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Product
On-Wafer Measurements
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Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
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Product
Regeneration Station
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This equipment is a stand-alone device that enables to coherently regenerate an optical signal allowing long-haul dissemination of an ultra-stable optical frequency reference. Its architecture is based on the heterodyne phase-locking of a narrow spectral width laser diode on the reference signal. The station is equipped with low phase noise optical interferometer that perform a thorough characterization of the phase noise accumulated by the incoming signal, and a compensation system of this phase noise.
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Product
Battery Capacity Analyzer
601B
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The 601B Battery Capacity Analyzer addresses the need to test and maintain sealed lead acid (SLA) batteries used in backup power UPS, emergency lighting, fire alarms, security systems, and many other electrical systems. By quickly characterizing a battery's response to a load resistance and measuring the battery's internal resistance, this meter displays the remaining battery capacity as an indicator of the battery’s health. Powered by the battery under test, the 601B supports testing of both 6 V and 12 V storage type lead acid batteries.
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Product
Serial Bit Error Ratio Testers
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Developing next-generation technology requires world-class signal integrity and analysis capability. Keysight offers the widest choice of serial bit error ratio test (BERT) products for accurate and efficient characterization, compliance, and manufacturing test for digital interfaces in computer, video, datacom, and telecom applications operating up to 40 Gb/s. Keysight’s breakthrough technology enables you to conquer even the most difficult measurement challenges.
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Product
Power Operational Amplifiers
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ST offers a portfolio of power op-amps characterized for high output current, low drop and high gain. This makes them suitable for a wide range of applications and, in particular, for driving inductive loads such as motors and lamps, as well as in automotive applications offering superior performances. Our op-amps are available in insertion and surface-mount packages to meet different environmental requirements.
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Product
Digital Interconnect Test System, Reference Solution
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When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Product
Optical Multiport Power Meter
N7745C
Power Meter
Keysight's popular N7745A optical power meters with eight power-sensor channels provide increased throughput and operational efficiency to meet today's challenges in manufacturing. Designed for characterizing optical multiport components, these optical power meters offer industry-leading solutions for device connectivity, high-speed measurement data acquisition and fast data transfer for post-processing. The multiport power meter enables fast measurement solutions for all multiport devices; for example multiplexers, PON splitters, wavelength selective switches (WSS) and ROADMs, as well as compact setups for simultaneous testing of multiple single-port devices.
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Product
PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
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The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Product
SparkFun Spectral Sensor Breakout
AS7262 Visible (Qwiic)
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The SparkFun AS7262 Visible Spectral Sensor Breakout brings spectroscopy to the palm of your hand, making it easier than ever to measure and characterize how different materials absorb and reflect different wavelengths of light. The AS7262 Breakout is unique in its ability to communicate by both an I2C interface and serial interface using AT commands. Hookup is easy, thanks to the Qwiic connectors attached to the board --- simply plug one end of the Qwiic cable into the breakout and the other into one of the Qwiic Shields, then stack the board on a development board. You’ll be ready to upload a sketch to start taking spectroscopy measurements in no time.
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Product
Oil-In-Water Analyzer
RTG100
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique which is a direct measurement on individual acoustic echoes that are characterized using advanced signal processing.
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Product
PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
Oscilloscope
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Product
Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Mainframe
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Strain Gage Testing
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Response Dynamics Vibration Engineering, Inc.
Although strain measurement is often a key part of a root cause diagnosis, our analyses often also involve measurements of other parameters such as acceleration, relative displacement, pressure, temperature, flow, speed, load, dynamic stiffness, etc, to explore multiple parameters that may have a cause/effect relationship with the problem at hand. These measurements form part of a fact based hypothesis for the cause of the problem at hand. We use stain gauge testing and/or stain modeling and analysis, in conjunction with our structural dynamics expertise to characterize all the important pieces of the puzzle that come into play with dynamic strain issues (See Diagnostic Testing).
