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Product
PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-03
Digital Waveform
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
PNA-X Microwave Network Analyzer, 13.5 GHz
N5241B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
LXI Microwave Matrix, 10GHz, Single 8x4 With Loop-Thru
60-750-184-A
Matrix Switch Module
The 60-750-184-A is a single 8x4 10GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Materials Characterization
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The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
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Product
PNA Microwave Network Analyzer
N5227B
Network Analyzer
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Solar Array Simulator
G5.SAS
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The G5.SAS series are unidirectional sources. It was developed specifically for testing inverters and simulating solar arrays and is suitable for use in laboratories and on test benches. The modular and finely graded G5.SAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies feature especially low capacitance values in the output filter stage and switchable earth leakage resistors for adaptation to the insulation measurement of the DUT.
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Product
High Impedance Active Probes
18C & 19C
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High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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Product
ProxiLAB Quest Contactless Tester
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Fully programmable card (PICC), reader (PCD) and NFC signal emulator for device characterization and protocol conformance verification. ProxiLAB Quest offers the performance and features required for full characterization and conformance validation of all 13.56 MHz contactless technologies, including the latest very high bit-rate evolutions. ProxiLAB Quest integrates with a variety of conformance certification solutions and test automation platforms.
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Product
Software
Electrochemistry Tests
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Materials Development Corporation
CyclicVoltammetry and Galvanostatic Charging are tests used throughout the industrial and scientific communities to study chemical reactions and behavior of electronic structures. They are extremely helpful in the monitoring of nano based dielectrics, used in super /ultra capacitors or self-assembled monolayers (SAMs). The Cyclic Voltammetry test applies a ramping voltage to a device and measures the resulting current. In acapacitor-like structure the current reveals loss in the dielectric as well as degradation over time. CyclicVoltammetry is used to characterize the performance of supercapacitors and ultracapacitors formed using various nano-technologies. It is also useful in the studies of self-assembled monolayers used for sensors.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Calibration Light Source
CAL1
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Image Engineering GmbH & Co. KG
The one light source solution in the field of camera characterization and calibration. CAL1The CAL1 calibration light source is designed to characterize and calibrate cameras in the lab or on the production line. Its compact design consists of one iQ-LED element in a 0.3 m integrating sphere that illuminates a 70 mm opening. Because of the non-reflective special diffusor filter on the sphere opening, a uniformity of more than 98% could be reached
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Product
Power Dividers/Combiners
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Macom Technology Solutions Holdings Inc.
MACOM’s power combiners and dividers are used in aerospace and defense, wireless, and wireline communications applications. These devices can also be used for broadband CATV applications. They are available in a variety of connectorized and surface mount packages. Available in subsets operating between the 400 kHz to 26 GHz frequency range, our dividers and combiners are characterized as both 50 and 75 ohm devices
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Product
Temperature, Velocity & Pressure Measurement
ATVS-NxT
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Advanced Thermal Solutions, Inc.
The ATVS-NxTTM hot wire anemometer is a fully-portable scanner that provides rapid and highly precise of temperature and air velocity measurements for thermally characterizing electronic packages.
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Product
Telurometer
AMRU-10
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AMRU-10 is a simple meter that allows to perform measurements by the technical method, as well as the measurement of the resistance of the grounding by the bipolar method. The device is characterized by its ease of operation, high resistance to disturbances and high accuracy.
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Product
Materials Test System
ModuLab XM MTS
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I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) High-speed pulse (used to activate charge carriers in electronic and dielectric materials)Staircase and smooth stepless analog ramp waveformsImpedance, admittance, permittivity / capacitance, electrical modulusC-V capacitance - voltage, Mott-SchottkyAutomatic sequencing of time domain and impedance/capacitance measurements
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Product
PXI-5650, 1.3 GHz RF Signal Generator
779670-00
RF Signal Generator
The PXI‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
5U 6 slot ATCA backplane
109ATCA506-3013R
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The 5U 6 slot ATCA backplane is a 6 slot replicated Mesh with radial IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
Spectroscopic Ellipsometers
M-2000
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The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool.
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Product
LXI Microwave Matrix, 20GHz, Single 4x4, Terminated
60-751-144-B
Matrix Switch Module
The 60-751-144-B is a single4x4 20GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Biosafety Testing
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Biological products derived from mammalian cell lines pose an inherent risk for the introduction of microbial or viral contaminants. In addition, the manufacturing process or product itself may introduce impurities that must be characterized.
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Product
Two-Pole Voltage Tester
P-5
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SONEL P-5 has all the features that characterize the P-4 Voltage Tester. In addition, the P-5 model has the ability to take resistance measurements up to 2 kΩ and has an LCD display that allows you to display the voltage and resistance values accurately.
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Product
Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
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The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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Product
TLP Tester
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Tokyo Electronics Trading Co., Ltd.
A method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures.
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Product
Keysight N7800A Test Management Environment (TME) Software
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Special recommended calibration options: The N7800A software calculates point-to-point ISO GUM measurement uncertainty. The special “H-series” calibration options in the link below provide lower measurement uncertainties through use of direct comparison to devices directly characterized by NPL or NIST (or another NMI), along with data on a CD for easy import into the N7800A (avoids manual entry). The overall resulting N7800A measurement uncertainty then incorporates this lower device uncertainty in the overall calculated uncertainty. For more information on the special options please view this spreadsheet N7800A Special Calibration Matrix.
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Product
Frequency Multipliers
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The Kuhne electronic Frequency Multipliers can be characterized by a high band width, a very good suppression of fundamental and harmonic waves, a small current consumption and a very compact housing.
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Product
Hydrogen Storage Analyzer
IMI-HTP
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The IMI-HTP is designed to characterize hydrogen storage materials using Sieverts method up to pressures of 200 bar. High accuracy is ensured by a minimized dead volume, all-metal construction, high thermal stability and accurate pressure measurement. Every IMI-HTP is specified to meet the challenging demands of high pressure H2 operation, with permanent overpressure protection to satisfy the most rigorous safety requirements.
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Product
Process & Material Characterization System
TriboLab CMP
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Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Product
Display Test & Characterization Solutions
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The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
