Logic
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Product
NI-9474, 30 V, 8-Channel (Sourcing Output), 1 µs C Series Digital Module
779003-01
Digital Module
30 V, 8-Channel (Sourcing Output), 1 µs C Series Digital Module - The NI‑9474 works with industrial logic levels and signals to directly connect to a wide array of industrial switches, transducers, and devices. Each channel is compatible with signals from 5 V to 30 V, features transient overvoltage protection between the output channels and earth ground, and has a LED that indicates the status. The NI‑9474 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization when installed in a CompactDAQ chassis.
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Product
AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Product
Crush Tester 350
DRK113
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Shandong Drick Instruments Co., Ltd.
DRK113 Crush Tester 350 is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance. The instrument have parameter testing, adjusting, LCD digital display, memory, printing function.
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Product
AXIe Logic Analysis & Protocol Test
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Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Product
Mixed Signal Oscilloscopes
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The design, validation, and manufacturing of modern electronics necessitate the measurement of both analog and digital signals. Mixed signal oscilloscopes enable the simultaneous, time correlated observations and analysis of analog with digital (logic) signals, to establish causal relationships between the various areas of a device's electronics. They are purpose built tools for troubleshooting electrical anomalies, measuring parametric values, and monitoring cause and effect relationships between signals.
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Product
Multimedia Modular
DPX-M1270
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Rugged Logic box design, Security and access to meet the requirements of the gaming industry. Intel® 8th/9th Generation Core™-i7/i5/i3 CPUs 8,6,4,2 core. Supports 3 display outputs (2 x DP++, HDMI).
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Product
Low-Power General Purpose FPGA
Certus-NX
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*Up to 39K logic cells, 2.9 Mb embedded memory, 56 18 x 18 multipliers, 192 programmable I/O, one lane of 5 Gbps PCIe, two lanes of 1.25 Gbps SGMII, two ADCs (each 12-bit, 1 MSPS).*Packages as small as 6x6 mm, and in ball-pitch options of 0.5 and 0.8 mm.*Power modes – User selectable Low Power vs. High Performance modes, enabled by FD-SOI programmable back-bias.*Design security – ECDSA bitstream authentication, coupled with robust AES-256 encryption.*Instant-on configuration – I/O configures in 3 ms, and full-device as fast as 8 ms.*Available in Commercial, Industrial and Automotive (AEC-Q100 qualified) temperature grades.
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Product
16-Bit Logic
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Redundancy of mission critical subsystems is a common practice used to ensure reliable operation of a spacecraft or satellite.
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Product
Logic Gates
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Analog Devices logic gate products offer logic functions such as AND, NAND, OR, and NOR, and include both –3.3 V and +3.3 V single supply options. Our products feature low power consumption, fast rise and fall times, differential and single-ended operation, and support high data rates up to 45 Gbps in an RoHS compliant package.
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Product
Programmable Logic Controllers
PLC
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Streamline your manufacturing process with advanced programmable logic controllers that put you fully in control of all aspects of your application.
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Product
68-Channel Portable Logic Analyzer
16862A
Logic Analyzer
68 channels, 350 MHz state, 12.5 GHz timing zoom, 2.5 GHz timing, 2 Mb depth standard15-inch (38.1 cm) color, touch-screen display for viewing and quickly navigating large numbers of signals and buses Built-in removable SSD drive, USB 3.0 ports and LAN for fast data transfer and storage of large amounts of data1.4 GHz trigger sequencer to ensure high-speed events are captured
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Product
VME Controller With USB-2 Interface
VM-USB
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The VM-USB is a VME master with high speed USB2 interface. Enhanced functionality is given by the programmable internal FPGA logic which provides a VME command sequencer with 4kB stack and 28kB data buffer. Combined with the 4 front panel I/O ports this allows VME operation and data acquisition / buffering without any PC or USB activity.
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Product
DC/DC Converter 150 W
CQB150W-110S3V3N
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DC/DC converter with 150 W from Cincon | input ranges 43 - 160 VDC | output 3.3 V | operates in temperature from -40 to +105 °C | according to EN45545-2 fire and smoke | negative control logic
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Product
Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136E+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM
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Product
AMIDA 5000 Tester
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AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Product
Digitizer
724 Family
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The 724 is a family of CAEN Waveform Digitizer able to perform basic waveform recording and run online advanced algorithms (DPP) of pulse height analysis and dynamic acquisition window. Data is read by a Flash ADC, 14-bit resolution and 100 MS/s sampling rate, which is well suited for high resolution detectors as Silicon, HPGe or inorganic scintillators like NaI or CsI coupled with Charge Sensitive Preamplifers. In the waveform recording mode, algorithms of zero suppression are also implemented to reduce the data throughput. The acquisition can be channel independent and it is possible to make coincidence/anticoincidence logic among diferent channels and external veto/gating. Multiple boards can be synchronized to build up complex systems.
