DAQ Systems
Sense, log and store information.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
Simulation Systems
System
Bloomy offers Simulation Systems for Hardware in-the-Loop (HIL) and open loop test of electronic controls and mechanical actuators for all types of transportation and defense systems including aircraft, rail, automobiles and ships. These systems, now deployed at major aerospace, locomotive and military manufacturers and research facilities worldwide, provide world-class, high-fidelity simulated environments for use in both closed-loop and open-loop testing. Because Bloomy’s Simulation Systems are largely constructed from COTS components, time to first test can be reduced significantly, and their highly-customizable nature allows your test system experts to provide your unique IP to differentiate your product from your competitors.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
High-Speed Signal Recording Systems
System
GaGe has a long history of providing high-speed, real-time signal acquisition, processing, and recording systems on PC-based platforms. This expertise saves customers time and eliminates uncertainties and risks with self-integrated systems.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Dual Sensor Enhanced Vision Systems
EVS
System
Enhance your safety and situational awareness while flying with Max-Viz dual sensor enhanced vision systems (EVS) from Astronics. These multi-spectral imagers include a long wave infrared sensor, a visible light + near infrared sensor, and patented blending and dynamic range management image processing to enable pilots to see clearly during day and night.
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Product
2-Channel DAQ Module
FMC150
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Sundance Multiprocessor Technology Ltd.
The FMC150 is a dual channel ADC and dual channel DAC FMC daughter card. The card provides two 14-bit A/D channels and two 16-bit D/A channels which can be clocked by an internal clock source (optionally locked to an external reference) or an externally supplied sample clock. In addition there is one trigger input for customized sampling control. The FMC150 daughter card is mechanically and electrically compliant to the FMC standard (ANSI/VITA 57.1).
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
DAQ Module
FMC-DAQ2P5
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Sundance Multiprocessor Technology Ltd.
ADC12J2700 – 12bit 2.7GSPS JESD204B.LM95233 for ADC temperature monitoring.JESD204B via HPC connector, 8 lanes 5.4Gbps per lane.AD9136 – 16-bit dual channel 2.8GSPS JESD204B DAC.HMC7044 – High performance 3.2GHz JESD204B jitter attenuator.
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Product
IFC Antennas & Radome Systems
System
System solutions providing inflight internet and live TV connectivity including satellite communications (SATCOM) systems, protective radome enclosures, antenna mounts, bird strike solutions, and adapter plates.
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Product
Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
Test System
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Portable DAQ
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A compact, battery-powered, and mobile instrument used to measure, record, and analyze physical signals (voltage, temperature, vibration) in field, lab, or industrial settings.
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Product
Edge AI HPC System
AIR-500D
Edge AI Inference System
Edge AI HPC system powered by Intel® Xeon® D-1700 Series processors with support for up to 4 PCIe slots. Intel® Xeon® D-1700 series processor 4x DDR4 SO-DIMM sockets support ECC/nonECC memory up to 128GB.
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Product
Ethernet Multifunction DAQ Device
T4
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USB or Ethernet multifunction DAQ device with up to 12 analog inputs or 16 digital I/O, 2 analog outputs (10-bit), and multiple digital counters/timers. For more information on the T4 take a look at the T4 product announcement news post.
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Product
AI Inference System Based On NVIDIA Nova Orin For AMR Applications
MIC-732-AO
Edge AI Inference System
Fanless and ultra-compact design. Embedded with NVIDIA® Jetson AGX Orin™ up to 275 TOPS. Supports 1 x 10GbE, 1 x 2.5GbE, 3 x USB 3.2 Gen 2 (10 Gbit/s). Supports 2 x CANbus, 1 x mPCIe, 2 x Nano SIM slots. Support Total 8-ch GMSL3.0/2.0 with FAKRA connectors.
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Product
DAQ User Interface Software
DAPstudio 3.00
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If you need to deliver a data acquisition system quickly and you want to develop a good user interface for it, then download DAPstudio 3.00 and see how that could help. You now can use the latest (full) version of DAP Measurement Studio software from Microstar Laboratories, maker of Data Acquisition Processor (DAP) boards and software, for an unlimited trial period at no charge.
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Product
Serial-to-Daq Minibox
Model 2367
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* 2367 provides 32 digital I/O lines, 4 analog outputs, 6 analog inputs, 6 relay driver outputs and 4 temperature inputs.* Firmware supports ASCII command strings, Addressed commands for RS-485 networks and packet protocol. * Operates as a RS-232 as a RS-485 to Data Acquisition Module. * DB-25 connector has both RS-232 and RS-485 signals.* SCPI commands and IEEE 488.2 compatibility provide GPIB like operation over the serial link. * The 2367 is packaged in a CE approved Minibox™ metal case to minimize EMI/RFI. * 1 U high Rack Mounting Kit mountsone or two 4867s.* Plug-on Terminal Board simplifies wiring connections.* Includes Universal Power Adapter and 62-pin mating connector.
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Product
Scienlab Battery Test System – Module Level
SL1001A Series
Test System
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Portable DAQ & Signal Analyzer
ObserVR1000
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Vibration Research Corporation
Collect data with the press of a button using the battery powered ObserVR1000 hardware and a mobile interface. Stream to the SD card while running other test modes, or use independently as a field data recorder and analysis package.
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Product
Counter DAQ Cards
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Counter card series include pulse output, event counting, PWM measurement/output and encoder reading functions.
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
High Speed Ethernet DAQ
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Ultraview's ethernet based acquisition boards bring low noise, large channel count solutions to common open-source platforms. The flexibility of being able to combine a large number of publicly available firmware/software modules with laboratory quality data acquisition chips makes many previously difficult project integrations possible at a fraction of the cost of developing the entire system.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
