you with performance you can count on, and industry-leading service and support.*Broad Wavelength Response 500 to 950 nm or 1100 to 1700 nm*High-bandwidth DC up to 1.2 GHz*High Gain 1 V/mW*Low Noise <11 pW/√Hz*Probe Connects to DPO7000*1 and DPO/DSA/MSO70000*2Series*SONET/SDH and Fibre Channel Reference Receiver Performance
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Product
CP-059-19 Battery Probes
Battery Probe
Current Rating (Amps): 10Average Probe Resistance (mOhm): 25Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 40Recommended Travel (mm): 1.02Mechanical Life (no of cyles): 100,000Overall Length (mil): 276Overall Length (mm): 7.01
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Product
Bead Target Probes
Bead Target Probe
A methodology for placing test points directly on a PCB's copper traces, or top metal, thus forming a “Bead Probe”.
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Product
BTP-72 Bead Probes
Bead Target Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Probes, Clamp-On
EM-6981 | 9 KHz – 110 MHz
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Current probes enable you to measure conducted current without direct connection to the circuit under test by clamping around the conductor, current carrying wire or structural member being tested.
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Product
Contact Probes
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Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Product
Ultrasonic Dual Element Probes
SONOSCAN T
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The ergonomic dual element probes for Non-Destructive Testing from the SONOSCAN Series comply with the DIN EN 12668-2 Standard and can be used to test metals, plastics and ceramics for imperfections such as cracks, inclusions, blowholes and other discontinuities. The transmitter-receiver probes manufactured in Germany are powerful, robust ultrasonic transducers which are compatible with the ultrasonic flaw detector SONOSCREEN ST10 or the thickness gauge SONOWALL 70.
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Product
Fiber-Optic Probes
Fiber-optic Probe
Designed with an unparalleled optical quality finish, Optomistic Products has developed a wide array of Fiber-optic Probes to accommodate your specific LED test requirement and mechanical constraints.
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Product
Test Probes & Clips
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CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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Product
Multimeter Test Probes
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Multimeter Test Probes, Voltmeter test leads,with the Parrot™ Clip Invention provide precise, HQ, accurate, reliable contacts and connections. Parrot™ Clips with HQ leads and banana plugs or other connectors are the best solution for DDM, analog multimeter for high voltage measurements as well as for high current measurements. Measurements with multimeter test probes require both: Hands-on direct point contact and grip on, Hands free removable connection.
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Product
CMM probes, Software and Retrofits
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The 5-axis measurement product range represents the biggest step-change in measurement capability ever introduced, delivering unprecedented speed and measurement flexibility, whilst avoiding the speed versus accuracy compromises inherent in conventional techniques. Whether the REVO scanning or the PH20 touch-trigger, Renishaw's 5-axis systems boost measurement throughput, minimise lead times and give manufacturers a more comprehensive appreciation of the quality of their products.
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Product
A-A-S General Purpose Probes
General Purpose Probe
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 310Overall Length (mm): 7.87Rec. Mounting Hole Size (mil): 31.5Rec. Mounting Hole Size (mm): 0.80Recommended Drill Size: #68 or 0.79 mm
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Product
Probes for Tube Inspection
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Probes for tube inspection are lightweight but solidly constructed eddy current, remote field, magnetic flux leakage, and IRIS ultrasound. These probes are used for ferromagnetic or non-ferromagnetic tube inspection applications.
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Product
Spring Probes
Spring Probe
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Product
Probes With Lead Wires
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Used when the probe is installed some distance from the logger, controller, or other data acquisition device. Available in a variety of lead wire types with stripped leads or connectors attached.
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Product
High-Current Leaf Spring Probes
Spring Probe
Made for flat contacts - fully customizable - great contacting.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF2 set
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The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
RF Radio - Frequency Probes
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*3 to 6 Ghz *PCB MCX SMB SMC *SMA U. FL MS / MM Fakra *Exchangeable inner plunger
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Product
High Impedance Active Probes
18C & 19C
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High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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Product
SPM Probes
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AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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Product
Probes
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SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Product
SAX Test Block & PAX Probes
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The SecuControl SAX is a versatile, space-efficient, and two-in-one terminal and test block that brings safety and consistency to substation testing. Its finger-safe design, keyed PAX/STP plugs, make-before-break operation and built-in CT shorting deliver reliable secondary injection without wiring changes or open-circuit risks. Ideal to modern substations where speedy deployment and simplicity are key.
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Product
LED Probes for testing
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Advanced Probing Systems, Inc.
Probe Needles are used for the fabrication of most probe cards, however there exist applications for which these materials may not be appropriate, e.g., hubrid device and gold pad probing.
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Product
Probes & Flow Cells
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The sample interface is a virtual “windows into the process” and is a critical component of any optical analyzer system. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV/Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal transmission for long-term reliable measurements.
