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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-03
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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wavefront sensors
HASO4 FIRST
HASO4 FIRST is the ideal choice for results driven professionals in domains including adaptive optics, optical process optimization, laser beam characterization, and many others. Thanks to our patented technology, the HASO family by Imagine Optic are world's only sensors with no bias error, keeping its phase accuracy on any measured intensity profile (Gaussian, Top-Hat, hyper Gaussian, etc.). The USB 3.0 connectivity and the ergonomic design allow an easy plug and play installation of the HASO4 FIRST in any application.
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Microcalorimeters
TA Instruments’ Isothermal Titration Calorimetry (ITC), Differential Scanning Calorimetry (DSC), and Isothermal Calorimetry systems are powerful analytical techniques for in-depth characterization of molecular binding events and structural stability. Thermodynamic binding signatures not only reveal the strength of a binding event, but the specific or nonspecific driving forces involved. Structural stability profiles from DSC reveal strengths and weaknesses in higher order structure and define the behavior of individual domains and their interactions. The TA Instruments Affinity ITC, Nano ITC and Nano DSC provide the performance, reliability and ease-of-use required for the most demanding applications in drug discovery, protein-protein interactions, structure-function characterization and more.
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PNA-X Microwave Network Analyzer
N5245B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Arbitrary Function Generator
HMF2525/HMF2550
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
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LXI Microwave Matrix, 20GHz, Single 4x4 With Loop-Thru
60-751-144-A
The 60-751-144-A is a single 4x4 20GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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InfiniiVision Oscilloscopes
3000A X-Series
100 MHz to 1 GHz, DSO and MSO modelsView time-correlated digital content with16 digital channels (MSO)Modulate signals within the scope with WaveGen, built-in 20 MHz function generator (optional)Quickly characterize signals with the built-in 3-digit voltmeter and 5-digit counter option Decode serial busses faster with hardware-based serial analysis options for CAN, LIN, IC, SPI, RS232 and more Protect your investment with full upgradability
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Generators and Sources
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Thermal Test Vehicles
TTV
Thermal Engineering Associates, Inc.
Using the TTC-1002 Thermal Test Chip as a basis, TEA offers TTVs in flip-chip, bare die, BGA packages for a variety of thermal simulation, reliability, qualification, heat sink characterization, and TIM characterization activities. Selective unused balls are sequentially connected together for daisy-chain applications.
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5G NR Automation Test Tool
IQfact5G
IQfact5G ensures quality device characterization and facilitates easy customization of test flow, thus significantly reducing engineering effort.
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Test Software
Includes everything a test engineer needs to fully characterize his transistors from 10MHz to 110GHz in power and noise.
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Dimensional Metrology
Stand-Alone Metrology Family
Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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Functional Test
Products and systems used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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EV Profiler Kit V2
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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Total Flux Measurement Systems
LED’s and Luminaires must be characterized and tested for brightness and color, for production quality control and also for R&D. The Gamma Scientific Total Flux Measurement System combines our accurate Radoma Spectrometer and an integrating sphere for total flux (total power) and color measurements of LED, micro LED and Luminaires. Measurement parameters include spectrum, lumens, total power, peak and dominant wavelength, CRI, CCT, FWHM and other optical properties.
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Birefringence Measurement Technology
Hinds Instruments Birefringence Measurement technology has been adopted by industry leaders world wide to measure birefringence and characterize stress birefringence in materials with unsurpassed accuracy, resolution and repeatability. Capable of measuring optical retardation at 0.001nm resolution with noise floors as low as 0.005nm, these systems are robust, dynamic and scalable to fit the demanding requirements of your application. We provide measurement systems across the light spectrum (DUV, VIS and NIR) and are able to measure virtually all optical materials.
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Signal Analysis
Histograph
The Histograph software is used for statistical signal analysis: finding the statistical values characterizing the signal and building the theoretic histograms based on the data obtained.
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Current-Voltage Measurement System
The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Bioreactors & Fermenters
Sartorius supports every customer with a fully scalable and interchangeable range of single-use or glass and stainless steel bioreactor solutions. The array of automated multi-parallel mini bioreactors and classic benchtop bioreactors supports fast and reliable development and characterization of your processes throughout all phases. Seamless transfer to pilot and production scale bioreactors are ensured by Sartorius thorough understanding of bioreactor design and scale-up principles, well-thought-out automation concepts and harmonized control strategies for oxygen, pH, temperature and feed addition.
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Teslameter
RX - 32
The device is designed to work as a research or service instrument characterized by a very high precision of magnetic field measurement. Thanks to the operation based on the principle of nuclear magnetic resonance ( Nuclear Magnetic Resonance - NMR ), it is a quantum device whose indications do not depend on external factors such as temperature, pressure, aging effects, etc.
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Characterization of Solar Cells
Paios
Paios performs a large variety of experiments in no time with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your research.Increase your research speedCompare your devices directly in the softwareGet highly consistent dataThink about physics - Let Paios handle the rest
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PCI Express 4 Base Specification Receiver Test Automation
N5991PB4A
The N5991PB4A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 4.0 ASICs.
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Gain-Compression Measurements
S96086B
The S96086B, gain compression measurements provides fast and accurate characterization of input power, output power, gain, and phase at the compression point of an amplifier, over a specified frequency and power range, with a simple setup
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Infiniium UXR-Series Oscilloscope: 33 GHz, 4 Channels
UXR0334A
The UXR0334A is the 33 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope, that offers 10-bit high-definition ADC, 20 femtoseconds (typical) of intrinsic jitter for exceptional jitter characterization.
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PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Opticle Encoder Tester
Endeavour
Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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PathWave BenchVue Advanced Power Control And Analysis
BV9201B
The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Sheet Resistance, leakage, and CV-IV measurements
Electrical Char
Full line of front end electrical characterization tools: Sheet Resistance, leakage, and CV-IV measurements.
