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Product
PCI Express 6 Base Specification Receiver Test Automation
N5991PB6A
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The N5991PB6A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 6.0 ASICs
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Product
Pattern Generators
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Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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Product
LIV – High-power Laser Diode Testing
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An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or laser IV curve. By applying increasing current to the laser diode so it that emits light, the optical output is measured together with the voltage drop across the diode element. The resulting LIV curve reveals important clues about the quality of manufacture and the performance of the laser diode, enabling a pass/fail decision to be met.
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Product
Enterprise Yield Management Solution
dataConductor
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dataConductor is an interactive enterprise yield management solution for the semiconductor industry. With dataConductor, semiconductor manufacturers can collect data from diverse, global manufacturing systems and combine them into a single warehouse to manage yields during data characterization, yield ramp and volume production.The dataConductor platform is a comprehensive enterprise yield management system built upon our high-performance dC Warehouse. dataConductor features an optimized Oracle database, standard and custom data parsers, and a full suite of analysis capabilities that can be tailored to your particular environment.
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Product
Parameter And Device Analyzers, Curve Tracers
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Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Product
Spectroscopic Analyzer / Test
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Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
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Product
Probe Card
T40™ Series
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Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Product
PXIe-4139, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit
782856-02
Source Measure Unit
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
802.11ad & ay (WiGig) Test System
IQgig-IF
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When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Product
Candlestick Sensor
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Advanced Thermal Solutions, Inc.
The Candlestick Sensor is a flexible, robust, base-and-stem design air velocity sensor that measures both temperature and air velocity for characterizing thermal conditions in electronic systems. The Candlestick Sensor is narrow and low profile to minimize the disturbance of the heat flow in the test domain. It features a flexible, plastic-sleeved stem, which facilitates installation and repositioning during the testing process.
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Product
Arbitrary Waveform Generators
M8100 Series
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The M8100 Series arbitrary waveform generators (AWGs) offer a level of versatility that enables you to set up complex real-world signals — whether you need precise signals to characterize the performance of a design or need to stress a device to its limits. From low-observable radar to high-density communications, testing is more realistic with our precision arbitrary waveform generators.
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Product
Power Measurements For The 3000A/T/G X-Series
D3000PWRB
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The power software package for Keysight’s InfiniiVision 3000A, 3000T, and 3000G X-Series oscilloscopes enables a broad range of automated power supply characterization measurements including critical frequency response measurements (3000T/G X-Series only) such as power supply rejection ratio (PSRR) and control loop response. This package also enables hardware-based pass / fail mask testing and USB PD triggering and decode (3000T/G X-Series only).
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Product
USB4 Version 2.0 Receiver Compliance Test Software
N5991U42A
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N5991U42A is the receiver compliance test automation software, allowing you to test and characterize USB4 Version 2.0 PAM3 designs.
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Product
Power Transformer Automatic Test Device
XD71
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Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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Product
Penetrometer and Texture Analyzer
MDT Series
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Mohr Digi-Test (MDT) Series instruments are portable materials testers designed to accurately characterize the texture and firmness of fruit, vegetables, and other agricultural produce in the field, packing house, and the laboratory.
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Product
X-Series Measurement Applications for EXT
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A broad set of X-Series measurement applications for EXT enabling you to characterize, troubleshoot and rapidly create test code for the manufacture of your design.These applications are based on the library of over 25 X-Series measurement applications for benchtop signal analyzers.
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Product
PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
Programmable Power Supply
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Product
LXI Microwave Matrix, 10GHz, Dual 4x4
60-750-244-B
Matrix Switch Module
The 60-750-244-B is a dual 4x4 10GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Pulser / Sampler Core
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Furaxa has researched, developed, and characterized a novel monolithic arrayable pulse and sample aperture generation technology. Recent results include demonstration of sub-10ps pulse/aperture generation at repetition rates up to 3 Billion Pulses/Samples Per Second (BPPS) with jitter that is estimated at sub-10fs. Further, simulations in a number of InP DHBT processes exhibit sub-3ps 20BPPS performance. The IP is process-independent, and has been achieved in CMOS SOI, InP HBT, SiGe and GaAs so far. Please contact us regarding your specific foundry and technical requirements: The company currently licenses the sampler/pulser technology for use by application and market, and is interested in discussing how the technology can enable our partners' applications. A short list of characterized Pulser/Sampler Cores is given below.
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Product
LXI Microwave Matrix, 10GHz, Dual 4x4 With Loop-Thru
60-750-244-A
Matrix Switch Module
The 60-750-244-A is a dual 4x4 10GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Specialty Instruments
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Advanced Thermal Solutions, Inc.
ATS offers a variety of unique specialty instruments, designed for specific applications across the electronics industry. These instruments range from providing heat flux measurements and cold plate characterization, to precise isothermal surface temperature control and fan flow characterization.
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Product
Dual Blackbody Wide FOV
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Dual blackbody, all reflective background IR target projector is used to characterize WFOV IR sensor systems. It features a broadband, 3 to 14 micron range, reflective IR target technology for the most accurate and stable differential targets, controlled background radiance, a 5º FOV with 36º uniform background.
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Product
M2 & BPP Systems
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The M2 factor wil define the beam propagation characteristics compared to ideal Gaussian beam propagation. According to ISO Standard 11146 rightfully offers the laser beam characterization as "M2 times diffraction limited beam", as such, a perfect beam will have an M2 of 1. 1 will be the best achievable value and no beam could have an M2 less than 1. Our conceptual design is based on sub-assemblies allowing to change the sensing head in the M2 device, offering multiple wavelengths heads up to 2.7 microns from deep UV (knife-edge technology) and camera based technology with built-in automatic filter wheel for adjustment. For focused beams, the same measuring head could be attached to a device for meauring highly divergent or highly convergent beams - FocusGage-BA, wherein the Laser Analyzing Electronic Autocollimator offers the capability of divergence measurement with Coming Soon M2 definition. M2Beam is the cornerstone of those measuring devices.
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Product
Toolset for NI TestStand
TS+
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MESULOG TS + includes new configurable TestStand steps that simplify product characterization and validation, while reducing the time and cost of developing test sequences. With TS + , you can easily create advanced loop structures, save and replay datasets, display data dynamically, and include screenshots in your reports.
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Product
MXG X-Series RF Vector Signal Generator, 9 kHz to 6 GHz
N5182B
Vector Signal Generator
Take your designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading ACPR & output powerTest wideband devices with factory-equalized 160 MHz RF bandwidthReduce the time spent on signal creation with Signal Studio software, including LTE, WLAN & GNSSLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
Rebuilt Testers
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Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Product
PXIe-4140, 4-Channel Source Measure Unit
781742-01
Source Measure Unit
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
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The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