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Product
16 Channels, 200MHz, 1 M Samples/Channel Buffer USB Logic Analyzer
La-Logic-16
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The La-Logic-16 is a sophisticated PC-based logic analyzer. It captures at a maximum of 200Mhz on its 16 channels simultaneously into it?s deep 1M samples/channel buffer.It can also operate as a 16-channel pattern generator.It connects to the PC via the USB-port and does not require any external power. The package is complete with all accessories included to start debugging immediately.
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Product
Digital Port
ZET 7160
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*Logical analyzer*Digital input/output, 4 bits, 0/5 V*CAN 2.0 Interface
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Product
PXIe-7820, Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module
783484-01
Digital I/O Module
Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module—The PXIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7820 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7820 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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Product
DIMM Interposer Probe
FS2361
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The FS2361 is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154/64 Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 DIMMs.
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Product
sbRIO-9476 , Non-Enclosed, 36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module
783951-01
Digital Module
Non-Enclosed, 36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module - The sbRIO‑9476 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with signals from 6 V to 36 V, based on the external power supply, and features transient overvoltage protection between the output channels and the backplane. You can programmatically monitor the built-in overcurrent and short-circuit protection status of each channel. Non-enclosed modules are designed for OEM applications.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
High Speed & Precision Pressure Insensitive Mass Flow Module
D700MG
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Critical semiconductor manufacturing processes continuously desire precision gas flow control devices that enable both future innovation, and lab to fab transition of leading edge memory and logic device. HORIBA's propose the new pressure based MFC D700MG, the upper compatible model of the D500MG to support customer’s challenges.
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Product
PCI Altera 485/LVDS - Altera User Design
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The PCI compatible PCI-Altera-485/LVDS design is for the advanced user who wants to implement their own Altera design or requires reconfigurable logic. The PCI-Altera-485/LVDS makes the implementation and use of the 20K400E easy. Larger Altera parts are available. The design comes with the basic features built in and the specific features ready for you.
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Product
JTAG / BDM Instrumentation
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High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.
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Product
Single Channel Analyzers
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A single channel analyzer (SCA) produces an output logic pulse on the condition that the peak amplitude of its input signal falls within the pulse-height window that is established with two preset threshold levels. ORTEC provides two basic types or classifications of SCAs: non-timing SCAs and timing SCAs. Non-timing SCAs produce an output pulse if the input signal is within the window settings. Timing SCAs produce an output logic signal precisely related in time to the occurrence of the event being measured.
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Product
Azure IoT Edge
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Azure IoT Edge is a fully managed service built on Azure IoT Hub. Deploy your cloud workloads—artificial intelligence, Azure and third-party services, or your own business logic—to run on Internet of Things (IoT) edge devices via standard containers. By moving certain workloads to the edge of the network, your devices spend less time communicating with the cloud, react more quickly to local changes, and operate reliably even in extended offline periods.
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Product
BGA Interposer, LPDDR4 200-ball, 2-wing For Logic Analyzer, Connects To 61-pin ZIF
W6601A
Interposer
The W6601A LPDDR4 2-wing BGA interposer for LPDDR4 200-ball BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A logic analyzer module it is compatible with. The W6601A is the smallest BGA interposer for LPDDR4 200-ball DRAM capable of capturing simultaneous read and write traffic at data rates in excess of 3.2 Gb/s. U4208A and U4209A probe/cables connect W6601A LPDDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W6601A BGA interposer wings. Refer to the W6601A data sheet for complete list of LPDDR4 signals probed with the W6601A.
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Product
NI-9425, 24 V, 32-Channel (Sinking Input), 7 µs C Series Digital Module
779139-01
Digital Module
24 V, 32-Channel (Sinking Input), 7 µs C Series Digital Module - The NI‑9425 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each digital input line is compatible with 24 V logic levels. The NI‑9425 offers isolation between the input and output banks from channel to earth ground. You cannot use the NI‑9425 in a CompactDAQ chassis to perform counter operations.
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Product
Logic Analyzer Probe
FS2512
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The FS2512 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs.
