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Product
Apertures
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ARC possesses the machining techniques, skill and equipment to fabricate a wide variety of apertures in a similarly wide variety of materials. The aspect ratio of aperture opening to material thickness is generally limited to a 1:20 ratio. Shown on the right in Figure 1 is an aperture with a wide series of holes ranging from 15um to 960um.
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Product
Matrix Vapor Deposition System
iMLayer
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The iMLayer matrix vapor deposition system is sample pretreatment (application of matrix) in order to perform MALDI-MS imaging using an analysis system such as the iMScope imaging mass microscope or the MALDI-7090. With the iMLayer, the deposition method has been adopted as a pretreatment method to achieve high spatial resolution. By using this method, fine matrix crystal can be produced. Also, thanks to automated control, the coating thickness is reproducibly controlled as users configure.
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Product
Analog Output Series Sensors
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Shanghai Pubang Sensor Co.,Ltd.
1. Measured distance is linear to output signals, high accuracy, can precisely indicate position of tested objects2. With the change of detection distance, itcan provide 0-10V or 4-20mA of standard analog signals; widely used for distance measurement, thickness measurement,etc
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Product
Calipers
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An instrument used to measure the linear dimensions of an object or hole; namely, the length, width, thickness, diameter or depth of an object or hole.
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Product
MOCVD Systems
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For growing high-quality compound semiconductor films, few techniques match the precision of Metal-Organic Chemical Vapor Deposition (MOCVD). They give engineers tight control over film composition and thickness, making them essential for optoelectronics and advanced power transistors.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Product
Flaw Detector & Thickness Gauge
DFX-8+
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Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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Product
Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
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The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Product
MECHANICAL TEST FIXTURE KITS
TX-MT-100 SERES
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Test-X MT-100 Series mechanical kits are an inexpensive solution for testing smaller printed circuit boards and other devices.The MT-100 Series features a 1/2" thick FR4 probe plate and a 3/8" thick Lexan top plate. Precision alignment is assured through tooling holes in both the probe and top plates. Units are available with a 2-1/2" pan or an upper head assembly
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Product
Graphene Foils
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for thicknesses ≥5 µm. At this time, graphene foils are not part of our regular product portfolio yet. A small quantity of research samples is available upon special request.
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Product
kSA RateRat Pro
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kSA RateRat Pro is a compact, convenient and easy-to-use optical metrology tool for thin-film characterization. Its unique capability is to measure, in situ and in real-time, optical constants (n and k), deposition rate and film thickness.
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Product
Benchtop Metrology System
FilmTek 2000 SE
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Scientific Computing International
Benchtop metrology system delivering unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. Ideally suited for academic and R&D settings. Combines spectroscopic rotating compensator ellipsometry, multi-angle polarized spectroscopic reflection, and intuitive material modeling software to make even the most demanding of measurement tasks simple and reliable.
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Product
Sheet Resistance Measurement
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The Filmetrics® R54-series and R50-series sheet resistance measurement instruments have been developed based on over 45 years of KLA sheet resistance measurement innovation. The R50 measures metal layer thickness, sheet resistance and sheet conductance. The R54-series adds a light-tight enclosure, along with 300mm support, to provide metal thickness measurement solutions for semiconductor and compound semiconductor manufacturing.
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Product
Thick Film Bleeder
GBR-350
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GBR-350 series resistors are made in a thick film technology, on ceramic substrates (Al2O3 - 96%). High voltage resistors have an application as bleeders, which have a task to unload electric charge after disconnection of supply voltage.
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Product
Process RF Sensors
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Process RF (radio frequency) analyzers using penetrating radio waves to determine the moisture content across a full sample thickness. Single point, array and hand-held analyzers provide a variety of sampling options from fully integrated in-process moisture profiling to at-line quality control. RF analyzers are widely used in gypsum, panel board, and other industrial processes.
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Product
Aluminum Film Index Tester
DRK120
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Shandong Drick Instruments Co., Ltd.
