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Mapping
See Also: Wafer Mapping, Survey
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Film Thickness Mapping Systems
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Pressure Mapping
GRIP™ SYSTEM FOR R&D
Tactile pressure sensing system that quantifies forces applied by the human hand while grasping objects.
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One click site mapping
PowerMapper
PowerMapper is an automatic site mapping tool for information architects, usability analysts and web developers. It is used in more than 50 countries, by 30% of the Fortune 100, and major organizations like NASA and MIT.
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Phased Array Corrosion Mapping Software
Concerto
Concerto is a UT acquisition and analysis software specially designed for Phased Array corrosion mapping. For the tough field conditions that operators deal with Concerto features no menu, less than 18 icons, and few controls so that operators can easily work and not be bothered by complex GUIs. Concerto is simple and easy to work with yet WT, Surface, and back wall C-scan can still be analyzed and setting can be changed using the same acquired data.
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Pressure Mapping
WIPER
Evaluate wiper blade force profiles and interface pressure distribution.
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Concrete Corrosion Mapping System
15620
Our Concrete Corrosion Mapping System (CCMS) can be used to satisfy the ASTM C-876 standard test method and the kit contains all equipment items that are needed to perform a corrosion survey on virtually all types of reinforced concrete structures, such as bridges, highway slabs and parking garages.
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Pressure Mapping
TIRESCAN
Complete pressure imaging system for conducting tire tread analysis.
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Continuous Surface Current Mapping & Wave Monitoring System
SeaSonde
The SeaSonde HF radar system by CODAR Ocean Sensors is your solution for making continuous, wide-area ocean observations. The SeaSonde will provide you with years of real-time data over large coverage areas, with ranges up to 200 km — This is not possible with any other technology!
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Non-Contact Mapping Life Time System
MWR-2S-3
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Pressure Mapping
NIP PRESSURE MEASUREMENT SYSTEM
A completely wireless system for measuring nip pressure between rollers in real-time
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Half-Cell Corrosion Mapping
XCell
Giatec XCell™ is a smart tablet-based NDT probe for fast, accurate and efficient detection and on-site analysis of corrosion in reinforced concrete structures. Giatec XCell™ meets all the requirements of the ASTM C876 standard specification.
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Easy3DMatch
Align a scanned 3D object with another scan or with a reference meshCompute the local distances between 3D scans and a golden sample or reference meshDetect anomalies such as misplaced features, geometric distortions, gaps, bumps,...Compatible with all 3D sensors that produce point clouds, depth maps or height maps
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Saluki S5700 Series Field Comm Analyzer (SA/CA/OPTICAL)
S5700 Series Field Comm Analyzer combines the highest performance operating specifications and multi-functional measurements such as cable and antenna system analysis, fiber inspection, spectrum analysis, cellular signal demodulation, interference analysis, signal coverage mapping and RF/optical power measurements in a single instrument.
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Fixture Building Software
FixGenius
Tests show that FixGenius’ rule-based probe-mapping algorithms reduce pin deflection by up to 25% compared with traditional fixturing packages. FixGenius comes with a powerful Fixture Editor that allows the user to change the probe mapping. If a solution is mathematically possible, FixGenius’ algorithms will find it, and pick the one with least deflection. If the job simply cannot be done with one single fixture, FixGenius will fully automatically split the test into multiple fixtures or into fixture and flying probe test sets, with guaranteed test integrity.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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VME64x IP Carrier Module
DP-VME-5121
Data Patterns DP-VME-5121 VME IP carrier board is a 6U VME bus card that provides an electrical and mechanical interface for four industry standard IP modules. The board provides full data access to the IP modules I/O, ID and memory spaces. The programmable registers are used for configuring and controlling the operation of IP modules.Each IP module supports two interrupt requests. The VME bus interrupt level is software programmable. The software configured interrupt modes are:a.Single level interrupt mode: All IP module interrupts can be mapped to a single VME bus interrupt level.
