Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Product
Laser Turbidity Meter
HU-200TB-EH
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HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.
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Product
Converter
556
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The dual channel converter 556 provides continuous inline, real-time measurement and control of turbidity. The customer’s specific factory calibration of the converter can be configured in ppm (DE), FTU or EBC. Combined with an optek TF56-N scattered light sensor the 556 converter is a cost-saving measuring system, providing reliable process measurements.
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Product
Saybolt Color Analyzer
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optek’s Saybolt color analyzer is a dual wavelength light absorption sensor. Operationally, the sensor passes a white light beam through the stream to be monitored, where light absorbance is measured at two distinct wavelengths. The measuring wavelength is set to focus on or near the peak absorbance point of the “yellowness” curve, while the secondary wavelength is chosen to compensate for any influence due to light scattering (window fouling, particulate, immiscible fluids, gas bubbles, etc.). Together, the sensor yields a repeatable and reliable true color number without any sample conditioning.
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Product
NDT Wedges
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Rexolite or perspex wedges incorporate a pyramidal scattering surface with an impedance matched acoustic absorber to minimise internal reflections within the wedge.
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Product
High-efficiency Fiber Stretcher
PZ2
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The PZ2 provides the most extensive stretch of our stretcher product family. It is a fiber wound piezoelectric element for use in a wide range of optical interferometric measurement and sensing system applications. Typical uses include open loop demodulation, sensor simulation, white-light scanning interferometry and large angle modulation of interferometric phase. The PZ2 is ideal for use in OCT [Optical Coherence Tomography] and OCDR [Optical Coherence Domain Reflectometry] applications requiring scattering or boundary definition measurements.
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Product
Measuring Stations
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In cooperation with important customers in the automotive industry, medical engineering, mechanical engineering, and the semiconductor industry, OptoSurf has developed measuring devices that enable scattered light to be used for production purposes as well as in R&D and universities.
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Product
Evaporative Light Scattering Detector
ELSD-LTII
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The ELSD-LTII utilizes a high-efficiency LED and enhanced digital signal treatment to minimize noise and deliver optimum sensitivity for trace analysis. An innovative cell design also reduces band broadening and allows sensitivity levels below 200 picograms. The high-performance optical detection system can also be used for combinatorial chemistry and high-throughput screening applications. The new Low Temperature Evaporative Light Scattering Detector (ELSD-LTII) is an easy-to-operate, universal detector that identifies analytes with uniform sensitivity regardless of their spectroscopic properties. It is not a spectroscopic detector. Instead, it removes the mobile phase through evaporation and then makes a light scattering measurement of the dried analyte particles.
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Product
Fusion Splicer
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Shaanxi Aitelong Technology Co., Ltd
Fusion splicing is the act of joining two optical fibers end-to-end. The goal is to fuse the two fibers together in such a way that light passing through the fibers is not scattered or reflected back by the splice, and so that the splice and the region surrounding it are almost as strong as the intact fiber.
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Product
Optical Time Domain Reflectometers
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An optical time domain reflectometer (OTDR) is a precision instrument used to locate events or faults along a fiber link, typically within an optical communications network. The OTDR launches a series of high speed optical pulses into the fiber to be measured. Various events on the fiber generates a Rayleigh back scatter that returns to the OTDR and the strength of the return pulses are measured and integrated as a function of time, and plotted as a function of fiber length. The horizontal axis is the distance and the vertical axis is the loss.
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Product
TSS Meter
LD-LTSS-A10
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TSS meterLD-LTSS-A10is a tabletop meter with a dual-beam infrared scattered light photometerdetection system for enhanced stability. Built-in self-diagnosis function to ensure dataaccuracy. Optional cleaning brush for automate cleansing function to reduce the sensormaintenance.
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Product
Viscometer
ViscoStar III
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A highly sensitive, on-line differential viscometer used in conjunction with SEC-MALS to determine the size and conformation of all types of biopolymers, synthetic polymers and even proteins and peptides. The ViscoStar III incorporates multiple novel technologies to provide the highest sensitivity, stability and solvent compatibility of any available viscometer for GPC. Its ease-of-use and serviceability make it the perfect companion for Wyatt's DAWN HELEOS II light scattering and Optilab T-rEX refractive index detectors.
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Product
kSA SpectR
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The kSA SpectR is a complete metrology solution for measurement of absolute spectral reflectance, growth rate and end point detection. Custom spectral features such as reflectance minima, maxima, inflection points, or baseline scatter level, over a user defined wavelength range of interest, are easily measured.
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Product
Static Multiple Light Scattering (SMLS)
TURBISCAN
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Static Multiple Light Scattering (SMLS) is an optical method that allows for the direct characterization of native concentrated liquid dispersions. Microtrac’s TURBISCAN range uses this technology to provide accurate and rapid results. TURBISCAN was the first patented technology to provide tools that allow accelerated aging tests on unstressed products, thus becoming a reference for direct stability characterization technology.
