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Materials Characterization
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The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
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Laser Diode Characterization Systems
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Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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Surface Analysis and Materials Characterization Services
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The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Material Characterization Products
MeasureReady®
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Unique real-time sampling architecture for synchronous sourcing and measuring.
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Fan Characterization Module
FCM-100
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Advanced Thermal Solutions, Inc.
The FCM-100 Fan Characterization Module is a specialized unit designed to test and characterize fans of various sizes and performance outputs. Using the FCM-100 Module in conjunction with pressure measurement equipment (such as the PTM-1000) and velocity measurement equipment (such as the eATVS); it is possible to develop fan curves (P vs. Flow rate) that can be used to verify fan manufacturer data or to characterize fans of unknown performance.
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Characterization Of VCSEL Arrays Including Polarization Analysis
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Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
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CMP Process and Material Characterization System
CP-4
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he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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Beam Characterization
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Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Pulse Characterization Sensors
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Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Frequency Converter Characterization With Wideband Modulated Signal
N5245BQ
Network Analyzer
The N5245BQ provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for frequency converter measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements
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Bench & Characterization Boards
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Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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PCB Material Characterization
N19308B
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PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
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Microwave Cavity Characterization
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Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
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Solar Cell I-V Characterization System
VS6825
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Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
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The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
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Solar Cell I-V Characterization System
VS6821
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Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
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Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Antenna Characterization
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Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Image Sensor Characterization Systems
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Image Sensor QE and Spectral Responsivity Characterization
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ALD Services
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Our ALD Services help engineers optimize, troubleshoot, and scale their processes, covering everything from custom process development to equipment calibration and advanced film characterization.
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Differential Scanning Calorimetry
Nano DSC
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The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Process & Material Characterization System
TriboLab CMP
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Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Nanomechanical Test Instruments
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
Digital Pattern
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Large Aperture Beam Profilers
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Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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Tactical Grade Inertial Measurement Unit (IMU)
ADIS16490 iSensor
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The ADIS16490 iSensor® device is a complete inertial system that includes a triaxial gyroscope and a triaxial accelerometer. Each inertial sensor in the ADIS16490 combines industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyroscope bias). As a result, each sensor has its own dynamic compensation formulas that provide accurate sensor measurements. The ADIS16490 provides a simple, cost-effective method for integrating accurate, multiaxis inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. The SPI and register structure provide a simple interface for data collection and configuration control.
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Comb Generators
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Keysight comb generators provide excellent phase and amplitude flatness making them ideal for use in phase calibration applications. A customer selectable USB-controlled frequency divider which allows for broad range of input signal frequencies from 10 MHz to 67 GHz and small minimum tone spacing of 10 MHz, makes Keysight comb generators suitable for characterizing non-linear devices.
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Parametric Curve Tracer Configurations
Keithley PCT
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Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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ST Connectors
FY7
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A straight tip or ST connector is characterized by its quick release bayonet style lock and spring loaded ferrule to hold the fiber. Most commonly used in network applications such as LANs, and Data Processing Networks, they are also found in Premise installations and Instrumentations applications. Horizontally mounted simplex and duplex adapters are available with metal or plastic housings.
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Temperature Calibration Software v5.1
MET/TEMP II
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MET/TEMP II software allows you to easily automate the calibration of a wide range of temperature sensors. It provides a comprehensive temperature calibration solution that allows you to test large quantities of sensors, calculate characterization coefficients, and print calibration reports. You can standardize comparison or fixed point calibrations and use multiple temperature sources or references in one test.
