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Ultrasonic Thickness Gauges
MMX 6 + MMX 6DL
The new wall thickness gauges MMX-6 and MMX-6DL includes all the features of the MX devices with the additional unique possibility to measure on coated parts without the coating is applied in the measurement (Echo Echo + pulse-echo function)
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Apertures
ARC possesses the machining techniques, skill and equipment to fabricate a wide variety of apertures in a similarly wide variety of materials. The aspect ratio of aperture opening to material thickness is generally limited to a 1:20 ratio. Shown on the right in Figure 1 is an aperture with a wide series of holes ranging from 15um to 960um.
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Contacting Extensometers
AMETEK Sensors, Test & Calibration
The contacting extensometers are designed for accurate strain and extension measurement of a material up to a maximum sample thickness of 25 mm.
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Ellipsometer
alpha-SE®
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds. Works with your materials - dielectrics, semiconductors, organics, and more.
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Covermeter & Half-Cell Meters
A covermeter, or rebar locator, is a gauge that measures the thickness of concrete cover over steel reinforcement bars and metal pipes. The covermeter can tell you the depth of the rebar, the location and orientation of reinforcement bar (rebar) and determine the diameter of the rebar.
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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Process EDXRF Spectrometer
NEX LS
Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Automation Solutions
We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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High Temperature Chip Resistors
ERJ-Hxx Series
Panasonic Industrial Devices Sales Company of America
Panasonic’s ERJ-Hxx Series Automotive Grade Thick Film Chip Resistors feature a maximum Category Temperature of 175°C and a maximum Rated Operating Temperature of 105°C. The ERJ-Hxx Series is AEC-Q200 compliant, ensuring strict quality control standards are in place to enforce optimal quality and reliability. The ERJ-Hxx Series Resistors offer a small size, higher power Resistor alternative that provides enhanced flexibility of PCB design by reducing solder-joint crack risk. This series is ideal for use in automotive, ICT, general industrial applications, and more.
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Thick Film Passive Element
GBR-181
GBR-181series resistors are made in a thick film technology, or ceramic substrates (Al2O3) - 96&). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-181 series elements are used both for general, and professional applications. Other values of resistance, and tolerance (up to 0.1%) are available on request.
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Portable Microscope With XY Stage, X400 1mm Field Of View, 1µm High Resolution
*Counting of cells, algae and other samples*Easy positioning of the sample*Methodically scanning of slides and some counting chambers*Works with standard microscope slides (25x75mm or 1”x2”) and 32mm wide counting chambers (top cover of counting chamber needs to be <1mm thick)*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Spectroscopic Ellipsometry
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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20J3 SHEET RESISTANCE METER
Non-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreMeasures nearly all thin conductive materials or coatingsChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterFor benchtop or inline applicationsSimple one-button operationSmall footprint with detached sensor probeOptions include vacuum-ready probe, PC-based productivity software, Ethernet connectivity, stage, and more
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Abrasion Tester
rHT SeriesHB SeriesHT Series
Abrasion tester checks the abrasion of solid materials. such as metals, composites, ceramics and more.The test is performed on worn materials such as tires, shoes, belt and more.* Worn out condition* The loss of the weight* The loss of the physical volume* The thickness that been worn out, etc* Use NBS standard gum to ratio the endurance characteristic of abrasion for this material.
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Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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Touch Screen Controllers
ST’s FingerTip® supports other advanced features thanks to the multi-mode sensing technology such as gloves, thick cover, water, custom gestures, grip rejection, proximity detection, force sensing and fast report rate for gaming applications.
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Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
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Thick Film Divider
GBR-391
GBR-391 series high-voltage resistive dividers are made in a thick film technology on ceramic substrates (Al2O3 - 96%) with leads for through-hole mounting. Dividers are characterized by very high maximum voltage, and standard voltage division.
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IceMap™
Real Time Ice Thickness Measurement
The IceMap real-time display shows the automatically detected bottom of the ice (blue line) in real time. Users can set a minimum thickness warning threshold (gold line). Winter ice roads and bridges are a common transportation link in the northern regions of Canada, Alaska, Europe and Russia. The Sensors & Software IceMap system is designed to measure the ice thickness on these temporary, yet vital, links and ensure the safety of all travelers. The GPR sensor is towed across the ice surface behind a truck or snowmobile and the ice thickness data, displayed in real-time as a cross-sectional image, are sent wirelessly to the operator’s computer.
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Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Optics Test Stations For Single Lenses And Optical Systems
OTS
Optik Elektronik Gerätetechnik GmbH
The optics test stations of the OTS series enable the computer-based, software-controlled measurement of optical parameters of individual lenses (including cylindrical lenses) and optical systems. Measured variables are, for example, focal length, MTF, focal length, radius, contact dimension, centering, wedge angle and deflection angle. The optional software module LensTest enables the measurement of the center thickness of lenses and air gaps in complete lenses as well as the measurement of the centering error of individual surfaces.
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System
SpecMetrix
SpecMetrix systems by Sensory Analytics were designed from the ground up to precisely measure the absolute thickness of just about any coating on any substrate. All our systems are flexible for use in virtually any manufacturing environment. They provide coating thickness data of unprecedented accuracy—helping manufacturers reduce costs by optimizing coating process control and product quality. Our systems are easily configured to measure webs, coils, flat sheets, small samples or finished parts.
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Film Shrink Tester
The Hanatek FST Film Shrink Tester is used to measure the effect of temperature on plastic films. The application of heat causes certain plastic films to rapidly contract; this effect can be used to seal and pack many items from food to consumer goods. The shrink effect is due to internal forces locked into the film during manufacture being released by heating, it is also known as linear thermal shrink or free shrink. The amount of shrinkage is dependent on the film type, thickness and sealing temperature. Testing the percentage shrink of a film ensures that it is suitable for a particular packaging application and establishes the correct temperature for that application.
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Thick Film Passive Element
GBR-395
GBR-395 series high voltage resistors are made in a thick film technology on ceramic substrates(Al2O3 96%). These elements are used in high voltage applications requiring high stability and resistance.
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Bally Flexing Tester
TF116
TESTEX Testing Equipment Systems Ltd.
Bally flexing Tester is designed for flexing resistance test to be and ingor other types of failure at flexing creases. The machines applicable to all flexible materials,in particular leathers, artificial leather below thickness
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Current Sense Resistors
Panasonic Industrial Devices Sales Company of America
Panasonic offers a wide variety of Thick Film Current Sense Resistors (ERJ-B1, B2, xB, xBW, xCW) in a large range of case sizes and in wide terminal types for high solder joint reliability. The ERJ Series of Current Sense Resistors offers power ratings up to 2W with low ohmic ratings ranging from 5mΩ to 10Ω. Panasonic’s Thick Film Current Sense Resistor portfolio offers a more cost effective option with high reliability. Panasonic has a wide line of case size options ranging from 0402 to 2512 in conventional terminal and 0612 to 1020 for wide terminal.
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Scrub Test Panels
4695
In a typical scrub test, the coating is applied to the Leneta Scrub Test Panel at a specified film thickness, allowed to dry and then subjected to scrubbing with a straight-line scrub tester.
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Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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ROV Thickness Gauges & Probe Handlers
ROV Thickness Gauges & Probe HandlersCompleting the Cygnus ROV Mountable thickness gauges, a range of ROV Probe Handlers have been developed to offer an engineered probe handling solution. Each probe handler will work with a thickness gauge of the Cygnus ROV Mountable range listed below.
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Contactless Wafer Gauge for Resistivity, Thickness
MX 60x
The MX60x series measure Resistivity or Sheet Resistance of silicon and other materials.