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Product
Current-Voltage Measurement System
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The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Product
Soft Front Panel for NI RF Analyzers
NI RFSA Soft Front Panel
Analyzer
The NI RFSA Soft Front Panel helps you quickly view and analyze RF signals using PXI hardware from National Instruments. The soft front panel features built-in measurements such as third-order intercept (TOI), complementary cumulative distribution function (CCDF), adjacent channel power ratio (ACPR), occupied bandwidth (OBW), channel power, and transmit power. With these one-button measurements, you can quickly measure, display, and store results, which makes NI PXI instruments ideal for characterization and validation environments. You can also use the NI RFSG Soft Front Panel for generating continuous waveform (CW) or modulated RF signals.
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Product
Benchtop Research System
XENON X-1100
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The XENON X-1100 is the only low-cost benchtop Pulsed Light system that enables researchers to more easily characterize new processes using XENON’s proven technology.
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Product
Wide FOV Target Projector
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The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
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Product
Dynamic Image Analysis (DIA)
CAMSIZER
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Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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Product
Foundation IP
TSMC
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Our Foundation IPs embed power management features (multi-Vt/multi-channel libraries, multi-VDD characterization, integrated power-switches, source-biasing…) which allow designers to explore the SoC architecture. Optimal configurations can be generated to meet the application’s Performance, Power and Area constraints. We also complement our offering to reach best-in-class Energy Efficient SoC by serving Always-On power-domains with a dedicated offer, optimized to achieve the ultra-low-power requirements of battery-operated devices in sleep mode.
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Product
WaveMaster 8000HD High Bandwidth Oscilloscopes
WaveMaster 8000HD Series
Oscilloscope
WaveMaster 8000HD is the only high speed oscilloscope designed for all stages of product development, whether first-silicon characterization, link validation over channels, or debugging across the entire the protocol stack. No other high speed oscilloscope supports more engineering tasks with more unique tools.
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Product
PCI Express 4 CEM Receiver Test Automation
N5991PC4A
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The N5991PC4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 4.0 CEM Add-In Cards and systems
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Product
Connected Meteorology
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"Epi to Etch" - get full control of your frontend processes! The LayTec Connected Metrology® ecosystem enables improved process control characterizing complex layer stacks along the manufacturing chain. In a typical frontend production line, wafers are measured 3 or more times by LayTec products.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131H
Calibration Cable
The Keysight 85131H is a 62.2 cm (24.5 in) long1 flexible cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.25 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.5 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 3 inch radius. Stability1 of the Keysight 85131H is less than 0.12 dB and phase is 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Differential Scanning Calorimeters
MicroCal DSC Range
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The "Gold Standard" for structural stability analysis of biotherapeutics, biological macromolecules and polymers in solution. Are microcalorimeters are powerful tools which enable characterization of the thermal stability of proteins and other biomolecules, primarily for biopharmaceutical development and manufacture. They are used for general stability studies, for biosimilarity and batch-to-batch comparability assessment, and for the optimization of purification and manufacturing conditions. MicroCal PEAQ-DSC systems are simple to use, requiring little assay development, and no labelling or immobilization.
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Product
Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Product
Portable Cryogen-Free Cryocooler-Based Material Characterization Platform
PPMS® VersaLab™
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Quantum Design’s PPMS VersaLab is a portable, cryogen-free cryocooler-based material characterization platform. With a temperature range of 50 – 400 K, this 3 tesla platform is perfect for accomplishing many types of materials characterization in a limited space.
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Product
Heat Deflection Tester
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Apparatus is used to determine the Heat Deflection Temperature or the Vi cat Softening Point. All the specimens are charged with a constant load and immersed in a bath, where temperature is increased at a standard velocity. The attained heat resistance rate of plastic materials is a widely required parameter for product characterization, for quality control, as well as for evaluating their conformity to the previewed applications.
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Product
Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
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The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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Product
CD Measurement and Advanced Film Analysis
FilmTek CD
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Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Product
Parameter And Device Analyzers, Curve Tracers
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Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