DRK120 aluminum film thickness tester is new instruments as the development of new packaging material. It is used to test aluminum coating in the barrier film, which is around 35NM thickness. This aluminum coating improves the barrier property a lot, because common gas and aromatic gas couldn’t dissolve in metal. The aluminum coating could protect packing material and avoid light. So thickness test and control of aluminum film is very important, the thickness of aluminum will affect the barrier property of film a lot.
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Product
Measuring Small Antennas
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If you have a small PCB with a small antenna you can't use a thick cable and a large connector. Not only is this impractical (how to connect the connector?) but the metal bulk will also affect the antenna and grounding properties of your PCB. The measurement will be useless. MegiQ promotes the use of the small and popular UFL connector and its associated cables. The UFL socket fits on almost any PCB and it can be improvised on a board without a UFL footprint.
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Product
Multiple Angle Laser Ellipsometer
PH-LE
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The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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Product
High Voltage Porosity Detection
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High Voltage Technique: The high voltage, or porosity technique, can be used to test coatings up to 25mm (1”) thick and is ideal for inspecting pipelines and other protective coatings. Coatings on concrete can also be tested using this method.
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Product
Thickness Check Calix
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For the manufacturing of a perfect cold strip, many factors are crucial. Our measuring frames specifically check the thickness-related quality parameters of the strip steel or steel sheet. Free of radioactive radiation, laser sensors are used in the cold strip areas that do not require protection measures with laser class 2, or only low precautions when using laser class 3B sensors. The installation of our measurement systems is quick and uncomplicated for our customers. The CALIX is integrated into the line with its C-shaped frame across the material flow. Our solutions with and without traversing determine all important parameters for quality assurance, including strip thickness, edge thickness, wedge or cambering, and measure the complete thickness profile. Thus, you have full process control in the current production.
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Product
EMAT Thickness Gauges
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The EMAT thickness gauge uses advanced electromagnetic-acoustic technology to measure metal thickness, even in cases where traditional methods like piezo-ultrasonic or laser-optical are not applicable.
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Product
Photovoltaic/Solar Metrology System
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Multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials.
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Product
High Temperature Chip Resistors
ERJ-Hxx Series
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Panasonic Industrial Devices Sales Company of America
Panasonic’s ERJ-Hxx Series Automotive Grade Thick Film Chip Resistors feature a maximum Category Temperature of 175°C and a maximum Rated Operating Temperature of 105°C. The ERJ-Hxx Series is AEC-Q200 compliant, ensuring strict quality control standards are in place to enforce optimal quality and reliability. The ERJ-Hxx Series Resistors offer a small size, higher power Resistor alternative that provides enhanced flexibility of PCB design by reducing solder-joint crack risk. This series is ideal for use in automotive, ICT, general industrial applications, and more.
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Product
Ultrasonic Velocity gauge
VX
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With the hand-held VX Ultrasonic Velocity gauge, you can determine material velocities by measuring a known thickness, entering a known thickness into the VX, and the material velocity will be displayed. The tool's backlit display is easy to read, even in dim light, and the unit operates for up to 200 hours on a single set of batteries.
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Product
Fully Automatic 4 Point Probe System for Silicon Wafer
WS-8800
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*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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Product
Cupping Tester
1620
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This robust and user-friendly Elcometer 1620 Cupping Tester is used for assessing the cupping ability of coatings applied to metal sheets up to 1.2mm (0.05”) thick.
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Product
Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
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Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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Product
Distance Sensors
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SICK has a wide range of optic and ultrasonic solutions that measure from sub-microns to kilometers. They solve measuring, detecting and positioning applications using triangulation and time-of-flight modes. Sensors using triangulation are ideal for short-range, highly precise measurement. They can inspect miniature parts, thickness and shape, etc. Time-of-flight sensors work at longer distances, are not influenced by reflectivity or ambient light − perfect for positioning AS/RS, rail cars and gantry cranes.
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Product
Card Impact Tester
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Tests corner impact and card bending resistance, Designed to test for MasterCard CQM and ANSI N322 requirements, Easy to use, Repeatable results, Small footprint design for benchtop use, Adjustable jaws allow use with various card thicknesses, Super heavy duty custom CNC design
