Correlators
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Product
Smart Factory Solutions
Smart4Metrics Factory 4.0
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Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
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Product
Frequency Response Analyser
DP-cPCI-7554
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DP-cPCI-7554 is a cPCI module capable of analyzing the phase and gain characteristics of a system. The system under test is stimulated by the user defined waveform. The obtained response is correlated with the applied stimulus by the on-board DSP processor to determine the phase difference and the gain.Gain and the face analysis is carried out only at sine waveform.
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Product
Modulation Distortion Up To 13.5 GHz
S930701B
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S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
PCI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.8 MS/s), 24 DIO PCI Multifunction I/O Device
779109-01
Multifunction I/O
The PCI‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Intel Atom® Processor-Based Embedded IoT Gateway Platform
MXE-200i Series
IoT Gateway Platform
ADLINK's new Matrix MXE-200i series Embedded IoT Gateway Platform is based on the Intel Atom® SoC processor E3826 and has superior-class construction meeting a wide variety of specific industrial needs. Supporting Intel® IoT Gateway, with pre-loaded Wind RiverR IDP XT 2.0/3.1 enabling full IoT function, the MXE-200i series offers the most reliable Embedded IoT Gateway for use in harsh environments, compliant with industrial grade EMI/EMS (EN61000-6-4,61000-6-2), protecting customer assets and reducing TCO. Opposing conventional correlations between size and computing power, the MXE-200i series features large-scale performance in an ultra-compact package.
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Product
Innovative Software Tool Solutions
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IoT brings networking to a wide range of potential "things" ranging from everyday devices to sensors and actuators. Telchemy's management architecture is uniquely designed to handle massive numbers of devices, providing data correlation, reporting and action triggers.
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Product
Mid-Range Gas Filter Correlation Carbon Monoxide Analyzer
Model T300M
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The Model T300M CO analyzer measures low to mid ranges of carbon monoxide by comparing infrared energy absorbed by a sample to that absorbed by a reference gas according to the Beer-Lambert law. Using a Gas Filter Correlation Wheel, a high-energy IR light source is alternately passed through a CO filled chamber and a chamber with no CO present. The light path then travels through the sample cell, which has a folded path of 2.56 meters.The energy loss through the sample cell is compared with the span reference signal provided by the filter wheel to produce a signal proportional to concentration, with little effect from interfering gases within the sample. This design produces excellent zero and span stability and high signal to noise ratio, allowing excellent performance from low to high range.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel, or via RS232, Ethernet, or USB com ports, either locally or by remote connection.The Model T300M comes with NumaView™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView™ Software.
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Product
Digital Image Correlation (DIC) Measurement System
EduDIC
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EduDIC is a complete Digital Image Correlation (DIC) measurement system, designed as a simple and convenient educational training tool for academic courses in experimental solid mechanics. This easy-to-use system allows academic instructors to effectively present the optical measurement technique of DIC for materials testing to the engineers and scientists of tomorrow.
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Gas Gravitometers
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Gas gravitometers provide a simple, reliable method of measuring the specific gravity of a gas or analysis of the composition of the process gas when specific gravity can be correlated to composition.
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Product
ENA-X Vector Network Analyzer
E5081A
Vector Network Analyzer
Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
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Product
Dielectric Loss Tangent and Transmission Attenuation Measurement System
RTS03
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RTS03 measures relative permittivity (dielectric constant), dielectric loss tangent in the frequency range between 5GHz and 26.5GHz based on a correlation between measurement frequency and transmission attenuation as the microwave passes through the flat plane sample.
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Product
Dual Port Simulator Fiber Channel XMC Module
XMC-FC4 Simulyzer
Simulator
*Two independent fiber channel ports*The two SFPs accept electrical as well as optical transceivers*Each port supports 1, 2, or 4 Gbps*Supports customer-specific defined transmission speed*Comprehensive decoding of FC-1, FC-2 and Upper Layer Protocol (ULP) frames*Triggering and filtering*Supports DMA for high-speed streaming*IRIG-B time code encoder / decoder for data correlation*Supports ULPs such as FC-AE-ASM, FC-AE-RDMA, FC-AE-1553 and FC-AV*Supports HS-1760E applications such as AS5653, AS5652 and AS5627*Optional fcXplorer, Windows-based FC simulation and analysis test software*FC SDK (Software Development Kit) provides drivers and APIs for Windows XP / 7,*Linux, VxWorks, QNX Neutrino RTOS and others on request
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Product
PCIe Gen3 4K at 500 Fps High Speed Compact Camera for Testing
CB160CG-LX-X8G3
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4K at 500 Fps High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
0.3M Integrating Sphere For Leds Luminous Flux Test
CX-0.3S
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Shenzhen Chuangxin Instruments Co., Ltd.
