Wafer Level Reliability
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Product
Water Levels Tools
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Zircon’s line of indoor and outdoor electronic leveling tools are ideal for everyone whether they are professionals or hobbyists. Learn more about our WL25 Water Level and WL25 Pro Water Level here.
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Product
High Performance Active Antenna, Waterproof, Wide Operating Temperature Range, IP67 Level
AIW-520
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Your product descActive antennaIP67-ratedGPS-L1: 1575.42 MHz/GLONASS-G1: 1589.0625 MHz/GALILEO-E1: 1575.42 MHz/BeiDou-B1/B1-2: 1561.098/1589.742 MHzSMA male connectorOperating Temperature: -40 ~ 85℃ription goes here.
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Wafer Probe Loadboards/PIB
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DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Product
Sound Level Meter, 30 dB, 130 dB, 1.4 dB, 0.1 dB, 0 °C, 40 °C
MP780905
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Digital sound level meter with USB interface. It is perfect for sound system testing, speaker system measurement and environmental noise level monitoring. This is designed to meet the measurement requirements of safety engineers, health, industrial safety offices and sound quality control in various environments.
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Product
Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
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Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Product
Low Light Level High Res Monochrome Underwater CCD Camera
Explorer-Pro
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The Teledyne Bowtech Explorer-Pro low light level, high resolution monochrome underwater CCD camera, is the ideal solution for extremely low light level, underwater viewing and navigation, yet still producing excellent images in high intensity illumination.
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Product
04 With Soldering Eyelets | 1 Wafer | 12 Positions
04-1xx4-00/30-xx
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Very robust, multi wafer selector with 30° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
Level Quadrant
LIQUA
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Clinometer with robust housing*Quick adjustment of circle with eccentric bush*Illumination of circle and level*Graduation 6400-*Scale interval 1-*Measuring range +1000- bis .600-*Accuracy ± 0,5-*Made in Germany
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Product
04 With Soldering Eyelets | 4 Wafers | 12 Positions
04-4xx4-00/30-xx
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Very robust, multi wafer selector with 30° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
Digital Sound Level Meter
KG-70
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Backlight LCD helps easy reading in dark place.MAX/MIN measurement.Wind Screen supplied to cut off wind noise affects.Frequency weighting (A/C) selectable.Time weighting (FAST/SLOW) selectable.Display Hold, and Auto Power Off
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Product
Sound Level Meter
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Is a digital noise meter auto-shifting function that can be applied to the measurements for both environmental noise and mechanical noise.
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Product
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
Digital I/O
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Product
Sanitary Magnostrictive Level Transmitter
DM330S
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The Drexelbrook DM330S is a sanitary magnetostrictive level transmitter providing Triclover fittings as standard mountings. It is authorized by 3A Sanitary Standards Council for level applications in the food and beverage industries.The DM330S takes field proven sensing technology and incorporates intrinsic safety with a field programmable zero and span.The two wire loop powered level transmitter is configurable with a 4-20 mA span and is not affected by changes in electrical characteristics.It uses proven machine tool positioning accuracy combined with a process compatible float to offer a liquid level, and interface measurement system for the process industry.
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Product
Class 1 Integrating Sound Level Meter
HD2010UC.kit1
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The HD2010UC.Kit1 is a Class 1 integrating portable sound level meter performing statistical analyses. The instrument has been designed combining price competitiveness and simplicity of use. Attention has been paid to the possibility of updating the instrument, and the HD2010UC can be integrated, at any time, with other options like “Advanced Data Logger” to extend its application scope.
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Product
Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Product
Probe Needles for Wafer Sort and Test Applications
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Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
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Product
04 With Pins For PCB | 3 Wafers | 12 Positions
04-3xx4-20/70-xx
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Very robust, multi wafer selector with 30° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
MXI-Express Cable with Communication Levels up to Gen 3 x8
781042-100
MXI Express
MXI-Express Cable, Gen 1 x4, Fiber Optic, 100m
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Product
Ultrasonic Level Measurement
VeriGAP
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Ultrasonic technology is a great choice for high or low-level liquid level measurement requirements in a wide variety of liquids. These ultrasonic sensors require no calibration and are not affected by changes in electrical properties of the material being measured.
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Product
High Level Language Debugger and Emulator Tool
Universal Debug Engine
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Programmierbare Logik & Systeme GmbH
With Universal Debug Engine (UDE®) PLS offers on top solutions for software development of systems-on-silicon including debug support for the 16 Bit and 32 Bit microcontrollers C16x, C166™, ST10F276, ST10F280, XC166, XC2000, XE166, XMC4500, C166S V2, SDA6000, TriCore™ from Infineon and STMicroelectronics, Power Architecture® MPC55xx, MPC560x, MPC563x, MPC57xx from NXP™, PowerPC PPC440SPe from AMCC, Power Architecture® SPC560, SPC563, SP574 from STMicroelectronics, ARM7™, ARM9™, ARM11™, Cortex™-M0, Cortex™-M0+, Cortex™-M3, Cortex™-M4, Cortex™-M7, Cortex™-R4, Cortex™-A8, Cortex™-A9, XScale™, SuperH™ SH-2A derivatives in a new multicore debug environment as well as technical support. The extensive feature list includes functions like: high speed and flexible target access via JTAG, cJTAG with OCDS L1, EmbeddedICE, OnCE, COP, DAP, DAP2, SWD support, OCDS L2 trace, MCDS trace, CoreSight™ trace, ETM trace, ETB trace, Nexus trace, ASC, SSC, 3Pin and CAN, in-system FLASH memory programming of FLASH / OTP with UDE MemTool, support of various RTOS, OSEK® and test automation tools.
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Product
Sound Level Meter For Occupational Noise
SONIK-S
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The SONIK-S helps you protect your workforce from over exposure to noise, and helps you ensure your company is complying with The Control of Noise at Work Regulations 2005.
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Product
Shield Level / Pathloss Equipment
PAMS & PAMS-C
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PAMS is a user-friendly, transmitter and receiver system that measures shielding effectiveness in RF shielded enclosures. Lightweight and compact, each PAMS unit measures approximately 12” x 5” x 5” and weighs 5.5 lbs., making PAMS ideally suited to field measurement tasks. Rugged construction insures instrument survivability in a field test environment. PAMS-C is a simple and efficient solution for quickly identifying shielding faults in an RF shielded enclosure. Cousin to the original PAMS used extensively by customers operating RF Shielded Enclosures, PAMS-C gives commercial end-users everything needed to measure shielding effectiveness levels of critical infrastructure - all with minimal or no interruption to normal operations.
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Product
Sound Level Meters
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Is used for acoustic measurements. It is commonly a hand-held instrument with a microphone.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
Autonomous Capacitive Level Logger
DCX-38 VG
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KELLER AG für Druckmesstechnik
The DCX-38 VG is an autonomous instrument for recording water level with a high resolution and full scale ranges as low as 0,5 mWC / 50 mbar. It features a rugged, gold-plated ceramic diaphragm for outstanding long-term stability and stainless steel housing with user serviceable battery for long service life.
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Product
Sound Level Datalogger
DSL 331
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Auto Ranging Measurement 30dB to 130dB. Work with Window Software. 32,000 Records Data Logger. Bar graph Indication with Back Light. RS-232 Real Time Display Software for Window 95/98/2000
