Showing results: 601 - 615 of 2622 items found.
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277 HP -
Standard Electric Works Co., Ltd
● 2 ranges for selection ( 2 function buttons ) LOW : 50V~1.5kV Press the LOW button, 277 HP is ready for low voltage detection. HIGH : 1.5kV~132kV Press the HIGH button, 277 HP is ready for high voltage detection.● Power consumption: Off : Less than 5uA Low voltage detection mode: Less than 40mA High voltage detection mode: Less than 40mA● Circuit test function Press the Test button to make sure the whole circuit is working well before testing actual high voltage circuits.● Optional accessory: HS-175 Telescopic hot stick (triangle-type) HS-120 Hot stick
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Aries
48Pin .5mm QFP to 48Pin .6 Dip Adapter. Makes 48 pin QFP prototype circuits with a standard bread board easy.
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3690-15 -
VECTOR Electronics and Technology, Inc.
Contact fingers at the other end of extender card are gold plated provides low insertion force and positive contact with printed circuit boards.
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PMK Mess- und Kommunikationstechnik GmbH
It is used to test and measure the current in a circuit. These are simple devices which are coated and colored to indicate positive and negative with the device connector on one end.
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D1 International
Universal Input 85-264 VACContinuous Short Circuit ProtectionPCB MountableEfficiency to 82%Industry Standard Pin OutMeets, UL, CSA, TUV CE
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STS 3000 LIGHT -
Altanova Group
STS 3000 light is a testing system designed to perform Tan Delta and capacitance measurement on CTs, VTs, Power Transformer and Circuit Breaker
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EMC Technologies Inc.
EMC Technologies’ design team has developed a variety of test adaptors and test stations for testing RF circuit assemblies and microwave sub-assemblies.
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Insight Product Company
Insight Product Company offers Low-Noise Parametric Amplfiers based on Monolithic Integrated Circuits (MIC) in the frequency range of 30 to 100 GHz.
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72-9390 -
Tenma
The model is 3,000 counts pen type digits circuit with professional multimeter IC as its core and has full range overload protection.
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Scientific Computing International
A procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits on semiconductor wafers in semiconductor device fabrication process.
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DER EE Electrical Instrument
A clamp meter is convenient for measuring instruments that allows the measurement of current simply by clamping a wire while being energized without cutting a circuit. In cases of measurement by a multitester and digital multimeter, the circuit must be cut to measure current. In contrast, with a clamp meter, current can be measured simply by clamping a live wire over its sheath. In addition to its simple operation, it allows safe measurement of a higher current.
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NF Corp.
A/D converted input signals undergo discrete Fourier transform (DFT) to calculate complex impedance values and obtain parameters and characteristics specific to the DUT, such as its capacitance, inductance and quality factor. Original NF algorithms are also applied to allow equivalent circuits made up of R, L and C along with the constants for those circuits to be estimated from the complex impedance spectrum obtained by sweeping the frequencies.
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Circuit Check, Inc.
Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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EM-6873 | 20 Hz – 100 KHz -
Electro-Metrics Corp.
The EM-6873 Loop Sensor Antenna uses passive circuits to transform magnetic field components between 20 Hz – 100 kHz to an equivalent open circuit two-terminal voltage on the receiving instrument. Use of the conversion Factor Chart, supplied with each antenna, will yield the strength of the magnetic induction field referenced to a uniform field. The loop is electrostatically shielded and therefore is sensitive only to the magnetic component (B-field) of the electromagnetic fields.