Power Test Systems
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Diving Technology Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
The imaging ultrasonic testing systems of the USPC 30XX series are optimized for testing a wide variety of materials and provide high-resolution findings in the form of A, B, C, D and F images. The hardware consists of an industrial PC, in which a motor controller and an ADC card are installed, as well as a HILL-SCAN pulser/receiver unit. An overview of the available systems is given in Table 1.
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Thermal Stability Test System
Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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Test System Elowerk
eloZ1
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the latest generation. It reliably finds connection errors and assembly errors in electronic assemblies. The test electronics can be integrated both in table systems and in inline systems.
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C-Mic Testing System
BK3010
The BaKo BK3010 is our main C-Mic tester. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is so easy and intuitive, we based the BK3012 D-Mic Tester on it. It is also the model for our BK9010B Fully Automatic C-mic Tester.
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Portable Test System
MT686s
Actual value, vector, curve displaypower generationerror measurementMeasurement of harmonics up to the 40thVoltage supply via existing measurement voltage
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Complete Power Quality Analysis System
PK4564-PRO+
This system contains the essentials for almost any power quality study in the world. Other tiers in the PK4564 class include the standard PK4564 and PK4564-PRO systems.
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Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Electric Vehicle Module Test System
FTV
Drive simulations with standard Electric Vehicle tests: FUDS, SFUDS, GSFUDS, DST and ECE-15LBattery Module TestingStart/Stop TestingTraction Battery TestingSupercapacitor / Ultracapacitor TestingDrive Cycle Testing
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RFID Test System
RFID test system of Peritec is making FPGA board (IF-RIO) the processing of the IF band. This reading of the code, called (Electronic Product Code) EPC is required for RFID tag ISO18000-6 TYPEC of (EPC C1 G2). However, it did not provide treatment too late in the traditional instruments.
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Advanced Power System - DC Power Supply, 9 V, 100 A, 1000 W
N6950A
When designing high performance ATE systems, there's an art to the tradeoffs you make when asked to "integrate fast and test faster within budget." That's why Keysight`s N6900 Series DC power supplies are small, flexible and market-leading fast. And with our VersaPower architecture, you can tune the N6900 for the optimum balance of test coverage, quality and time.
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1,000 Watt AC/DC (High Voltage Output) Power Supplies
56XS2
NAI’s 56XS2 is a conduction-cooled, 1,000 Watt AC/DC Power Supply that converts a 3-phase, AC input into a single HIGH VOLTAGE +270 VDC output at 1,000 Watts.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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(250 kN) Fatigue Testing System
8802
The Instron 8802 is a high stiffness, 250kN fatigue rated servohydraulic testing system that meets the challenging demands of both static and dynamic testing requirments. The 8802 systems include a range of configurations available to provide complete testing solutions to satisfy the needs of advanced materials and component testing. The design of the 8802 frame makes it ideal for installation within a laboratory environment, generally without the need for strangethened floors or raised ceiling heights.
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Multi-channel Optical Power Meter For Swept Test System
MPM-210HMPM-211, 212, 213, 215
Our MPM-210H is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings（AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210H allows the user to complete real-time high precision IL measurements.
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PIM Test Systems
AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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Flying Probe Test System
A8a
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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DC Power Module, 20V, 2.5A, 50W
N6733B
This module is used in both the small, multiple output 1U high N6700 Low-Profile Modular Power System (for ATE systems) and the multiple output N6705 DC Power Analyzer (for bench testing). GPIB, LAN, USB, and LXI compliance are standard. Select from more than 20 different DC power modules, ranging in capability from basic to high precision, and in power from 20 - 300 W.
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Diode Power Sensor
8487D
Excellent SWR for reducing mismatch uncertainty Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 50 MHz to 50 GHzDiode power sensing element
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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Annual testing of Automatic Identification System
AIS
The purpose of an annual testing is to determine that AIS is operational as defined in appropriate performance standards - the International Maritime Organization (IMO) Performance Standard (MSC 74(69)) and IEC standard, IEC 61993-2: Maritime Navigation and Radio Communications Equipment and Standards Automatic Identification Systems (AIS).
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Test System
ETS788XL
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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Electrodynamic Shock Test System
FS SERIES
The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
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Cable Fault and Test System Vans
Whether you are working on-site, in the countryside or an urban environment, having the right equipment available when conducting fault location operations is vital. When the correct tools can be accessed easily, fault-location time speeds up dramatically, and faults can be dealt with more efficiently. Megger’s range of cable test vans offer solutions to the challenges of fault location in the real world, no matter the environment. Our test van systems have been developed in collaboration with end users to ensure that they live up to the standards of daily fieldwork. Our vans are designed to be adaptable to the end users needs so that the most appropriate tests may be carried out for the cable in question, regardless of whether it is low, medium or high voltage.
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AC Resonant Test System for CVT
XZB-H / 110
Wuhan Huatian Electric Power Automation Co., Ltd.
Adjustable resonance device for field calibration of capacitive voltage transformers up to 500kV.
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Small Device Noise Emission Test System
The Small Device Noise Emission Test System from VIacoustics is a turnkey solution for the measurement of noise emissions of small devices typically used in computers, consumer electronics, appliances and automobiles. The system includes all hardware and software necessary (see the components tab) for the determinations of sound power levels (1/3 octave band and A-weighted), emission sound pressure levels (normalized 1/3 OB, A-weighted and high resolution FFT) and *ISO 532B loudness. The system is designed to be operated by a technician for production level testing or to be used by an engineer in the product development process.
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80W Power Supply, 8V, 8A or 20V, 4A
E3644A
Keysight basic DC power supplies offer essential features for a tight budget. The single & dual output, 30-100 W GPIB E3640 series provide small, compact size for bench and system use; low output ripple and noise; and built-in measurements and basic programmable features. The Keysight 80W, single output E3644A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
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Shock Test System, Battery Test
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's shock test system used to measure and determine the impact resistance of a product or package. It is mainly used to evaluate the reliability of the function and the integrity of the structure of the test product under impact environment. Suitable for impact testing of aerospace, aerospace, marine, military, consumer electronics, automotive, household appliances and display equipment.
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System on Demand (SoD): HiL Test System
System on Demand (SoD) is a unique, agile and standardized principle to design HiL test systems. SoD shifts the focus away from technical-only solutions to a proven automated design process – targeting our customer‘s real issues: time, budget and flexibility.
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