Thesystem are composed of integrating sphere, spectroradiometer and computer to determine the spectroradiometric and colorimetric parameters, e.g. spectral power distribution, chromaticity coordinates, correlated color temperature, color rendering index, color tolerance, color difference, luminous flux, current, voltage, wattage, etc.
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Product
Mid-Range Gas Filter Correlation CO Analyzer
Model N300M
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Teledyne Advanced Pollution Instrumentation
The Model N300M is a microprocessor-controlled analyzer used to determine the concentration of carbon monoxide (CO) in a sample gas. The analysis method is based on the Beer-Lambert law.The N300M uses Gas Filter Correlation (GFC) to overcome the interfering effects of various other gases (such as water vapor) that also absorb IR. The analyzer passes the IR beam through a spinning wheel made up of two separate chambers: one containing a high concentration of CO known as the reference, and the other containing a neutral gas known as the measure. The concentration of CO in the sample chamber is computed by taking the ratio of the instantaneous measure and reference values and then compensating the ratio for sample temperature and pressure.
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Product
Nanomechanical Instruments For SEM/TEM
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As the world leader in nanomechanical testing systems, Bruker makes it easy for you to conduct in-situ mechanical experiments in your microscope with the Hysitron PI Series PicoIndenters. Our unique transducer design delivers unmatched stability throughout your experiments, resulting in precise data even at the nanoscale. Video capture from the microscope enables real-time monitoring and direct correlation of mechanical data to microscope imaging. With solutions designed to fit many of the microscope brands in use, you are sure to find one that is ideally suited to your research.
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Product
Correlation Analysis
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EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Product
Modulation Distortion Up To 90 GHz
S930709B
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S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
High Power LED Photo-color-semi Automatic Selector
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Shenzhen Chuangxin Instruments Co., Ltd.
Can divide LED in to several groups by chromatic coordinates, correlated color temperature, dominant wavelength or luminous flux.
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Product
TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
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ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Product
Autocorrelators
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Opticala Autocorrelators are devices for measuring the intensity or field autocorrelation function of light, mostly used for determining the pulse width of picosecond or femtosecond pulses, to which an electronic apparatus such as oscillascope would be too slow. The basic principle of operation of an autocorrelator for a pulse width measurement is to check the correlation of the temporal pulse trace with itself.
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Product
PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
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4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
PCE Series Opto-Electric Measurement System
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Hangzhou Everfine Photo-E-Info Co., LTD
This system delivers various photometric, colorimetric and electrical parameters as required by CIE standards.Measurement parameters are luminous flux (with integrating sphere), relative spectral power distribution, chromaticity coordinate, CCT(correlated colour temperature), CRI (color rendering index), SDCM (standard deviation of color matching), color purity, peak wavelength, dominant wavelength, etc.
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Product
TCSPC Lifetime Fluorometer
DeltaFlex
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The DeltaFlex time correlated single photon counting (TCSPC) system is one of our Delta series of next generation time correlated single photon counting lifetime instrumentation. The DeltaFlex offers the ultimate in flexibility.
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Product
Phase Noise Analyzer
NXA-26
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This new NXA-26 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 26.5 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range. The NXA-26 combines over 25 years of Phase Noise Measurement Technology with an easy to navigate user interface. System operation requires minimal training that will have you making measurements in minutes.
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Product
Dynamic Calibration for ROSS Streak Cameras
DynaCal
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The DynaCal Optical Calibration Module (OCM) is designed exclusively for the Sydor ROSS Streak Camera to ensure accuracy, both over time and in situ, so you can be confident that the data from your shot is certified to be correlated to the calibration of your camera. The beauty of in situ calibration is that the cost of removing and resetting the camera is avoided—and so is the risk of the replacement of the camera and shifting or disturbing the sensitive nature of streak camera results. Only in situ calibration will reveal the real world effects of EMR, gravity, electronic noise and more when they distort your camera results.
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Product
Global Network Monitoring and Incident Response
NetOmni™
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NIKSUN NetOmni™ collects information (e.g., Logs, NetFlow, SNMP, Packets, etc) from all network applications, services, and their underlying infrastructure and prioritizes key service delivery, security, and compliance metrics. This enables powerful correlated dashboards and workflows from a single pane of glass.
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Product
STEREO PERFORMANCE METER
SPM-1
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The SPM-1 measures the stereo content present in any left and right audio program material. It measures 0-50 dB separation on live program material by cross correlating the right and left base-band audio information.
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