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Mini Lan Cable Tester
MT-7058
Complies with CE safety standardAutomatically detect good connections, opens, crossed wires & split pairsTest RJ45 TIA568A/B (AT&T) 258A), 10 Base-T, Token ring, RJ-11/RJ-12 USOC and coaxial BNC cablePin to pin cable map indicatorNon-contact voltage detection for user safetyTraces wires with tone & remote lights allows one person operationCompact size and lightweight design for easy to carry aroundCircuit Protection for both units to ensure the testing qualityLow power consumption with auto power off function to preserve batteryLong cable test more than 300 meters
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Microprocessor Development System
DS-M8
# Real-Time and Transparent In-Circuit Emulator# Supports PIC12xxx, PIC14xxx, PIC16xxx, PIC17xxx and others# Uses Microchip Bond-Out Technology# Maximum Frequency Support# Standard 64Kx16 Emulation Memory# 32Kx48 Real-time Trace with Filters and Triggers# 64K Hardware Breakpoints with External Signals# Memory Mapping Capabilities# Software for MS-Windows# Source-Level Debugger for C and Assembler
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Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Chip Obsolescence Solutions
Solve component obsolescence problems with an Ironwood adapter and an alternate device. Adapters convert the pinout of an alternate device to maintain compatibility with an existing footprint – no need to redesign a new circuit board. Very often, these adapters (called Package Converters) are a simple 1:1 pin mapping from the new package to the old. Here are a few examples of package converters and how they can solve chip obsolescence issues.
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Cable Tester
The MapMaster™ mini detects faults and locations of RJ45 network cables. Good terminations, causes of faults and locations of cables are displayed on an LCD display. A set of five mapping remotes is included for locating cables terminated in wall jacks or patch panels. A built-in tone generator with 4 different tone combinations can be used with a tone probe to detect where a cable is routed and the location of the end of the cable.
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MIL-STD-1760
M4K1553Px(S)-1760
The M4K1553Px(S)-1760 interface module for the multimode, multiprotocol, Excalibur 4000 family of carrier boards provide a complete solution for developing and testing MIL-STD-1760 interfaces and performing system simulation of the MIL-STD-1760 bus. The module handles all standard variations of the MIL-STD-1760 protocol.Each M4K1553Px-1760 multi function module contains 64K bytes of dual-port RAM for Data blocks, Control registers, and Look-up Tables. All Data blocks and Control registers are memory mapped, and may be accessed in real time. Each of the independent dual redundant M4K1553Px-1760 modules may be programmed to operate in one of three modes of operation: Remote Terminal, Bus Controller/Concurrent-RT, and Bus Monitor. In addition, modules 1 and 3 can be programmed to operate as Concurrent monitors, to modules 0 and 2 respectively.
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Semiconductor Technology, Micro Scriber + Meters For Contact Angle And Surface Tension
SURFTENS WH 300
Optik Elektronik Gerätetechnik GmbH
The leading equipment for professional use in 200 and 300 mm wafer processing in semiconductor technology. SURFTENS WH 300 is equipped with a 3 axis wafer robot, wafer scanner, loadport for 200 and/or 300 mm wafers, fan filter unit, notching system. Suitable for any cleanroom class it features the automatic mapping of contact angles on wafers for up to 25 wafers.New: with SECS/GEM Interface!
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Locate and Map Underground Utilities
UtilityScan DF
Geophysical Survey Systems, Inc.
UtilityScan DF incorporates our innovative dual-frequency digital antenna (300 and 800 MHz) and an easy-to-use touchscreen interface to view shallow and deep targets simultaneously in a single scan.
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Vison Inspection System
High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Open eVision 3D Studio
Ease the configuration and the setup of a laser triangulation scanner using the Coaxlink Quad 3D-LLESimplify the calibration procedureDisplay interactive Depth Maps, 3D Point Clouds and ZmapsFree of charge
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Automated Calibration
ORION
ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
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Werklicht® Video
*Projects measurement results on components, *In the form of false color or deviation maps or individual point readings *Adjusts the projection automatically to the position of the part. *Uses measurement data from conventional optical and tactile measurement devices. Is therefore an instrument for effectively communicating quality.
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