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Product
Evaporative Light Scattering Detector for HPLC
ELSD-LT III
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The evaporative light scattering detector (ELSD) is a general-purpose universal detector that can even detect components with no UV absorption, such as carbohydrates, lipids, surfactants, and synthetic polymers. With exceptional sensitivity, a wide dynamic range through Analytical Intelligence features, and easy operability using LabSolutions™ software, the ELSD-LT III contributes to more effective analysis in a wide variety of fields.
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Product
UV Man Spectrometer
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UV Raman (with laser wavelengths below 400nm) can be used to probe specific sample properties, and benefit from experiment properties different from typical visible Raman measurements – for example, greatly increased Raman scattering efficiency, modified laser penetration within the sample, and resonance coupling to different chemical moeities. However, UV analyses come with a number of technical challenges, that require considered instrument design to allow UV Raman to be a truly useful tool for the researcher.
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Product
Scattering Sensors
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Scattering sensor data offers links to particulate bigeochemistry and ocean color. Sea-Bird Scientific offers a wide variety of scattering sensor configurations and measurement capabilities. Our sensors are available in single, dual, and three-measurement combinations.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
Bending Deflectometers For ISO 178, JIS K 7171, And ASTM D790 Compliant Testing
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After tensile testing, flexural tests are the most common strength tests for plastics and other resins. The main standards for plastic flexural (bend) tests are ISO 178, JIS K 7171, and ASTM D790, which require very accurate test systems. These standards include flexural strain measurements using a deflectometer, ranging from micro-strain measurements in the elastic region, the reversible elongation at the beginning of tests, to larger strain measurements in the plastic region. Shimadzu's deflectometers integrate easily into AG-X plus series, AGS-X series, and EZ-X test frames and Trapezium X testing software. Since these deflectometers push up against the specimen from below, the specimen color is not a limiting factor, as can be for laser type non-contact deflectometers. Furthermore, these deflectometers can partially absorb the shock during specimen failure, preventing specimen fragments from scattering.
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Product
Turbidity Sensor
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The Aanderaa Turbidity sensors detects infra-red light scattered by particles suspended in water.
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Product
Laboratory And Analysis Systems
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High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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Product
VIS/NIR Sensor
AF26
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The AF26 is a high precision dual channel color sensor for inline operation; the secondary wavelength is designed to compensate the desired light absorbance measurement from any undesired light scattering influence, such as suspended solids, gas bubbles, immiscible fluids or window fouling. The AF26 sensor’s output can be correlated to almost any color scale including APHA and Hazen.
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Product
Optical VSF Sensors
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The optical Volume Scattering Function(VSF) is an ‘inherent optical property’ of water that is used by optical oceanographers to predict light propagation, image degradation, remote sensed ocean color, biological environment etc. in water.
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Product
Raman Probes
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As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
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Product
Vector Network Analyzer
SNA5000A
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The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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Product
Sapphire Defect Laser Probe and Glasses
LP-100
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Easy to use and portable■ low price with long lifetime■ can be used to detect many defects, like micro crack, bubbles, impurity, crystal subgrain■ When the laser go though the crystal, if it is monocrystal the light should be scattering, in macro it should be white.
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Product
C-Band Separate Dispersion Compensation Raman Fiber Amplifier
DRA5228/F
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Hangzhou Huatai Optic Tech. Co., Ltd.
Raman Fiber Amplifier (RFA) utilizes the optic gain in the Stimulated Raman Scattering (SRS) in the optical fiber and realizes the amplification of the signal optic. FRA, with very low equivalent noise and a wide gain scope, can further widen the gain bandwidth by adopting multi-wavelength optical bump, which represents the development direction of the new optical fiber amplifier.
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Product
Multi-Laser Nanoparticle Tracking Analysis (NTA)
ViewSizer 3000
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Exosomes, viruses, and nanoparticles all have wide size distributions which defeat traditional Nanoparticle Tracking Analysis (NTA) analyzers. The ViewSizer 3000 features simultaneous measurement with three lasers to collect the most accurate distribution and concentration information over a wide range of sizes within the same sample. Where the signal from a particle is too bright and saturates the detector from one laser, the software automatically uses data from a lower power laser to ensure the most accurate size and concentration information. On the other hand, when scattering from one laser is too weak for detection, the software uses data from a higher power laser to accurately track the particle.
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Product
Application Specific LC System
Reducing Sugar Analysis System
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The Nexera reducing sugar analysis system uses Shimadzu’s unique post-column boric acid-arginine fluorescence derivatization method. Unlike the refractive index detectors and evaporative light scattering detectors (ELSD) commonly used for sugar analysis, this system reduces the effects of impurities and offers both high sensitivity and a wide dynamic range. As a result, sugars contained in samples can be analyzed simultaneously, without dilution even when there are significant concentration differences.
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Product
MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
